Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-230058 | FR1 EVM for shorter transient period capability | discussion | Skyworks Solutions Inc. | TEI16_Test | Rel-17 |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-230161 | Discussion on FR2 PC1 MU |
discussion revised to R5-231778 |
Keysight Technologies UK Ltd, Anritsu | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.17 |
revised | [WTS] [JSN] | |
| R5-230203 | Spurious Emissions TRP Measurement Grids for PC1 |
discussion revised to R5-231789 |
Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-230209 | MU discussion on FR2 PC1 |
discussion revised to R5-231851 |
Anritsu, NTT DOCOMO INC. | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-230210 | Correction of RB allocation in MPR and ACLR for FR2 PC1 | discussion | Anritsu | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-230216 | Testability analysis on ACS and IBB for FR2c | discussion | Anritsu | NR_bands_BW_R16-UEConTest |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-230217 | Maintenance of EVM including symbols with transient period | discussion | Anritsu | TEI16_Test |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-230220 | On the uncertainty of the network analyzer | discussion | ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-230223 | On the MU for FR2 PC1 TRx test cases | discussion | ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-230781 | Discussion on Testability for RRM FR1-FR2 | discussion | Qualcomm Incorporated | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-230786 | Discussion on RRM applicability rules and test optimization |
discussion revised to R5-231871 |
Qualcomm Incorporated | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-230788 | Discussion on FR2 RLM/BFD and beam sweeping from multiple directions |
discussion revised to R5-231832 |
Qualcomm Incorporated | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-230933 | On the MU Threshold for DL AWGN absolute power for RRM FR2 PC1 | discussion | ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-230934 | On AP#97.25 RRM 1x2 channel configuration | discussion | ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
agreed | [WTS] [JSN] | ||
| R5-230950 | Discussion on handling simultaneous Rx/Tx capability for REFSENS testing |
discussion revised to R5-231862 |
Huawei, HiSilicon | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-231060 | Handling of FR2 PC1 in RAN5 | discussion | NTT DOCOMO INC. | TEI17_Test |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-231108 | FR2 RRM test cases: Known Issue List |
discussion revised to R5-231773 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-231109 | Principle of testing on a mix of E-UTRA_FR1 - FR2 carriers |
discussion revised to R5-231820 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-231309 | FR2 SEM test time reduction by utilizing coarse TRP grid | discussion | Ericsson |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | |||
| R5-231322 | Limitation on PHR method to avoid Scell drop | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-231364 | Views on FR2 SEM test time optimization |
discussion revised to R5-231790 |
Apple Inc | TEI17_Test |
R5-98 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-231773 | FR2 RRM test cases: Known Issue List |
discussion revision of R5-231108 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-231778 | Discussion on FR2 PC1 MU |
discussion revision of R5-230161 |
Keysight Technologies UK Ltd, Anritsu | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-231789 | Spurious Emissions TRP Measurement Grids for PC1 |
discussion revision of R5-230203 |
Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-231790 | Views on FR2 SEM test time optimization |
discussion revision of R5-231364 |
Apple Inc | TEI17_Test |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-231820 | Principle of testing on a mix of E-UTRA_FR1 - FR2 carriers |
discussion revision of R5-231109 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-231832 | Discussion on FR2 RLM/BFD and beam sweeping from multiple directions |
discussion revision of R5-230788 |
Qualcomm Incorporated | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-231851 | MU discussion on FR2 PC1 |
discussion revision of R5-230209 |
Anritsu, NTT DOCOMO INC. | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-231862 | Discussion on handling simultaneous Rx/Tx capability for REFSENS testing |
discussion revision of R5-230950 |
Huawei, HiSilicon | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-231871 | Discussion on RRM applicability rules and test optimization |
discussion revision of R5-230786 |
Qualcomm Incorporated | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-98 AI: 5.4.17 |
noted | [WTS] [JSN] |
30 documents (0.34394001960754 seconds)