Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-226109 | Discussion on FR2 PC1 MU |
discussion revised to R5-227984 |
Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.17 |
revised | [WTS] [JSN] | |
| R5-226242 | On 40cm MTSU and TT | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-97 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-226243 | On AP96.32 Number of grid points exceeding 43dBm | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-97 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-226244 | On TRP MU for Spurious Emissions | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-97 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-226376 | Introduction of AWGN and signal flatness FR2 to TS 38.533 | discussion | Anritsu | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-97 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-226491 | On the MU for FR2 PC1 RRM | discussion | ROHDE & SCHWARZ | TEI15_Test | Rel-16 |
R5-97 AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-226493 | On NR Rel-15 RRM FR2 PC1 testcases | discussion | ROHDE & SCHWARZ | TEI15_Test | Rel-16 |
R5-97 AI: 5.4.17 |
withdrawn | [WTS] [JSN] | |
| R5-226533 | On the MU for FR2 PC1 Demod | discussion | ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-97 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-226536 | On the MU for FR2 PC1 TRx test cases |
discussion revised to R5-227987 |
ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-97 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-226643 | PC5 device assumptions |
discussion revised to R5-227982 |
Qualcomm Israel Ltd. | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-97 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-226644 | DEMOD MU contributors for PC1 | discussion | Qualcomm Israel Ltd. | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-97 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-226781 | Discussion on AP#96.32 PC1 grids greater than 43dBm | discussion | QUALCOMM JAPAN LLC. | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-97 AI: 5.4.17 |
not pursued | [WTS] [JSN] | ||
| R5-226789 | Maintenance of EVM including symbols with transient period | discussion | Anritsu Corporation | TEI16_Test |
R5-97 AI: 5.4.17 |
withdrawn | [WTS] [JSN] | ||
| R5-226794 | Maintenance of EVM including symbols with transient period | discussion | Anritsu Corporation | TEI16_Test |
R5-97 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-226834 | Handling of FR2 PC1 in RAN5 |
discussion revised to R5-227988 |
NTT DOCOMO INC. | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.17 |
revised | [WTS] [JSN] | |
| R5-227073 | MU discussion on FR2 PC1 |
discussion revised to R5-227983 |
Anritsu | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-97 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-227175 | FR2 RRM test cases: Known Issue List |
discussion revised to R5-227816 |
Ericsson, Rohde & Schwarz | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-97 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-227229 | Discussion on QoQZ and XPD MUs for 40cm |
discussion revised to R5-227818 |
ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-97 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-227272 | FR2 SEM test time reduction by utilizing coarse TRP grid | discussion | Ericsson |
R5-97 AI: 5.4.17 |
not pursued | [WTS] [JSN] | |||
| R5-227650 | MU discussion on FR2 PC1 |
discussion revision of R5-227983 |
Anritsu | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-97 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-227816 | FR2 RRM test cases: Known Issue List |
discussion revision of R5-227175 |
Ericsson, Rohde & Schwarz | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-97 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-227818 | Discussion on QoQZ and XPD MUs for 40cm |
discussion revision of R5-227229 |
ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-97 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-227982 | PC5 device assumptions |
discussion revision of R5-226643 |
Qualcomm Israel Ltd. | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-97 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-227983 | MU discussion on FR2 PC1 |
discussion revision of R5-227073 revised to R5-227650 |
Anritsu | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-97 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-227984 | Discussion on FR2 PC1 MU |
discussion revision of R5-226109 |
Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-227987 | On the MU for FR2 PC1 TRx test cases |
discussion revision of R5-226536 |
ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-97 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-227988 | Handling of FR2 PC1 in RAN5 |
discussion revision of R5-226834 |
NTT DOCOMO INC. | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.17 |
noted | [WTS] [JSN] |
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