Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-224078 | Discussion on message type for Power limit test functions |
discussion revised to R5-225608 |
Keysight technologies UK Ltd, Apple Portugal | TEI16_Test |
R5-96-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-224255 | Discussion on precondition for the updating of test channel bandwidths in 38.508-1 | discussion | CAICT | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-224256 | Discussion on the treatment for the pending R15 NR FR1 band n50 and n86 | discussion | CAICT | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-224610 | MU discussion on FR2 PC1 |
discussion revised to R5-225639 |
Anritsu, NTT DOCOMO INC. | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-224613 | MU discussion on 40 cm Quiet Zone | discussion | Anritsu | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-224806 | Discussion on fading crest factor | discussion | Qualcomm Korea | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-224808 | Applicability of FWA devices for Demod and RRM test cases |
discussion revised to R5-225640 |
Qualcomm Korea | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-225023 | Handling of FR2 PC1 in RAN5 |
discussion revised to R5-225641 |
NTT DOCOMO INC., Anritsu, Keysight | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-225029 | EIRP-based test metric for FR2 SEM test | discussion | Apple Portugal | TEI15_Test | Rel-16 |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-225104 | On additional spurious emission for EN-DC with FR2 | discussion | ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-225122 | On the feasibility of the PHR method |
discussion revised to R5-225642 |
ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-225123 | On the MU for FR2 PC1 TRx test cases |
discussion revised to R5-225643 |
ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-225136 | FR2 RRM test cases: Known Issue List |
discussion revised to R5-225677 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-225185 | On 40cm QoQZ and XPD MUs |
discussion revised to R5-225644 |
Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-225191 | New method for preventing SCell drop in RAN5 FR2 UL CA test cases |
discussion revised to R5-225613 |
Ericsson | TEI15_Test |
R5-96-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-225194 | Discussion on TT and testability for FR2 EVM |
discussion revised to R5-225645 |
Ericsson | TEI15_Test |
R5-96-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-225203 | Discussion on handling p-MaxEUTRA and p-NR-FR1 | discussion | Huawei, HiSilicon | Rel-15 |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-225206 | Discussion on QoQZ and XPD MUs for 40cm |
discussion revised to R5-225646 |
ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-225221 | On PC1 measurement uncertainties for other test cases | discussion | Keysight technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-225229 | Discussion on L1-RSRP measurement accuracy test cases | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-225608 | Discussion on message type for Power limit test functions |
discussion revision of R5-224078 |
Keysight technologies UK Ltd, Apple Portugal | TEI16_Test |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-225609 | RAN5#96-e RF FR2_PCC_SCC_Prio Session meeting minute | report | Keysight Technologies UK Ltd |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | |||
| R5-225613 | New method for preventing SCell drop in RAN5 FR2 UL CA test cases |
discussion revision of R5-225191 |
Ericsson | TEI15_Test |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-225639 | MU discussion on FR2 PC1 |
discussion revision of R5-224610 |
Anritsu, NTT DOCOMO INC. | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-225640 | Applicability of FWA devices for Demod and RRM test cases |
discussion revision of R5-224808 |
Qualcomm Korea | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-225641 | Handling of FR2 PC1 in RAN5 |
discussion revision of R5-225023 |
NTT DOCOMO INC., Anritsu, Keysight | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-225642 | On the feasibility of the PHR method |
discussion revision of R5-225122 |
ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-225643 | On the MU for FR2 PC1 TRx test cases |
discussion revision of R5-225123 |
ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-225644 | On 40cm QoQZ and XPD MUs |
discussion revision of R5-225185 |
Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-225645 | Discussion on TT and testability for FR2 EVM |
discussion revision of R5-225194 |
Ericsson | TEI15_Test |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-225646 | Discussion on QoQZ and XPD MUs for 40cm |
discussion revision of R5-225206 |
ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-225677 | FR2 RRM test cases: Known Issue List |
discussion revision of R5-225136 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-96-e AI: 5.4.17 |
noted | [WTS] [JSN] |
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