Please enter the search related information in the fields below. Partial information works, e.g. "SP-21
" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501
" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP
" gives the same results as "3gpp
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tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
---|---|---|---|---|---|---|---|---|---|
R5-222186 | Discussion on NR part UL power testing for Rel-15 PC2 UEs of Inter-band EN-DC within FR1 |
discussion revised to R5-223645 |
CAICT | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.17 |
revised | [WTS] [JSN] | |
R5-222340 | Discussion on TT and testability proposal for FR2 EVM |
discussion revised to R5-223620 |
Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.17 |
revised | [WTS] [JSN] | |
R5-222435 | Discussion on updates required in Test points analysis for MPR, SEM and ACLR |
discussion revised to R5-223637 |
Keysight technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
R5-222436 | Discussion on Rel-15 Common Uplink Configuration for PC2, PC3 and PC4 | discussion | Keysight technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
R5-222548 | On LTE-NR coexistence performance test cases |
discussion revised to R5-223627 |
ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
R5-222553 | On QoQZ for 40cm QZ |
discussion revised to R5-223614 |
Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
R5-222554 | On Permitted Methodologies and Applicability | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
R5-222589 | Discussion on fading crest factor | discussion | QUALCOMM Europe Inc. - Italy | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
R5-223165 | RAN5 5G NR Test Tolerance review discussion |
discussion revised to R5-223601 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
R5-223166 | FR2 RRM test cases: Known Issue List |
discussion revised to R5-223624 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
R5-223167 | FR2 RRM test cases: Known Issue List - after RAN5_95e |
discussion revised to R5-223625 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
R5-223168 | Further discussion on large UE gain range |
discussion revised to R5-223628 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
R5-223199 | Discussion on mandatory channel bandwidths after Rel-15 |
discussion revised to R5-223626 |
Keysight technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
R5-223271 | EIRP-based test metric for FR2 SEM verifications |
discussion revised to R5-223622 |
Apple Portugal | TEI15_Test | Rel-16 |
R5-95-e AI: 5.4.17 |
revised | [WTS] [JSN] | |
R5-223278 | Discussion on testability aspects for new test function to limit Pcell power |
discussion revised to R5-223646 |
Keysight technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
revised | [WTS] [JSN] | ||
R5-223300 | New method for preventing SCell drop in RAN5 FR2 UL CA test cases |
discussion revised to R5-223633 |
Ericsson |
R5-95-e AI: 5.4.17 |
revised | [WTS] [JSN] | |||
R5-223601 | RAN5 5G NR Test Tolerance review discussion |
discussion revision of R5-223165 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
R5-223614 | On QoQZ for 40cm QZ |
discussion revision of R5-222553 |
Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
R5-223620 | Discussion on TT and testability proposal for FR2 EVM |
discussion revision of R5-222340 |
Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-95-e AI: 5.4.17 |
noted | [WTS] [JSN] | |
R5-223622 | EIRP-based test metric for FR2 SEM verifications |
discussion revision of R5-223271 |
Apple Portugal | TEI15_Test | Rel-16 |
R5-95-e AI: 5.4.17 |
noted | [WTS] [JSN] | |
R5-223624 | FR2 RRM test cases: Known Issue List |
discussion revision of R5-223166 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
R5-223625 | FR2 RRM test cases: Known Issue List - after RAN5_95e |
discussion revision of R5-223167 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
R5-223626 | Discussion on mandatory channel bandwidths after Rel-15 |
discussion revision of R5-223199 |
Keysight technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
R5-223627 | On LTE-NR coexistence performance test cases |
discussion revision of R5-222548 |
ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
R5-223628 | Further discussion on large UE gain range |
discussion revision of R5-223168 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
R5-223633 | New method for preventing SCell drop in RAN5 FR2 UL CA test cases |
discussion revision of R5-223300 |
Ericsson |
R5-95-e AI: 5.4.17 |
noted | [WTS] [JSN] | |||
R5-223637 | Discussion on updates required in Test points analysis for MPR, SEM and ACLR |
discussion revision of R5-222435 |
Keysight technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
noted | [WTS] [JSN] | ||
R5-223645 | Discussion on NR part UL power testing for Rel-15 PC2 UEs of Inter-band EN-DC within FR1 |
discussion revision of R5-222186 |
CAICT | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-95-e AI: 5.4.17 |
noted | [WTS] [JSN] | |
R5-223646 | Discussion on testability aspects for new test function to limit Pcell power |
discussion revision of R5-223278 |
Keysight technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-95-e AI: 5.4.17 |
noted | [WTS] [JSN] |
29 documents (0.33853697776794 seconds)