Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-236063 | Discussion on MU and TT analysis for FR2c |
discussion revised to R5-237723 |
Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.17 |
revised | [WTS] [JSN] | |
| R5-236153 | Discussion on test of test cases with no exception requirements |
discussion revised to R5-237831 |
CAICT |
R5-101 AI: 5.4.17 |
revised | [WTS] [JSN] | |||
| R5-236341 | Discussion on FR1 EVM testing in shorter transient period |
discussion revised to R5-237848 |
Keysight Technologies UK Ltd | TEI16_Test | Rel-18 |
R5-101 AI: 5.4.17 |
revised | [WTS] [JSN] | |
| R5-236789 | MU discussion on FR2c |
discussion revised to R5-237724 |
Anritsu | TEI16_Test, NR_bands_BW_R16-UEConTest |
R5-101 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-236793 | Test procedure for FR2 DL CA | discussion | Anritsu | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-101 AI: 5.4.17 |
withdrawn | [WTS] [JSN] | ||
| R5-236795 | Testability on UL power setting in FR2 Random Access test cases | discussion | Anritsu | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-101 AI: 5.4.17 |
withdrawn | [WTS] [JSN] | ||
| R5-236987 | FR2 RRM test cases: Known Issue List |
discussion revised to R5-237771 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-101 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-237132 | PC3 Measurement Grids based on Alternate 6x2 Antenna Array Assumption | discussion | Keysight Technologies UK Ltd, CAICT | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-237177 | Discussion on Implementation of Test Selection Criteria for RRM | discussion | Qualcomm Technologies Ireland | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-101 AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-237252 | On the MU for FR1 EVM including symbols with transient period |
discussion revised to R5-237859 |
ROHDE & SCHWARZ | TEI16_Test |
R5-101 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-237254 | On the MU for n259 |
discussion revised to R5-237725 |
ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-101 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-237255 | On the MU and TT for FR2 UL MIMO |
discussion revised to R5-237726 |
ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-101 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-237723 | Discussion on MU and TT analysis for FR2c |
discussion revision of R5-236063 |
Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-237724 | MU discussion on FR2c |
discussion revision of R5-236789 |
Anritsu | TEI16_Test, NR_bands_BW_R16-UEConTest |
R5-101 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-237725 | On the MU for n259 |
discussion revision of R5-237254 |
ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-101 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-237726 | On the MU and TT for FR2 UL MIMO |
discussion revision of R5-237255 |
ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-101 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-237771 | FR2 RRM test cases: Known Issue List |
discussion revision of R5-236987 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-101 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-237831 | Discussion on test of test cases with no exception requirements |
discussion revision of R5-236153 |
CAICT |
R5-101 AI: 5.4.17 |
noted | [WTS] [JSN] | |||
| R5-237848 | Discussion on FR1 EVM testing in shorter transient period |
discussion revision of R5-236341 |
Keysight Technologies UK Ltd | TEI16_Test | Rel-18 |
R5-101 AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-237859 | On the MU for FR1 EVM including symbols with transient period |
discussion revision of R5-237252 |
ROHDE & SCHWARZ | TEI16_Test |
R5-101 AI: 5.4.17 |
noted | [WTS] [JSN] |
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