Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-233816 | Testability issue in FR2 Relative Power Control test case |
discussion revised to R5-235818 |
Ericsson |
R5-100 AI: 5.4.17 |
revised | [WTS] [JSN] | |||
| R5-233971 | Testability and MU analysis for FR2c | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-234113 | Discussion on test cases with both exception and no exception requirements |
discussion revised to R5-235839 |
CAICT |
R5-100 AI: 5.4.17 |
revised | [WTS] [JSN] | |||
| R5-234114 | Discussion on spurious emission for UE co-existence requirement | discussion | CAICT |
R5-100 AI: 5.4.17 |
noted | [WTS] [JSN] | |||
| R5-234178 | Discussion on FR1 EVM testing including symbols with transient period | discussion | Keysight Technologies UK Ltd | TEI16_Test | Rel-17 |
R5-100 AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-234683 | Discussion on applicability based on subtest | discussion | Qualcomm India Pvt Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-100 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-234706 | Discussion on correcting MPR test requirements for inter-band CA |
discussion revised to R5-235854 |
Huawei, HiSilicon | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-15 |
R5-100 AI: 5.4.17 |
revised | [WTS] [JSN] | |
| R5-234890 | Testability of PC1 FR2b SEM |
discussion revised to R5-235752 |
Anritsu | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-100 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-234891 | MU discussion on FR2c |
discussion revised to R5-235753 |
Anritsu | TEI16_Test, NR_bands_BW_R16-UEConTest |
R5-100 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-234895 | Discussion on required UE ability and MU for FR2 Relative power control test case | discussion | Anritsu | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-100 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-234898 | MU discussion on FR1 EVM including symbols with transient period |
discussion revised to R5-235865 |
Anritsu | TEI16_Test |
R5-100 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-234964 | FR2 RRM test cases: Known Issue List |
discussion revised to R5-235755 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-100 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-235140 | On the MU for n259 | discussion | ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-100 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-235179 | Discussion on PDCCH RMC DCI format 1-1 payload | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-100 AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-235196 | On QoQZ ETC MU beyond FR2b |
discussion revised to R5-235754 |
Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-100 AI: 5.4.17 |
revised | [WTS] [JSN] | ||
| R5-235197 | On MU Threshold for RRM FR2 PC1 | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-100 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-235752 | Testability of PC1 FR2b SEM |
discussion revision of R5-234890 |
Anritsu | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-100 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-235753 | MU discussion on FR2c |
discussion revision of R5-234891 |
Anritsu | TEI16_Test, NR_bands_BW_R16-UEConTest |
R5-100 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-235754 | On QoQZ ETC MU beyond FR2b |
discussion revision of R5-235196 |
Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-100 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-235755 | FR2 RRM test cases: Known Issue List |
discussion revision of R5-234964 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-100 AI: 5.4.17 |
noted | [WTS] [JSN] | ||
| R5-235818 | Testability issue in FR2 Relative Power Control test case |
discussion revision of R5-233816 |
Ericsson |
R5-100 AI: 5.4.17 |
noted | [WTS] [JSN] | |||
| R5-235839 | Discussion on test cases with both exception and no exception requirements |
discussion revision of R5-234113 |
CAICT |
R5-100 AI: 5.4.17 |
noted | [WTS] [JSN] | |||
| R5-235854 | Discussion on correcting MPR test requirements for inter-band CA |
discussion revision of R5-234706 |
Huawei, HiSilicon | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-15 |
R5-100 AI: 5.4.17 |
noted | [WTS] [JSN] | |
| R5-235865 | MU discussion on FR1 EVM including symbols with transient period |
discussion revision of R5-234898 |
Anritsu | TEI16_Test |
R5-100 AI: 5.4.17 |
noted | [WTS] [JSN] |
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