Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-230215 | Correction of TP analysis for FR2 ACLR for SCS 60 kHz | CR | Anritsu | 38.905 17.7.0 CR#724 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.16 |
agreed | [WTS] [JSN] |
| R5-230319 | Addition of reference sensitivity test point analysis for new 3CC EN-DC comb within FR1 |
CR revised to R5-231608 |
KDDI Corporation | 38.905 17.7.0 CR#727 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.16 |
revised | [WTS] [JSN] |
| R5-230813 | Update to TP analysis of 6.2.3 NS_27 |
CR revised to R5-231623 |
Huawei, HiSilicon | 38.905 17.7.0 CR#731 catF | TEI16_Test, NR_bands_BW_R16-UEConTest | Rel-17 |
R5-98 AI: 5.4.16 |
revised | [WTS] [JSN] |
| R5-230816 | Adding 45MHz PC2 TP anlaysis to 6.2.3 NS_49 |
CR revised to R5-231625 |
Huawei, HiSilicon | 38.905 17.7.0 CR#732 catF | TEI16_Test, NR_bands_BW_R16-UEConTest | Rel-17 |
R5-98 AI: 5.4.16 |
revised | [WTS] [JSN] |
| R5-230944 | Addition of reference sensitivity test point analysis for DC_1A_n28A | CR | Huawei, HiSilicon | 38.905 17.7.0 CR#744 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.16 |
agreed | [WTS] [JSN] |
| R5-231241 | Test point analysis update for A-MPR test for NS_21 | CR | Keysight Technologies UK Ltd | 38.905 17.7.0 CR#750 catF | NR_bands_BW_R16-UEConTest, TEI16_Test | Rel-17 |
R5-98 AI: 5.4.16 |
agreed | [WTS] [JSN] |
| R5-231248 | Test point analysis update for A-MPR test for NS_21 | CR | Keysight Technologies UK Ltd | 38.905 17.7.0 CR#751 catF | NR_bands_BW_R16-UEConTest | Rel-17 |
R5-98 AI: 5.4.16 |
withdrawn | [WTS] [JSN] |
| R5-231310 | Clarifications and alignment of REFSENS TP analysis for EN-DC and NR CA |
CR revised to R5-231865 |
Ericsson | 38.905 17.7.0 CR#753 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.16 |
revised | [WTS] [JSN] |
| R5-231311 | Updated TP analysis for DC_25A_n41A | CR | Ericsson | 38.905 17.7.0 CR#754 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.16 |
agreed | [WTS] [JSN] |
| R5-231608 | Addition of reference sensitivity test point analysis for new 3CC EN-DC comb within FR1 |
CR revision of R5-230319 |
KDDI Corporation | 38.905 17.7.0 CR#7271 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.16 |
agreed | [WTS] [JSN] |
| R5-231623 | Update to TP analysis of 6.2.3 NS_27 |
CR revision of R5-230813 |
Huawei, HiSilicon | 38.905 17.7.0 CR#7311 catF | TEI16_Test, NR_bands_BW_R16-UEConTest | Rel-17 |
R5-98 AI: 5.4.16 |
agreed | [WTS] [JSN] |
| R5-231625 | Adding 45MHz PC2 TP anlaysis to 6.2.3 NS_49 |
CR revision of R5-230816 |
Huawei, HiSilicon | 38.905 17.7.0 CR#7321 catF | TEI16_Test, NR_bands_BW_R16-UEConTest | Rel-17 |
R5-98 AI: 5.4.16 |
agreed | [WTS] [JSN] |
| R5-231865 | Clarifications and alignment of REFSENS TP analysis for EN-DC and NR CA |
CR revision of R5-231310 |
Ericsson | 38.905 17.7.0 CR#7531 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.16 |
agreed | [WTS] [JSN] |
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