Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-226298 | Addition of NS_03U in Table 4.1.2.1-1 and correction of number of test points for NS_03 and NS_100 | CR | CAICT | 38.905 17.6.0 CR#679 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.16 |
agreed | [WTS] [JSN] |
| R5-226521 | Update of spurious emission TP analysis for Rel-15 NR CA configuration CA_n3A-n78A | CR | Ericsson | 38.905 17.6.0 CR#684 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.16 |
agreed | [WTS] [JSN] |
| R5-226522 | Update of spurious emission TP analysis for Rel-15 NR CA configuration CA_n8A-n78A | CR | Ericsson | 38.905 17.6.0 CR#685 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.16 |
agreed | [WTS] [JSN] |
| R5-226524 | Introduction of spurious emissions TP analysis for 18A_n77A |
CR revised to R5-227715 |
KDDI Corporation | 38.905 17.6.0 CR#686 catF | 5GS_NR_LTE-UEConTest, TEI15_Test | Rel-17 |
R5-97 AI: 5.4.16 |
revised | [WTS] [JSN] |
| R5-226525 | Introduction of spurious emissions TP analysis for 18A_n78A |
CR revised to R5-227716 |
KDDI Corporation | 38.905 17.6.0 CR#687 catF | 5GS_NR_LTE-UEConTest, TEI15_Test | Rel-17 |
R5-97 AI: 5.4.16 |
revised | [WTS] [JSN] |
| R5-226526 | Addition of refsence sensitivity test point analysis for 18A_n77A and 18A_n78A |
CR revised to R5-227717 |
KDDI Corporation | 38.905 17.6.0 CR#688 catF | 5GS_NR_LTE-UEConTest, TEI15_Test | Rel-17 |
R5-97 AI: 5.4.16 |
revised | [WTS] [JSN] |
| R5-226585 | Ref sense TP analysis for DC_30A_n66A | CR | Qualcomm Korea | 38.905 17.6.0 CR#689 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.16 |
agreed | [WTS] [JSN] |
| R5-226586 | Ref sense TP analysis for DC_66A_n5A |
CR revised to R5-227914 |
Qualcomm Korea | 38.905 17.6.0 CR#690 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.16 |
revised | [WTS] [JSN] |
| R5-226587 | Ref sense TP analysis for DC_12A_n66A |
CR revised to R5-227915 |
Qualcomm Korea | 38.905 17.6.0 CR#691 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.16 |
revised | [WTS] [JSN] |
| R5-227294 | Editorial corrections on TpAnalysisSpur filename | CR | ZTE Corporation | 38.905 17.6.0 CR#720 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.16 |
agreed | [WTS] [JSN] |
| R5-227715 | Introduction of spurious emissions TP analysis for 18A_n77A |
CR revision of R5-226524 |
KDDI Corporation | 38.905 17.6.0 CR#6861 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.16 |
agreed | [WTS] [JSN] |
| R5-227716 | Introduction of spurious emissions TP analysis for 18A_n78A |
CR revision of R5-226525 |
KDDI Corporation | 38.905 17.6.0 CR#6871 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.16 |
agreed | [WTS] [JSN] |
| R5-227717 | Addition of refsence sensitivity test point analysis for 18A_n77A and 18A_n78A |
CR revision of R5-226526 |
KDDI Corporation | 38.905 17.6.0 CR#6881 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.16 |
agreed | [WTS] [JSN] |
| R5-227914 | Ref sense TP analysis for DC_66A_n5A |
CR revision of R5-226586 |
Qualcomm Korea | 38.905 17.6.0 CR#6901 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.16 |
agreed | [WTS] [JSN] |
| R5-227915 | Ref sense TP analysis for DC_12A_n66A |
CR revision of R5-226587 |
Qualcomm Korea | 38.905 17.6.0 CR#6911 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-97 AI: 5.4.16 |
agreed | [WTS] [JSN] |
15 documents (0.32255101203918 seconds)