Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-232161 | FR2 MUs - General Update in 38.903 section B.2.2 |
CR revised to R5-233639 |
Keysight Technologies UK Ltd | 38.903 17.1.0 CR#506 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-232163 | PC1 MU - definition for SEM test case in 38.903 | CR | Keysight Technologies UK Ltd | 38.903 17.1.0 CR#507 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
withdrawn | [WTS] [JSN] |
| R5-232164 | PC1 MU - definition for ACS Case 1 and IBB test cases in 38.903 | CR | Keysight Technologies UK Ltd | 38.903 17.1.0 CR#508 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-232169 | FR2 PC3 - Network Analyzer MU update in 38.903 |
CR revised to R5-233640 |
Keysight Technologies UK Ltd | 38.903 17.1.0 CR#509 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-232306 | Replacement of TT analysis for FR2 BFD and BFR |
CR revised to R5-233644 |
Anritsu, Huawei, HiSilicon | 38.903 17.1.0 CR#512 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-232308 | Update of Test Tolerance analyses for EN-DC FR2 RLM tests for PSCell configured with CSI-RS-based RLM RS | CR | Anritsu | 38.903 17.1.0 CR#513 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-232631 | Removal of Offsets in B.18 | CR | Keysight Technologies UK Ltd | 38.903 17.1.0 CR#525 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-232662 | Addition of TT analysis for TCI state switch test cases 7.5.8.1.1 and 7.5.8.2.1 | CR | Qualcomm France | 38.903 17.1.0 CR#528 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
withdrawn | [WTS] [JSN] |
| R5-232676 | Addition of TT analysis for test cases 6.6.3.1 and 6.6.3.2 | CR | Qualcomm France | 38.903 17.1.0 CR#529 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-232757 | Correction to test tolerance analysis for 5.6.6.1 and 7.6.6.1 | CR | Huawei, HiSilicon | 38.903 17.1.0 CR#530 catF | TEI16_Test, NR_eMIMO-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-232912 | Correction of UE gain parameters | CR | Ericsson | 38.903 17.1.0 CR#532 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
withdrawn | [WTS] [JSN] |
| R5-232913 | Correction of Test Tolerance analysis for Inter-frequency SS-RSRP measurement accuracy tests in FR2 |
CR revised to R5-233643 |
Ericsson | 38.903 17.1.0 CR#533 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-232985 | Definition of MU for FR2c | CR | Anritsu | 38.903 17.1.0 CR#536 catF | TEI16_Test, NR_bands_BW_R16-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
withdrawn | [WTS] [JSN] |
| R5-233017 | Editorial correction to Annex B |
CR revised to R5-233695 |
Anritsu | 38.903 17.1.0 CR#537 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-233639 | FR2 MUs - General Update in 38.903 section B.2.2 |
CR revision of R5-232161 |
Keysight Technologies UK Ltd | 38.903 17.1.0 CR#5061 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-233640 | FR2 PC3 - Network Analyzer MU update in 38.903 |
CR revision of R5-232169 |
Keysight Technologies UK Ltd | 38.903 17.1.0 CR#5091 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-233643 | Correction of Test Tolerance analysis for Inter-frequency SS-RSRP measurement accuracy tests in FR2 |
CR revision of R5-232913 |
Ericsson | 38.903 17.1.0 CR#5331 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
withdrawn | [WTS] [JSN] |
| R5-233644 | Replacement of TT analysis for FR2 BFD and BFR |
CR revision of R5-232306 |
Anritsu, Huawei, HiSilicon | 38.903 17.1.0 CR#5121 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
withdrawn | [WTS] [JSN] |
| R5-233695 | Editorial correction to Annex B |
CR revision of R5-233017 |
Anritsu | 38.903 17.1.0 CR#5371 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.15 |
agreed | [WTS] [JSN] |
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