Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-230171 | PC1 MU - definition for ACLR test case in 38.903 |
CR revised to R5-231784 |
Keysight Technologies UK Ltd, Anritsu | 38.903 17.0.0 CR#457 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-230172 | PC1 MU - definition for Min power test case in 38.903 |
CR revised to R5-231849 |
Keysight Technologies UK Ltd, Anritsu | 38.903 17.0.0 CR#458 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-230173 | PC1 MU - definition for MOP test cases in 38.903 |
CR revised to R5-231785 |
Keysight Technologies UK Ltd, Anritsu | 38.903 17.0.0 CR#459 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-230174 | PC1 MU - definition for MPR test case in 38.903 |
CR revised to R5-231844 |
Keysight Technologies UK Ltd, Anritsu | 38.903 17.0.0 CR#460 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-230175 | PC1 MU - definition for REFSENS test case in 38.903 |
CR revised to R5-231786 |
Keysight Technologies UK Ltd, Anritsu | 38.903 17.0.0 CR#461 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-230176 | PC1 MU - definition for SEM test case in 38.903 |
CR revised to R5-231601 |
Keysight Technologies UK Ltd | 38.903 17.0.0 CR#462 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-230177 | PC1 MU - definition for Tx spurious test cases in 38.903 |
CR revised to R5-231787 |
Keysight Technologies UK Ltd, Anritsu | 38.903 17.0.0 CR#463 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-230178 | PC1 MU - General Update in 38.903 test case section B.2.2 |
CR revised to R5-231850 |
Keysight Technologies UK Ltd, Anritsu | 38.903 17.0.0 CR#464 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-230213 | Definition of PC1 MU |
CR revised to R5-231788 |
Anritsu | 38.903 17.0.0 CR#466 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-230221 | Update of the uncertainty of the network analyzer |
CR revised to R5-231966 |
ROHDE & SCHWARZ | 38.903 17.0.0 CR#467 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-230224 | Update of PC1 MU |
CR revised to R5-231968 |
ROHDE & SCHWARZ | 38.903 17.0.0 CR#468 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-230430 | Addition of test tolerance analysis for 5.5.3.1 EN-DC FR2 SCell activation and deactivation intra-band in non-DRX | CR | Sporton | 38.903 17.0.0 CR#469 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-230432 | Addition of test tolerance analysis for 8.4.2.5 NR Inter-RAT event triggered reporting tests for FR2 test cases |
CR revised to R5-231899 |
Sporton | 38.903 17.0.0 CR#470 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-230434 | Addition of test tolerance analysis for 8.4.2.6 and 8.4.2.7 and 8.4.2.8 NR Inter-RAT event triggered reporting tests for FR2 test cases | CR | Sporton | 38.903 17.0.0 CR#471 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-230778 | Addition of TT analysis for 7.3.1.2 |
CR revised to R5-231765 |
Qualcomm Incorporated | 38.903 17.0.0 CR#487 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-230779 | Addition of TT analysis for 7.3.1.3 and 7.3.2.3.1 |
CR revised to R5-231766 |
Qualcomm Incorporated | 38.903 17.0.0 CR#488 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-230850 | Replacement of TT analysis for FR2 BFD and BFR | CR | Anritsu | 38.903 17.0.0 CR#489 catF | TEI15_Test, 5GS_NR_LTE-UEConTest, NR_eMIMO-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
withdrawn | [WTS] [JSN] |
| R5-230925 | New TT analysis for TC 4A.1.1.1 | CR | Rohde & Schwarz | 38.903 17.0.0 CR#491 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-230926 | New TT analysis for TC 4A.2.1.1 | CR | Rohde & Schwarz | 38.903 17.0.0 CR#492 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-231345 | Max testable SNR table updates | CR | Qualcomm Technologies Int | 38.903 17.0.0 CR#502 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-231601 | PC1 MU - definition for SEM test case in 38.903 |
CR revision of R5-230176 |
Keysight Technologies UK Ltd | 38.903 17.0.0 CR#4621 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
withdrawn | [WTS] [JSN] |
| R5-231765 | Addition of TT analysis for 7.3.1.2 |
CR revision of R5-230778 |
Qualcomm Incorporated | 38.903 17.0.0 CR#4871 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-231766 | Addition of TT analysis for 7.3.1.3 and 7.3.2.3.1 |
CR revision of R5-230779 |
Qualcomm Incorporated | 38.903 17.0.0 CR#4881 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-231784 | PC1 MU - definition for ACLR test case in 38.903 |
CR revision of R5-230171 |
Keysight Technologies UK Ltd, Anritsu | 38.903 17.0.0 CR#4571 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-231785 | PC1 MU - definition for MOP test cases in 38.903 |
CR revision of R5-230173 |
Keysight Technologies UK Ltd, Anritsu | 38.903 17.0.0 CR#4591 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-231786 | PC1 MU - definition for REFSENS test case in 38.903 |
CR revision of R5-230175 |
Keysight Technologies UK Ltd, Anritsu | 38.903 17.0.0 CR#4611 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-231787 | PC1 MU - definition for Tx spurious test cases in 38.903 |
CR revision of R5-230177 |
Keysight Technologies UK Ltd, Anritsu | 38.903 17.0.0 CR#4631 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-231788 | Definition of PC1 MU |
CR revision of R5-230213 |
Anritsu | 38.903 17.0.0 CR#4661 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-231844 | PC1 MU - definition for MPR test case in 38.903 |
CR revision of R5-230174 |
Keysight Technologies UK Ltd, Anritsu | 38.903 17.0.0 CR#4601 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-231849 | PC1 MU - definition for Min power test case in 38.903 |
CR revision of R5-230172 |
Keysight Technologies UK Ltd, Anritsu | 38.903 17.0.0 CR#4581 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-231850 | PC1 MU - General Update in 38.903 test case section B.2.2 |
CR revision of R5-230178 |
Keysight Technologies UK Ltd, Anritsu | 38.903 17.0.0 CR#4641 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-231899 | Addition of test tolerance analysis for 8.4.2.5 NR Inter-RAT event triggered reporting tests for FR2 test cases |
CR revision of R5-230432 |
Sporton | 38.903 17.0.0 CR#4701 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-231966 | Update of the uncertainty of the network analyzer |
CR revision of R5-230221 |
ROHDE & SCHWARZ | 38.903 17.0.0 CR#4671 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-231968 | Update of PC1 MU |
CR revision of R5-230224 |
ROHDE & SCHWARZ | 38.903 17.0.0 CR#4681 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-98 AI: 5.4.15 |
agreed | [WTS] [JSN] |
34 documents (0.32615900039673 seconds)