Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-226099 | PC1 MU - definition for ACLR in 38.903 |
CR revised to R5-227967 |
Keysight Technologies UK Ltd | 38.903 16.13.0 CR#376 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-226100 | PC1 MU - definition for ACS in 38.903 |
CR revised to R5-227968 |
Keysight Technologies UK Ltd | 38.903 16.13.0 CR#377 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-226101 | PC1 MU - definition for Frequency error in 38.903 | CR | Keysight Technologies UK Ltd | 38.903 16.13.0 CR#378 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-226102 | PC1 MU - definition for Min power in 38.903 | CR | Keysight Technologies UK Ltd | 38.903 16.13.0 CR#379 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
withdrawn | [WTS] [JSN] |
| R5-226103 | PC1 MU - definition for MOP in 38.903 |
CR revised to R5-227969 |
Keysight Technologies UK Ltd | 38.903 16.13.0 CR#380 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-226104 | PC1 MU - definition for MPR in 38.903 | CR | Keysight Technologies UK Ltd | 38.903 16.13.0 CR#381 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
withdrawn | [WTS] [JSN] |
| R5-226105 | PC1 MU - definition for OFF power in 38.903 |
CR revised to R5-227970 |
Keysight Technologies UK Ltd | 38.903 16.13.0 CR#382 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-226106 | PC1 MU - definition for REFSENS in 38.903 |
CR revised to R5-227971 |
Keysight Technologies UK Ltd | 38.903 16.13.0 CR#383 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-226107 | PC1 MU - definition for SEM in 38.903 |
CR revised to R5-227972 |
Keysight Technologies UK Ltd | 38.903 16.13.0 CR#384 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-226108 | PC1 MU - General Update in 38.903 section B.2.2 |
CR revised to R5-227973 |
Keysight Technologies UK Ltd | 38.903 16.13.0 CR#385 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-226213 | TT analysis for Interruption TCs | CR | Huawei, Hisilicon | 38.903 16.13.0 CR#408 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-226214 | TT analysis for SCell activation TCs | CR | Huawei, Hisilicon | 38.903 16.13.0 CR#409 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-226375 | Test tolerance analysis for FR2 RRC-based DL active BWP switch | CR | Anritsu | 38.903 16.13.0 CR#410 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-226492 | Update of MU for PC1 RRM |
CR revised to R5-227821 |
ROHDE & SCHWARZ | 38.903 16.13.0 CR#437 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-226534 | Update of MU for PC1 Demod | CR | ROHDE & SCHWARZ | 38.903 16.13.0 CR#438 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-226642 | Capturing simulation results to derive the maximum testable SNR | CR | Qualcomm Israel Ltd. | 38.903 16.13.0 CR#439 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-226645 | PC1 update to Demod SNR range calculator |
CR revised to R5-227981 |
Qualcomm Israel Ltd. | 38.903 16.13.0 CR#440 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-226651 | Addition of TT analysis for 7.5.2.1 |
CR revised to R5-227869 |
Qualcomm Israel Ltd. | 38.903 16.13.0 CR#441 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-227076 | Definition of PC1 MU |
CR revised to R5-227989 |
Anritsu | 38.903 16.13.0 CR#442 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-227230 | 40cm QoQZ and XPD MU in 38.903 |
CR revised to R5-227822 |
ROHDE & SCHWARZ | 38.903 16.13.0 CR#447 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-227646 | PC1 update to Demod SNR range calculator |
CR revision of R5-227981 |
Qualcomm Israel Ltd. | 38.903 16.13.0 CR#4402 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-227821 | Update of MU for PC1 RRM |
CR revision of R5-226492 |
ROHDE & SCHWARZ | 38.903 16.13.0 CR#4371 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-227822 | 40cm QoQZ and XPD MU in 38.903 |
CR revision of R5-227230 |
ROHDE & SCHWARZ | 38.903 16.13.0 CR#4471 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-227869 | Addition of TT analysis for 7.5.2.1 |
CR revision of R5-226651 |
Qualcomm Israel Ltd. | 38.903 16.13.0 CR#4411 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-227967 | PC1 MU - definition for ACLR in 38.903 |
CR revision of R5-226099 |
Keysight Technologies UK Ltd | 38.903 16.13.0 CR#3761 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-227968 | PC1 MU - definition for ACS in 38.903 |
CR revision of R5-226100 |
Keysight Technologies UK Ltd | 38.903 16.13.0 CR#3771 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-227969 | PC1 MU - definition for MOP in 38.903 |
CR revision of R5-226103 |
Keysight Technologies UK Ltd | 38.903 16.13.0 CR#3801 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-227970 | PC1 MU - definition for OFF power in 38.903 |
CR revision of R5-226105 |
Keysight Technologies UK Ltd | 38.903 16.13.0 CR#3821 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-227971 | PC1 MU - definition for REFSENS in 38.903 |
CR revision of R5-226106 |
Keysight Technologies UK Ltd | 38.903 16.13.0 CR#3831 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-227972 | PC1 MU - definition for SEM in 38.903 |
CR revision of R5-226107 |
Keysight Technologies UK Ltd | 38.903 16.13.0 CR#3841 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-227973 | PC1 MU - General Update in 38.903 section B.2.2 |
CR revision of R5-226108 |
Keysight Technologies UK Ltd | 38.903 16.13.0 CR#3851 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-227981 | PC1 update to Demod SNR range calculator |
CR revision of R5-226645 revised to R5-227646 |
Qualcomm Israel Ltd. | 38.903 16.13.0 CR#4401 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-227989 | Definition of PC1 MU |
CR revision of R5-227076 |
Anritsu | 38.903 16.13.0 CR#4421 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-97 AI: 5.4.15 |
agreed | [WTS] [JSN] |
33 documents (0.34327793121338 seconds)