Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
Download results in JSON format
| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-223928 | Add Test Tolerance analyses for EN-DC FR2 RLM tests for PSCell configured with CSI-RS-based RLM RS in DRX |
CR revised to R5-225618 |
Anritsu | 38.903 16.12.0 CR#321 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-223964 | TT analysis for 5.7.1.3 and 7.7.1.3 | CR | ROHDE & SCHWARZ | 38.903 16.12.0 CR#322 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-224310 | PC1 MU - definition for MOP in 38.903 |
CR revised to R5-225671 |
Keysight Technologies UK Ltd, Anritsu | 38.903 16.12.0 CR#335 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-224311 | PC1 MU - definition for REFSENS in 38.903 |
CR revised to R5-225672 |
Keysight Technologies UK Ltd, Anritsu | 38.903 16.12.0 CR#336 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-224312 | PC1 MU - General Update in 38.903 section B.2.2 |
CR revised to R5-225673 |
Keysight Technologies UK Ltd | 38.903 16.12.0 CR#337 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-224498 | EN-DC FR2 SRS-RSRP measurement accuracy | CR | Qualcomm Technologies Int | 38.903 16.12.0 CR#340 catF | NR_CLI-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
withdrawn | [WTS] [JSN] |
| R5-224554 | TT analysis for NR SA FR2 RRM TC 7.1.1.1 - intra-freq reselection |
CR revised to R5-225867 |
Huawei, HiSilicon | 38.903 16.12.0 CR#357 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-224555 | TT analysis for NR SA FR2 RRM TC 7.1.1.2 - inter-freq reselection |
CR revised to R5-225868 |
Huawei, HiSilicon | 38.903 16.12.0 CR#358 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-224612 | Definition of PC1 MU |
CR revised to R5-225674 |
Anritsu | 38.903 16.12.0 CR#359 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-224615 | Update FR2 TRx MU in 38.903 |
CR revised to R5-225675 |
Anritsu | 38.903 16.12.0 CR#360 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-224803 | TT analysis update for FR2 RLM test cases 5.5.1.x and 7.5.1.x |
CR revised to R5-225636 |
Qualcomm Korea | 38.903 16.12.0 CR#366 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-225137 | Test Tolerances for Intra-frequency SS-RSRP measurement accuracy tests in FR2 | CR | Ericsson | 38.903 16.12.0 CR#367 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-225138 | Test Tolerances for SSB based L1-RSRP measurement accuracy tests in FR2 |
CR revised to R5-225637 |
Ericsson | 38.903 16.12.0 CR#368 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-225139 | Test Tolerances for FR2 CSI-RS based L1-RSRPSS-RSRP measurement accuracy tests in FR2 |
CR revised to R5-225638 |
Ericsson | 38.903 16.12.0 CR#369 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
revised | [WTS] [JSN] |
| R5-225618 | Add Test Tolerance analyses for EN-DC FR2 RLM tests for PSCell configured with CSI-RS-based RLM RS in DRX |
CR revision of R5-223928 |
Anritsu | 38.903 16.12.0 CR#3211 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-225636 | TT analysis update for FR2 RLM test cases 5.5.1.x and 7.5.1.x |
CR revision of R5-224803 |
Qualcomm Korea | 38.903 16.12.0 CR#3661 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-225637 | Test Tolerances for SSB based L1-RSRP measurement accuracy tests in FR2 |
CR revision of R5-225138 |
Ericsson | 38.903 16.12.0 CR#3681 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-225638 | Test Tolerances for FR2 CSI-RS based L1-RSRPSS-RSRP measurement accuracy tests in FR2 |
CR revision of R5-225139 |
Ericsson | 38.903 16.12.0 CR#3691 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-225671 | PC1 MU - definition for MOP in 38.903 |
CR revision of R5-224310 |
Keysight Technologies UK Ltd, Anritsu | 38.903 16.12.0 CR#3351 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-225672 | PC1 MU - definition for REFSENS in 38.903 |
CR revision of R5-224311 |
Keysight Technologies UK Ltd, Anritsu | 38.903 16.12.0 CR#3361 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-225673 | PC1 MU - General Update in 38.903 section B.2.2 |
CR revision of R5-224312 |
Keysight Technologies UK Ltd | 38.903 16.12.0 CR#3371 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-225674 | Definition of PC1 MU |
CR revision of R5-224612 |
Anritsu | 38.903 16.12.0 CR#3591 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-225675 | Update FR2 TRx MU in 38.903 |
CR revision of R5-224615 |
Anritsu | 38.903 16.12.0 CR#3601 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-225867 | TT analysis for NR SA FR2 RRM TC 7.1.1.1 - intra-freq reselection |
CR revision of R5-224554 |
Huawei, HiSilicon | 38.903 16.12.0 CR#3571 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
agreed | [WTS] [JSN] |
| R5-225868 | TT analysis for NR SA FR2 RRM TC 7.1.1.2 - inter-freq reselection |
CR revision of R5-224555 |
Huawei, HiSilicon | 38.903 16.12.0 CR#3581 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-16 |
R5-96-e AI: 5.4.15 |
agreed | [WTS] [JSN] |
25 documents (0.3374719619751 seconds)