Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-240213 | Editorial correction to HST TCs on test applicability description | CR | MediaTek Beijing Inc. | 38.533 18.1.0 CR#2880 catF | TEI17_Test | Rel-18 |
R5-102 AI: 5.4.10.1 |
withdrawn | [WTS] [JSN] |
| R5-240702 | Correction to EN-DC and NR SA inter-frequency measurement test cases | CR | Huawei,HiSilicon,Starpoint | 38.533 18.1.0 CR#2922 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.10.1 |
withdrawn | [WTS] [JSN] |
| R5-240703 | Correction to EN-DC and NR SA SCell activation test cases |
CR revised to R5-241994 |
Huawei,HiSilicon,Starpoint | 38.533 18.1.0 CR#2923 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.10.1 |
revised | [WTS] [JSN] |
| R5-240704 | Correction to PCI updating formulas in RRM test cases |
CR revised to R5-241995 |
Huawei, HiSilicon, Starpoint | 38.533 18.1.0 CR#2924 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.10.1 |
revised | [WTS] [JSN] |
| R5-240758 | Correction to FR1 4-step RACH test cases with TT | CR | Huawei, HiSilicon | 38.533 18.1.0 CR#2955 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.10.1 |
agreed | [WTS] [JSN] |
| R5-240759 | Correction to FR1 2-step RACH test cases with TT | CR | Huawei,HiSilicon | 38.533 18.1.0 CR#2956 catF | TEI16_Test, NR_2step_RACH-UEConTest | Rel-18 |
R5-102 AI: 5.4.10.1 |
agreed | [WTS] [JSN] |
| R5-240760 | Correction to FR1 inter frequency SS SINR relative accuracy test cases with TT | CR | Huawei, HiSilicon | 38.533 18.1.0 CR#2957 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.10.1 |
agreed | [WTS] [JSN] |
| R5-240761 | Correction to FR1 L1 RSRP absolute accuracy test cases with TT | CR | Huawei, HiSilicon | 38.533 18.1.0 CR#2958 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.10.1 |
agreed | [WTS] [JSN] |
| R5-240762 | Correction to FR1 LTE RSRP accuracy test case 6.7.5.1 with TT | CR | Huawei, HiSilicon | 38.533 18.1.0 CR#2959 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.10.1 |
agreed | [WTS] [JSN] |
| R5-240763 | Correction to Annex F for R15 RRM test cases | CR | Huawei,HiSilicon | 38.533 18.1.0 CR#2960 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.10.1 |
withdrawn | [WTS] [JSN] |
| R5-240968 | Correct Table 4.3.2.2.1.4.1-2 & Table 4.3.2.2.2.4.1-2 & Table 4.3.2.2.3.4.1-2 & Table 4.3.2.2.4.4.1-2 of test frequency |
CR revised to R5-241833 |
SGS Wireless | 38.533 18.1.0 CR#2989 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.10.1 |
revised | [WTS] [JSN] |
| R5-241119 | Correction to test applicability of 4.6.1.7 |
CR revised to R5-241834 |
Anritsu, MediaTek Beijing Inc. | 38.533 18.1.0 CR#2995 catF | TEI16_Test, NR_HST-UEConTest | Rel-18 |
R5-102 AI: 5.4.10.1 |
revised | [WTS] [JSN] |
| R5-241160 | Correction to EN-DC FR1 Beam Failure TCs 4.5.5.x | CR | Keysight Technologies UK Ltd | 38.533 18.1.0 CR#3005 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.10.1 |
agreed | [WTS] [JSN] |
| R5-241200 | Correct of EN-DC FR1 addition and release delay of known PSCell for test case 4.5.7.1 including Test Tolerance | CR | Sporton | 38.533 18.1.0 CR#3009 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.10.1 |
agreed | [WTS] [JSN] |
| R5-241833 | Correct Table 4.3.2.2.1.4.1-2 & Table 4.3.2.2.2.4.1-2 & Table 4.3.2.2.3.4.1-2 & Table 4.3.2.2.4.4.1-2 of test frequency |
CR revision of R5-240968 |
SGS Wireless | 38.533 18.1.0 CR#29891 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.10.1 |
agreed | [WTS] [JSN] |
| R5-241834 | Correction to test applicability of 4.6.1.7 |
CR revision of R5-241119 |
Anritsu, MediaTek Beijing Inc. | 38.533 18.1.0 CR#29951 catF | TEI16_Test, NR_HST-UEConTest | Rel-18 |
R5-102 AI: 5.4.10.1 |
agreed | [WTS] [JSN] |
| R5-241994 | Correction to EN-DC and NR SA SCell activation test cases |
CR revision of R5-240703 |
Huawei,HiSilicon,Starpoint | 38.533 18.1.0 CR#29231 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.10.1 |
agreed | [WTS] [JSN] |
| R5-241995 | Correction to PCI updating formulas in RRM test cases |
CR revision of R5-240704 |
Huawei, HiSilicon, Starpoint | 38.533 18.1.0 CR#29241 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4.10.1 |
agreed | [WTS] [JSN] |
18 documents (0.33515214920044 seconds)