Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-153094 | Addition of cell configuration mapping for RRM test cases 8.16.17 and 8.16.18 | CR | Bureau Veritas ADT | 36.521-3 12.6.0 CR#1183 catF | TEI10_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153095 | Correction of cell configuration mapping for RRM cases | CR | Bureau Veritas ADT | 36.521-3 12.6.0 CR#1184 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153096 | Correction of RMC used in UE Timing Advance Adjustment Accuracy Test for SCell in sTAG | CR | Bureau Veritas ADT | 36.521-3 12.6.0 CR#1185 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153097 | Correction of descriptions for test cases 8.16.18 | CR | Bureau Veritas ADT | 36.521-3 12.6.0 CR#1186 catF | TEI10_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153098 | Update editor’s note for RRM test case 8.16.17 and 8.16.18 | CR | Bureau Veritas ADT | 36.521-3 12.6.0 CR#1187 catF | TEI10_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153133 | New TC: E-UTRAN TDD - UE Timing Advance Adjustment Accuracy Test for Scell in sTAG for 20 MHz +20 MHz bandwidth | CR | SGS Wireless, Bureau Veritas ADT | 36.521-3 12.6.0 CR#1188 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153134 | New TC: E-UTRAN TDD - UE Timing Advance Adjustment Accuracy Test for Scell in sTAG for 20 MHz +10 MHz bandwidth | CR | SGS Wireless, Bureau Veritas ADT | 36.521-3 12.6.0 CR#1189 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153135 | New TC: E-UTRAN TDD activation and deactivation of known SCell in non-DRX for 20MHz +20MHz bandwidth | CR | SGS Wireless, Bureau Veritas ADT | 36.521-3 12.6.0 CR#1190 catF | TEI10_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153156 | New TC: E-UTRAN TDD - UE Transmit Timing Accuracy Tests for SCell in sTAG for 20MHz + 20MHz bandwidth | CR | Bureau Veritas ADT | 36.521-3 12.6.0 CR#1191 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153157 | New TC: E-UTRAN TDD - UE Transmit Timing Accuracy Tests for SCell in sTAG for 20MHz + 10MHz bandwidth | CR | Bureau Veritas ADT | 36.521-3 12.6.0 CR#1192 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153164 | New TC: E-UTRAN TDD - UE Transmit Timing Accuracy Tests for SCell for 20MHz + 10MHz bandwidth | CR | Bureau Veritas ADT | 36.521-3 12.6.0 CR#1193 catF | TEI11_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153167 | Cell configuration mapping for newly introduced 20+20MHz and 20+10MHz cases | CR | Bureau Veritas ADT | 36.521-3 12.6.0 CR#1194 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153172 | Correction to applicability of TD-LTE to UTRA TDD connected mode measurements | CR | QUALCOMM UK Ltd | 36.521-3 12.6.0 CR#1195 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153174 | Correction to cell mapping of eICIC Chapter 9 test cases | CR | QUALCOMM UK Ltd | 36.521-3 12.6.0 CR#1196 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153176 | Addition of missing titles to section 8 RRM test cases | CR | QUALCOMM UK Ltd | 36.521-3 12.6.0 CR#1197 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153249 | CA RRM: Clarification of PHICH configuration | CR | Rohde & Schwarz | 36.521-3 12.6.0 CR#1204 catF | TEI10_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153250 | RRM: Minor correction to TC 8.7.2 | CR | Rohde & Schwarz | 36.521-3 12.6.0 CR#1205 catF | TEI8_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153310 | Correction of L2G PSHO applicability for TS 36.521-3 spec | CR | NTT DOCOMO INC. | 36.521-3 12.6.0 CR#1209 catF | TEI8_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153357 | Correction to RLM tests for eICIC | CR | Anritsu | 36.521-3 12.6.0 CR#1210 catF | TEI10_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153358 | Correction to initial conditions in event triggered reporting tests | CR | Anritsu | 36.521-3 12.6.0 CR#1211 catF | TEI10_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153359 | Correction to RSRP and RSRQ test cases | CR | Anritsu | 36.521-3 12.6.0 CR#1212 catF | TEI10_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153360 | Clarification of neighbor cell frequency for intra-band non-contiguous CA | CR | Anritsu | 36.521-3 12.6.0 CR#1213 catF | TEI10_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153387 | Correction to applicability of feICIC RRM test cases. | CR | QUALCOMM UK Ltd | 36.521-3 12.6.0 CR#1215 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153446 | Cell mapping for new RRM TCs 7.1.3_1+7.1.4_1 | CR | Huawei, Anritsu | 36.523-1 12.6.0 CR#3095 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153447 | Applicability for new RRM TCs 7.1.3_1+7.1.4_1 | CR | Huawei, Anritsu | 36.523-1 12.6.0 CR#3096 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153448 | Addition of new RRM TCs 7.1.3_1+7.1.4_1 | CR | Huawei, Anritsu | 36.523-1 12.6.0 CR#3097 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153461 | New TC: 8.20.2A for RRM | CR | CMCC | 36.521-3 12.6.0 CR#1222 catF | TEI10_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153464 | Update of minimum requirements for relative RSRP Accuracy TC 9.1.6.2 and 9.1.7.2 | CR | CMCC | 36.521-3 12.6.0 CR#1223 catF | TEI10_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153467 | New TCs: FDD Rel-12 CA RSRP relative accuracy tests | CR | CMCC | 36.521-3 12.6.0 CR#1224 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153469 | New TCs: TDD Rel-12 CA RSRP relative accuracy tests | CR | CMCC | 36.521-3 12.6.0 CR#1225 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153471 | Update of test applicabilites for Rel-10 CA RSRP relative accuracy tests | CR | CMCC | 36.521-3 12.6.0 CR#1226 catF | TEI10_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153473 | Update of test applicabilites for Rel-11 CA RSRP relative accuracy tests | CR | China Mobile Com. Corporation | 36.521-3 12.6.0 CR#1227 catF | TEI11_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153475 | Update of Annex E for RRM 9.1.6.2_1 and 9.1.7.2_1 | CR | CMCC | 36.521-3 12.6.0 CR#1228 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153553 | Correction to 8.16.17 and 8.16.18 activation and deactivation of known Scell | CR | Anritsu | 36.521-3 12.6.0 CR#1236 catF | TEI10_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153688 | Cell mapping for new RRM TCs 7.1.3_1+7.1.4_1 | CR | Huawei, Anritsu | 36.521-3 12.6.0 CR#1240 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153689 | Applicability for new RRM TCs 7.1.3_1+7.1.4_1 | CR | Huawei, Anritsu | 36.521-2 12.6.0 CR#306 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153690 | Addition of new RRM TCs 7.1.3_1+7.1.4_1 | CR | Huawei, Anritsu | 36.521-3 12.6.0 CR#1241 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153692 | Correction to relative measurement test cases of feICIC RRM test cases. | CR | Qualcomm Inc | 36.521-3 12.6.0 CR#1242 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
available | [WTS] [JSN] |
| R5-153812 | New TC: E-UTRAN TDD activation and deactivation of known SCell in non-DRX for 20MHz +20MHz bandwidth | CR | SGS Wireless, Bureau Veritas ADT | 36.521-3 12.7.0 CR#11901 catF | TEI10_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
agreed | [WTS] [JSN] |
| R5-153814 | New TCs: FDD Rel-12 CA RSRP relative accuracy tests | CR | CMCC | 36.521-3 12.7.0 CR#12241 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
agreed | [WTS] [JSN] |
| R5-153815 | New TCs: TDD Rel-12 CA RSRP relative accuracy tests | CR | CMCC | 36.521-3 12.7.0 CR#12251 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
agreed | [WTS] [JSN] |
| R5-153816 | Addition of new RRM TCs 7.1.3_1+7.1.4_1 | CR | Huawei | 36.521-3 12.7.0 CR#12411 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
agreed | [WTS] [JSN] |
| R5-153818 | Correction of descriptions for test cases 8.16.18 | CR | Bureau Veritas ADT | 36.521-3 12.7.0 CR#11861 catF | TEI10_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
agreed | [WTS] [JSN] |
| R5-153819 | Update editor’s note for RRM test case 8.16.17 and 8.16.18 | CR | Bureau Veritas ADT | 36.521-3 12.7.0 CR#11871 catF | TEI10_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
agreed | [WTS] [JSN] |
| R5-153930 | New TC: E-UTRAN TDD - UE Timing Advance Adjustment Accuracy Test for Scell in sTAG for 20 MHz +20 MHz bandwidth | CR | SGS Wireless, Bureau Veritas ADT | 36.521-3 12.7.0 CR#11881 catF | LTE_CA_Rel12_2UL-UEConTest | Rel-12 |
R5-68 AI: 5.4.1.4 |
agreed | [WTS] [JSN] |
| R5-153931 | New TC: E-UTRAN TDD - UE Timing Advance Adjustment Accuracy Test for Scell in sTAG for 20 MHz +10 MHz bandwidth | CR | SGS Wireless, Bureau Veritas ADT | 36.521-3 12.7.0 CR#11891 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
agreed | [WTS] [JSN] |
| R5-153934 | Correction to applicability of TD-LTE to UTRA TDD connected mode measurements | CR | QUALCOMM UK Ltd | 36.521-3 12.7.0 CR#11951 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
agreed | [WTS] [JSN] |
| R5-153936 | New TC: E-UTRAN TDD - UE Transmit Timing Accuracy Tests for SCell in sTAG for 20MHz + 20MHz bandwidth | CR | Bureau Veritas ADT | 36.521-3 12.7.0 CR#11911 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
agreed | [WTS] [JSN] |
| R5-153937 | New TC: E-UTRAN TDD - UE Transmit Timing Accuracy Tests for SCell in sTAG for 20MHz + 10MHz bandwidth | CR | Bureau Veritas ADT | 36.521-3 12.7.0 CR#11921 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
agreed | [WTS] [JSN] |
| R5-153938 | Correction to cell mapping of eICIC Chapter 9 test cases | CR | QUALCOMM UK Ltd | 36.521-3 12.7.0 CR#11961 catF | TEI12_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
agreed | [WTS] [JSN] |
| R5-153939 | Clarification of neighbor cell frequency for intra-band non-contiguous CA | CR | Anritsu | 36.521-3 12.7.0 CR#12131 catF | TEI10_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
agreed | [WTS] [JSN] |
| R5-153940 | Update of minimum requirements for relative RSRP Accuracy TC 9.1.6.2 and 9.1.7.2 | CR | CMCC | 36.521-3 12.7.0 CR#12231 catF | TEI10_Test | Rel-12 |
R5-68 AI: 5.4.1.4 |
agreed | [WTS] [JSN] |
52 documents (0.33338403701782 seconds)