Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-196058 | Correction to Applicability Conditions for TC8.10.1.2.6 and C183, C185m updates | CR | Samsung R&D Institute UK | 36.521-2 16.1.0 CR#862 catF | TEI10_Test, LTE_4Rx_AP_DL-UEConTest | Rel-16 |
R5-84 AI: 5.4.1.3 |
withdrawn | [WTS] [JSN] |
| R5-196583 | Correction to Applicability condition on Table 4.2-1 for TC4.2.31 | CR | TTA | 36.521-2 16.1.0 CR#869 catF | TEI13_Test, LTE_UE_cat_1RX-UEConTest | Rel-16 |
R5-84 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-196712 | Addition of TC7.9F Applicability of RF conformance | CR | SGS Wireless | 36.521-2 16.1.0 CR#871 catF | TEI13_Test | Rel-16 |
R5-84 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-196713 | Modify TC 4.2.31 the RRM conformance condition of applicability | CR | SGS Wireless | 36.521-2 16.1.0 CR#872 catF | TEI13_Test | Rel-16 |
R5-84 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-196759 | Addition of test applicability for 8.2.2.8.1 and 8.2.2.8.2 | CR | Huawei, HiSilicon | 36.521-2 16.1.0 CR#873 catF | TEI12_Test | Rel-16 |
R5-84 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-196837 | Updates to Tested CA Configurations Selection Criteria |
CR revised to R5-197486 |
Intel Corporation (UK) Ltd, TTA | 36.521-2 16.1.0 CR#874 catF | TEI12_Test | Rel-16 |
R5-84 AI: 5.4.1.3 |
revised | [WTS] [JSN] |
| R5-196865 | Updating NOTE 1 and NOTE 2 in Section 4 of TS36.521-2 |
CR revised to R5-197452 |
Intel | 36.521-2 16.1.0 CR#875 catF | TEI10_Test | Rel-16 |
R5-84 AI: 5.4.1.3 |
revised | [WTS] [JSN] |
| R5-196866 | Updating TS36.521-2 Table 4.1-1 Applicability of RF conformance test cases, ref. TS 36.521-1 | CR | Intel | 36.521-2 16.1.0 CR#876 catF | TEI10_Test | Rel-16 |
R5-84 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-196867 | Updating TS36.521-2 Table 4.2-1 Applicability of RRM conformance test cases, ref. TS 36.521-3 | CR | Intel | 36.521-2 16.1.0 CR#877 catF | TEI10_Test | Rel-16 |
R5-84 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-196939 | Correction to Applicability Conditions for TC8.10.1.2.6 and C183, C183m updates | CR | Samsung R&D Institute UK | 36.521-2 16.1.0 CR#878 catF | TEI10_Test, LTE_4Rx_AP_DL-UEConTest | Rel-16 |
R5-84 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-197311 | Updating the applicability table to remove transient period for FGI bits 103 and 104 | CR | Huawei, HiSilicon | 36.521-2 16.1.0 CR#880 catF | TEI15_Test | Rel-16 |
R5-84 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-197452 | Updating NOTE 1 and NOTE 2 in Section 4 of TS36.521-2 |
CR revision of R5-196865 |
Intel | 36.521-2 16.1.0 CR#8751 catF | TEI10_Test | Rel-16 |
R5-84 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-197486 | Updates to Tested CA Configurations Selection Criteria |
CR revision of R5-196837 revised to R5-197631 |
Intel Corporation (UK) Ltd, TTA | 36.521-2 16.1.0 CR#8741 catF | TEI12_Test | Rel-16 |
R5-84 AI: 5.4.1.3 |
revised | [WTS] [JSN] |
| R5-197631 | Updates to Tested CA Configurations Selection Criteria |
CR revision of R5-197486 |
Intel Corporation (UK) Ltd, TTA | 36.521-2 16.1.0 CR#8742 catF | TEI12_Test | Rel-16 |
R5-84 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
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