Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-191240 | Editorial Correction of title of TC 6.5.2.1EB in TS 36.521-2 | CR | ROHDE & SCHWARZ | 36.521-2 15.4.0 CR#808 catF | TEI13_Test, LTE_UE_cat_1RX-UEConTest | Rel-15 |
R5-82 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-191277 | Alignment of TS 36.521-2 to TS 36.521-1 for enhanced NB-IoT TCs | CR | ROHDE & SCHWARZ | 36.521-2 15.4.0 CR#810 catF | TEI14_Test, NB_IOTenh-UEConTest | Rel-15 |
R5-82 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-191459 | Update the description of FGI bits 103 and 104 in 36.521-2 |
CR revised to R5-192613 |
Huawei, HiSilicon | 36.521-2 15.4.0 CR#811 catF | TEI15_Test | Rel-15 |
R5-82 AI: 5.4.1.3 |
revised | [WTS] [JSN] |
| R5-191462 | Update the applicability of RF test cases related to FGI bits 103 and 104 |
CR revised to R5-192614 |
Huawei, HiSilicon | 36.521-2 15.4.0 CR#812 catF | TEI15_Test | Rel-15 |
R5-82 AI: 5.4.1.3 |
revised | [WTS] [JSN] |
| R5-191481 | Correction to test CA configurations selection criteria |
CR revised to R5-192645 |
Bureau Veritas | 36.521-2 15.4.0 CR#815 catF | TEI10_Test | Rel-15 |
R5-82 AI: 5.4.1.3 |
revised | [WTS] [JSN] |
| R5-191482 | Correction to RRM condition used incorrect PICS table for the tests | CR | Bureau Veritas | 36.521-2 15.4.0 CR#816 catF | TEI8_Test | Rel-15 |
R5-82 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-191972 | Applicability update of NB-IOT RACH test case | CR | Qualcomm UK Ltd | 36.521-2 15.4.0 CR#822 catF | TEI13_Test | Rel-15 |
R5-82 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-192035 | Applicability update LAA SDR test cases- Editorial | CR | Qualcomm UK Ltd | 36.521-2 15.4.0 CR#823 catF | TEI13_Test | Rel-15 |
R5-82 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-192099 | Correction to conditions C04i, C04j, C04k and C04l in Table 4.2-1a | CR | CGC Inc. | 36.521-2 15.4.0 CR#825 catF | TEI12_Test | Rel-15 |
R5-82 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-192106 | Correction to conditions in Table A.4.1-1a which are for test case support DL CA without UL CA | CR | CGC Inc. | 36.521-2 15.4.0 CR#826 catF | TEI10_Test | Rel-15 |
R5-82 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-192110 | Correction to the titles for NB1 and NB2 test cases in Table 4.1-1 | CR | CGC Inc. | 36.521-2 15.4.0 CR#827 catF | NB_IOTenh-UEConTest | Rel-15 |
R5-82 AI: 5.4.1.3 |
withdrawn | [WTS] [JSN] |
| R5-192113 | Updating ICS Table A.4.5-1 | CR | Intel Corporation (UK) Ltd | 36.521-2 15.4.0 CR#828 catF | TEI13_Test | Rel-15 |
R5-82 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-192613 | Update the description of FGI bits 103 and 104 in 36.521-2 |
CR revision of R5-191459 |
Huawei, HiSilicon | 36.521-2 15.4.0 CR#8111 catF | TEI15_Test | Rel-15 |
R5-82 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-192614 | Update the applicability of RF test cases related to FGI bits 103 and 104 |
CR revision of R5-191462 revised to R5-192849 |
Huawei, HiSilicon | 36.521-2 15.4.0 CR#8121 catF | TEI15_Test | Rel-15 |
R5-82 AI: 5.4.1.3 |
revised | [WTS] [JSN] |
| R5-192645 | Correction to test CA configurations selection criteria |
CR revision of R5-191481 |
Bureau Veritas | 36.521-2 15.4.0 CR#8151 catF | TEI10_Test | Rel-15 |
R5-82 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
| R5-192849 | Update the applicability of RF test cases related to FGI bits 103 and 104 |
CR revision of R5-192614 |
Huawei, HiSilicon | 36.521-2 15.4.0 CR#8122 catF | TEI15_Test | Rel-15 |
R5-82 AI: 5.4.1.3 |
agreed | [WTS] [JSN] |
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