Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-160086 Addition the bandwidth combination set 2 for CA_41C and the CA configuration for CA_8A_40A CR Korea Testing Laboratory 36.521-1 12.8.0 CR#2365 catF Rel-12 R5-70

AI: 5.4.1.2.3

withdrawn [WTS] [JSN]
R5-160087 Correction for CA_3A-7C bandwidth combination set CR Korea Testing Laboratory 36.521-1 12.8.0 CR#2366 catF Rel-12 R5-70

AI: 5.4.1.2.3

withdrawn [WTS] [JSN]
R5-160124 Correction to test case 8.7.1.1_A.1 CR TTA, KTL 36.521-1 13.0.1 CR#2371 catF TEI10_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-160125 Correction to test case 9.3.2.1.1 CR TTA, KTL 36.521-1 13.0.1 CR#2372 catF TEI8_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-160135 Correction to power level for dual layer TM9 demodulation tests CR

revised to R5-161111

ZTE Corporation 36.521-1 13.0.1 CR#2373 catF TEI11_Test Rel-13 R5-70

AI: 5.4.1.2.3

revised [WTS] [JSN]
R5-160136 TTs to Annex F correcting power level for dual layer TM9 demodulation tests CR ZTE Corporation 36.521-1 13.0.1 CR#2374 catF TEI11_Test Rel-13 R5-70

AI: 5.4.1.2.3

not pursued [WTS] [JSN]
R5-160166 Corrections to eDL MIMO test case 9.3.1.2.2_D CR CATR 36.521-1 13.0.1 CR#2388 catF TEI10_Test Rel-13 R5-70

AI: 5.4.1.2.3

withdrawn [WTS] [JSN]
R5-160484 Clean up on performance test cases CR Anritsu 36.521-1 13.0.1 CR#2453 catF TEI11_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-160485 Correction to 9.5.5.1_F.1 and 9.5.5.1_F.2 for RI Reporting test with CoMP CR Anritsu 36.521-1 13.0.1 CR#2454 catF TEI11_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-160486 Correction to 8.2.2.2.4 and 8.2.2.4.3 for Enhanced Performance Type A CR Anritsu 36.521-1 13.0.1 CR#2455 catF TEI11_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-160487 Correction to CQI reporting tests for Enhanced Performance Type A CR Anritsu 36.521-1 13.0.1 CR#2456 catF TEI11_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-160488 Correction to CQI and RI reporting tests for feICIC CR Anritsu 36.521-1 13.0.1 CR#2457 catF TEI11_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-160489 Correction to TDD CQI Reporting for feICIC CR

revised to R5-161048

Anritsu 36.521-1 13.0.1 CR#2458 catF TEI11_Test Rel-13 R5-70

AI: 5.4.1.2.3

revised [WTS] [JSN]
R5-160490 Correction to PCFICH/PDCCH and PHICH Tx Divercity for feICIC CR Anritsu 36.521-1 13.0.1 CR#2459 catF TEI11_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-160491 Correction to G.5.4 for minimum test time CR Anritsu 36.521-1 13.0.1 CR#2460 catF TEI11_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-160492 Correction to UL 64 QAM RMC CR

revised to R5-161049

Anritsu, Huawei, HiSilicon 36.521-1 13.0.1 CR#2461 catF TEI12_Test Rel-13 R5-70

AI: 5.4.1.2.3

revised [WTS] [JSN]
R5-160514 Correction to UE category information in test case 8.2.1.1.1 CR

revised to R5-160804

CGC Inc. 36.521-1 13.0.1 CR#2466 catF TEI8_Test Rel-13 R5-70

AI: 5.4.1.2.3

revised [WTS] [JSN]
R5-160515 Correction to test case applicability for test case 9.2.1.3_C.1 and 9.2.1.4_C.1 CR

revised to R5-160805

CGC Inc. 36.521-1 13.0.1 CR#2467 catF TEI10_Test Rel-13 R5-70

AI: 5.4.1.2.3

revised [WTS] [JSN]
R5-160560 Correction to CQI reports in CoMP fading test CR

revised to R5-161050

Anritsu Corporation 36.521-1 13.0.1 CR#2475 catF TEI11_Test Rel-13 R5-70

AI: 5.4.1.2.3

revised [WTS] [JSN]
R5-160564 Correction to test system uncertainties for Rx 7.6.3 CR

revised to R5-160881

Anritsu Corporation 36.521-1 13.0.1 CR#2476 catF TEI8_Test Rel-13 R5-70

AI: 5.4.1.2.3

revised [WTS] [JSN]
R5-160569 Correction to PMI Reporting for eDL-MIMO CR Anritsu Corporation 36.521-1 13.0.1 CR#2477 catF TEI10_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-160576 Annex A: Corrections to DL RMCs CR Rohde & Schwarz 36.521-1 13.0.1 CR#2478 catF TEI10_Test Rel-13 R5-70

AI: 5.4.1.2.3

withdrawn [WTS] [JSN]
R5-160577 Annex F: Corrections for intra-band contiguous UL CA Test Cases CR

revised to R5-160801

Rohde & Schwarz 36.521-1 13.0.1 CR#2479 catF TEI10_Test Rel-13 R5-70

AI: 5.4.1.2.3

revised [WTS] [JSN]
R5-160578 Minor corrections to applicabilities of TCs 8.2.2.2.3_E.1 & 8.2.2.3.3_E.1 CR Rohde & Schwarz 36.521-1 13.0.1 CR#2480 catF TEI11_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-160580 Correction to PDCP SDU size in TC 8.7.2.1 CR Rohde & Schwarz 36.521-1 13.0.1 CR#2482 catF TEI9_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-160588 Addition of Maximum Wgap definition CR Rohde & Schwarz 36.521-1 13.0.1 CR#2490 catF TEI11_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-160686 Add reference to TR 36.905 in 36.521-1 CR Ericsson 36.521-1 13.0.1 CR#2519 catF TEI8_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-160801 Annex F: Corrections for intra-band contiguous UL CA Test Cases CR

revision of R5-160577

Rohde & Schwarz 36.521-1 13.0.1 CR#24791 catF TEI10_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-160804 Correction to UE category information in test case 8.2.1.1.1 CR

revision of R5-160514

CGC Inc. 36.521-1 13.0.1 CR#24661 catF TEI8_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-160805 Correction to test case applicability for test case 9.2.1.3_C.1 and 9.2.1.4_C.1 CR

revision of R5-160515

CGC Inc. 36.521-1 13.0.1 CR#24671 catF TEI10_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-160881 Correction to test system uncertainties for Rx 7.6.3 CR

revision of R5-160564

revised to R5-161115

Anritsu Corporation 36.521-1 13.0.1 CR#24761 catF TEI8_Test Rel-13 R5-70

AI: 5.4.1.2.3

revised [WTS] [JSN]
R5-161048 Correction to TDD CQI Reporting for feICIC CR

revision of R5-160489

revised to R5-161112

Anritsu 36.521-1 13.0.1 CR#24581 catF TEI11_Test Rel-13 R5-70

AI: 5.4.1.2.3

revised [WTS] [JSN]
R5-161049 Correction to UL 64 QAM RMC CR

revision of R5-160492

revised to R5-161113

Anritsu, Huawei, HiSilicon 36.521-1 13.0.1 CR#24611 catF TEI12_Test Rel-13 R5-70

AI: 5.4.1.2.3

revised [WTS] [JSN]
R5-161050 Correction to CQI reports in CoMP fading test CR

revision of R5-160560

revised to R5-161114

Anritsu Corporation 36.521-1 13.0.1 CR#24751 catF TEI11_Test Rel-13 R5-70

AI: 5.4.1.2.3

revised [WTS] [JSN]
R5-161111 Correction to power level for dual layer TM9 demodulation tests CR

revision of R5-160135

ZTE Corporation 36.521-1 13.0.1 CR#23731 catF TEI11_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-161112 Correction to TDD CQI Reporting for feICIC CR

revision of R5-161048

Anritsu 36.521-1 13.0.1 CR#24582 catF TEI11_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-161113 Correction to UL 64 QAM RMC CR

revision of R5-161049

Anritsu, Huawei, HiSilicon 36.521-1 13.0.1 CR#24612 catF TEI12_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-161114 Correction to CQI reports in CoMP fading test CR

revision of R5-161050

Anritsu Corporation 36.521-1 13.0.1 CR#24752 catF TEI11_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]
R5-161115 Correction to test system uncertainties for Rx 7.6.3 CR

revision of R5-160881

Anritsu Corporation 36.521-1 13.0.1 CR#24762 catF TEI8_Test Rel-13 R5-70

AI: 5.4.1.2.3

agreed [WTS] [JSN]

39 documents (0.33225011825562 seconds)