Please enter the search related information in the fields below. Partial information works, e.g. "SP-21
" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501
" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP
" gives the same results as "3gpp
".
Download results in JSON format
tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
---|---|---|---|---|---|---|---|---|---|
R5-151117 | RF: Corrections to CSI RMCs references | CR | Rohde & Schwarz | 36.521-1 12.5.0 CR#1846 catF | TEI8_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151118 | CA RF: Cleanup of FDD 2DL CA tests | CR | Rohde & Schwarz | 36.521-1 12.5.0 CR#1847 catF | TEI10_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151119 | CA RF: Corrections to power imbalance test | CR | Rohde & Schwarz | 36.521-1 12.5.0 CR#1848 catF | TEI10_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151120 | CA RF: Corrections to sustained data rate test | CR | Rohde & Schwarz | 36.521-1 12.5.0 CR#1849 catF | TEI10_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151121 | ePDCCH RF: Corrections to sustained data rate test | CR | Rohde & Schwarz | 36.521-1 12.5.0 CR#1850 catF | TEI11_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151122 | feICIC RF: Updates to TC 9.2.1.6_E.1 | CR | Rohde & Schwarz | 36.521-1 12.5.0 CR#1851 catF | TEI11_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151123 | feICIC RF: Corrections to CSI TCs | CR | Rohde & Schwarz | 36.521-1 12.5.0 CR#1852 catF | TEI11_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151181 | CA RF: Corrections to the applicability clause | CR | ROHDE & SCHWARZ | 36.521-1 12.5.0 CR#1855 catF | TEI10_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151195 | Corrections to CSI Reference Measurement Channel | CR | ZTE | 36.521-1 12.5.0 CR#1857 catF | TEI12_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151196 | Corrections to Reference Measurement Channel | CR | ZTE | 36.521-1 12.5.0 CR#1858 catF | TEI12_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151231 | CoMP TCs applicability update section 8 | CR | Samsung, Rohde & Schwarz | 36.521-1 12.5.0 CR#1874 catF | TEI12_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151232 | CoMP TCs applicability update section 9 | CR | Samsung, Rohde & Schwarz | 36.521-1 12.5.0 CR#1875 catF | TEI12_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151237 | Update of CoMP TCs 9.2.4.1_F and 9.2.4.2_F | CR | Samsung | 36.521-1 12.5.0 CR#1876 catF | TEI12_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151238 | Update of CoMP TCs in sections 9.3.6.1_F and 9.3.6.2_F | CR | Samsung | 36.521-1 12.5.0 CR#1877 catF | TEI12_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151256 | Update of CoMP TCs in section 8 | CR | Samsung | 36.521-1 12.5.0 CR#1884 catF | TEI12_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151257 | Update of CoMP TCs 9.5.5.1_F.1 and 9.5.5.2_F.1 | CR | Samsung | 36.521-1 12.5.0 CR#1885 catF | TEI12_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151292 | Merge of TDD CQI Reporting under AWGN conditions – PUCCH 1-0 for CA cases | CR | China Mobile Com. Corporation | 36.521-1 12.5.0 CR#1893 catF | Rel-10 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] | |
R5-151293 | Updated test system uncertainties in annex F for merge TDD sustained data rate CA test cases | CR | China Mobile Com. Corporation | 36.521-1 12.5.0 CR#1894 catF | Rel-10 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] | |
R5-151295 | Merge of TDD sustained data rate CA test cases | CR | China Mobile Com. Corporation | 36.521-1 12.5.0 CR#1895 catF | Rel-10 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] | |
R5-151296 | Update Reference Channel and Minimum test time for TDD CA power imbalance demodulation test | CR | China Mobile Com. Corporation | 36.521-1 12.5.0 CR#1896 catF | Rel-10 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] | |
R5-151297 | Update TDD CA BW combination to power imbalance test | CR | China Mobile Com. Corporation | 36.521-1 12.5.0 CR#1897 catF | Rel-10 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] | |
R5-151354 | Correction of PHICH configuration | CR | Anritsu | 36.521-1 12.5.0 CR#1907 catF | TEI10_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151371 | Clean up of PDSCH performance test cases | CR | Anritsu | 36.521-1 12.5.0 CR#1916 catF | TEI8_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151372 | Correction to UE category in 8.7.2.1_1 | CR | Anritsu | 36.521-1 12.5.0 CR#1917 catF | TEI8_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151373 | Correction to CQI reference measurement channels | CR | Anritsu | 36.521-1 12.5.0 CR#1918 catF | TEI8_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151375 | Correction to test applicability in TDD CSI test:9.6.1.2_A.2 | CR | Anritsu | 36.521-1 12.5.0 CR#1920 catF | TEI8_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151376 | Addition of minimum test time for TDD CA inter band performance | CR | Anritsu | 36.521-1 12.5.0 CR#1921 catF | TEI8_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151385 | Clean up of eDL-MIMO test cases | CR | Anritsu | 36.521-1 12.5.0 CR#1924 catF | TEI10_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151386 | Clean up of TM9 interference model test cases | CR | Anritsu | 36.521-1 12.5.0 CR#1925 catF | TEI11_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151387 | Correction to eICIC performance test cases | CR | Anritsu | 36.521-1 12.5.0 CR#1926 catF | TEI10_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151388 | Correction to CQI and RI reporting test in feICIC | CR | Anritsu | 36.521-1 12.5.0 CR#1927 catF | TEI11_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151389 | Correction to PDSCH demodulation test in feICIC | CR | Anritsu | 36.521-1 12.5.0 CR#1928 catF | TEI11_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151390 | Clean up on PCFICH/PDCCH demodulation test in feICIC | CR | Anritsu | 36.521-1 12.5.0 CR#1929 catF | TEI11_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151391 | Clean up on PHICH demodulation test in feICIC | CR | Anritsu | 36.521-1 12.5.0 CR#1930 catF | TEI11_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151400 | Correction to test applicability in test case 8.7.2.1 | CR | CGC Inc. | 36.521-1 12.5.0 CR#1931 catF | Rel-9 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] | |
R5-151404 | Correction of PMI test cases in the section 9.4.1 and 9.4.2 | CR | CGC Inc. | 36.521-1 12.5.0 CR#1932 catF | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] | |
R5-151406 | Correction to test applicability in test cases 9.6.1.2_A.1 | CR | CGC Inc. | 36.521-1 12.5.0 CR#1933 catF | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] | |
R5-151407 | Correction to test applicability in test cases 9.6.1.2_A.3 | CR | CGC Inc. | 36.521-1 12.5.0 CR#1934 catF | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] | |
R5-151455 | Addition of CA capability, applicability changes and core spec updates to Section 8 36.521-1 TDD TM1 CA test cases | CR | QUALCOMM UK Ltd | 36.521-1 12.5.0 CR#1947 catF | TEI10_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151456 | Addition of CA capability, applicability changes and core spec updates to Section 8 36.521-1 TDD TM3 CA test cases | CR | QUALCOMM UK Ltd | 36.521-1 12.5.0 CR#1948 catF | TEI10_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151457 | Addition of CA capability, applicability changes and core spec updates to Section 8 36.521-1 TDD TM4 CA test cases | CR | QUALCOMM UK Ltd | 36.521-1 12.5.0 CR#1949 catF | TEI10_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151460 | Updates to 36.521-1 Annnex F and G | CR | QUALCOMM UK Ltd | 36.521-1 12.5.0 CR#1952 catF | TEI10_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151477 | Correction to 9.3.1.3.1_E.1 FDD CQI Reporting test | CR | Anritsu | 36.521-1 12.5.0 CR#1953 catF | TEI11_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151569 | Correction to the number of HARQ processes of CSI reference measurement channels | CR | LG Electronics Inc. | 36.521-1 12.5.0 CR#1964 catF | TEI12_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151571 | Removal of the correlation matrix of HST propagation conditions | CR | LG Electronics Inc. | 36.521-1 12.5.0 CR#1966 catF | TEI12_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151586 | Correction to message contents for 8.4.1.2.3_E.2 FDD PCFICH/PDCCH Transmit Diversity 2x2 for feICIC (MBSFN ABS) | CR | LG Electronics Inc. | 36.521-1 12.5.0 CR#1973 catF | TEI12_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151587 | Editorial correction to 8.2.1.1.1_A.1 and 8.2.1.3.1_A.1 | CR | LG Electronics Inc. | 36.521-1 12.5.0 CR#1974 catF | TEI12_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151590 | Clarification of the test applicability for feICIC | CR | LG Electronics Inc. | 36.521-1 12.5.0 CR#1975 catF | TEI12_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151591 | 36.521-1: CA Soft buffering corrections | CR | Keysight Technologies UK Ltd, Ericsson | 36.521-1 12.5.0 CR#1976 catF | TEI10_Test | Rel-10 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151621 | Updates to CoMP test cases 9.5.5.x | CR | QUALCOMM UK Ltd | 36.521-1 12.5.0 CR#1979 catF | TEI11_Test | Rel-12 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
R5-151646 | 36.521-1: DL Sustained Data Rate clarifications | CR | Keysight Technologies UK Ltd | 36.521-1 12.5.0 CR#1981 catF | TEI9_Test | Rel-9 |
R5-67 AI: 5.4.1.2.3 |
available | [WTS] [JSN] |
51 documents (0.3279721736908 seconds)