Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-151117 RF: Corrections to CSI RMCs references CR Rohde & Schwarz 36.521-1 12.5.0 CR#1846 catF TEI8_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151118 CA RF: Cleanup of FDD 2DL CA tests CR Rohde & Schwarz 36.521-1 12.5.0 CR#1847 catF TEI10_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151119 CA RF: Corrections to power imbalance test CR Rohde & Schwarz 36.521-1 12.5.0 CR#1848 catF TEI10_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151120 CA RF: Corrections to sustained data rate test CR Rohde & Schwarz 36.521-1 12.5.0 CR#1849 catF TEI10_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151121 ePDCCH RF: Corrections to sustained data rate test CR Rohde & Schwarz 36.521-1 12.5.0 CR#1850 catF TEI11_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151122 feICIC RF: Updates to TC 9.2.1.6_E.1 CR Rohde & Schwarz 36.521-1 12.5.0 CR#1851 catF TEI11_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151123 feICIC RF: Corrections to CSI TCs CR Rohde & Schwarz 36.521-1 12.5.0 CR#1852 catF TEI11_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151181 CA RF: Corrections to the applicability clause CR ROHDE & SCHWARZ 36.521-1 12.5.0 CR#1855 catF TEI10_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151195 Corrections to CSI Reference Measurement Channel CR ZTE 36.521-1 12.5.0 CR#1857 catF TEI12_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151196 Corrections to Reference Measurement Channel CR ZTE 36.521-1 12.5.0 CR#1858 catF TEI12_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151231 CoMP TCs applicability update section 8 CR Samsung, Rohde & Schwarz 36.521-1 12.5.0 CR#1874 catF TEI12_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151232 CoMP TCs applicability update section 9 CR Samsung, Rohde & Schwarz 36.521-1 12.5.0 CR#1875 catF TEI12_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151237 Update of CoMP TCs 9.2.4.1_F and 9.2.4.2_F CR Samsung 36.521-1 12.5.0 CR#1876 catF TEI12_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151238 Update of CoMP TCs in sections 9.3.6.1_F and 9.3.6.2_F CR Samsung 36.521-1 12.5.0 CR#1877 catF TEI12_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151256 Update of CoMP TCs in section 8 CR Samsung 36.521-1 12.5.0 CR#1884 catF TEI12_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151257 Update of CoMP TCs 9.5.5.1_F.1 and 9.5.5.2_F.1 CR Samsung 36.521-1 12.5.0 CR#1885 catF TEI12_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151292 Merge of TDD CQI Reporting under AWGN conditions – PUCCH 1-0 for CA cases CR China Mobile Com. Corporation 36.521-1 12.5.0 CR#1893 catF Rel-10 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151293 Updated test system uncertainties in annex F for merge TDD sustained data rate CA test cases CR China Mobile Com. Corporation 36.521-1 12.5.0 CR#1894 catF Rel-10 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151295 Merge of TDD sustained data rate CA test cases CR China Mobile Com. Corporation 36.521-1 12.5.0 CR#1895 catF Rel-10 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151296 Update Reference Channel and Minimum test time for TDD CA power imbalance demodulation test CR China Mobile Com. Corporation 36.521-1 12.5.0 CR#1896 catF Rel-10 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151297 Update TDD CA BW combination to power imbalance test CR China Mobile Com. Corporation 36.521-1 12.5.0 CR#1897 catF Rel-10 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151354 Correction of PHICH configuration CR Anritsu 36.521-1 12.5.0 CR#1907 catF TEI10_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151371 Clean up of PDSCH performance test cases CR Anritsu 36.521-1 12.5.0 CR#1916 catF TEI8_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151372 Correction to UE category in 8.7.2.1_1 CR Anritsu 36.521-1 12.5.0 CR#1917 catF TEI8_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151373 Correction to CQI reference measurement channels CR Anritsu 36.521-1 12.5.0 CR#1918 catF TEI8_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151375 Correction to test applicability in TDD CSI test:9.6.1.2_A.2 CR Anritsu 36.521-1 12.5.0 CR#1920 catF TEI8_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151376 Addition of minimum test time for TDD CA inter band performance CR Anritsu 36.521-1 12.5.0 CR#1921 catF TEI8_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151385 Clean up of eDL-MIMO test cases CR Anritsu 36.521-1 12.5.0 CR#1924 catF TEI10_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151386 Clean up of TM9 interference model test cases CR Anritsu 36.521-1 12.5.0 CR#1925 catF TEI11_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151387 Correction to eICIC performance test cases CR Anritsu 36.521-1 12.5.0 CR#1926 catF TEI10_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151388 Correction to CQI and RI reporting test in feICIC CR Anritsu 36.521-1 12.5.0 CR#1927 catF TEI11_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151389 Correction to PDSCH demodulation test in feICIC CR Anritsu 36.521-1 12.5.0 CR#1928 catF TEI11_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151390 Clean up on PCFICH/PDCCH demodulation test in feICIC CR Anritsu 36.521-1 12.5.0 CR#1929 catF TEI11_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151391 Clean up on PHICH demodulation test in feICIC CR Anritsu 36.521-1 12.5.0 CR#1930 catF TEI11_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151400 Correction to test applicability in test case 8.7.2.1 CR CGC Inc. 36.521-1 12.5.0 CR#1931 catF Rel-9 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151404 Correction of PMI test cases in the section 9.4.1 and 9.4.2 CR CGC Inc. 36.521-1 12.5.0 CR#1932 catF Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151406 Correction to test applicability in test cases 9.6.1.2_A.1 CR CGC Inc. 36.521-1 12.5.0 CR#1933 catF Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151407 Correction to test applicability in test cases 9.6.1.2_A.3 CR CGC Inc. 36.521-1 12.5.0 CR#1934 catF Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151455 Addition of CA capability, applicability changes and core spec updates to Section 8 36.521-1 TDD TM1 CA test cases CR QUALCOMM UK Ltd 36.521-1 12.5.0 CR#1947 catF TEI10_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151456 Addition of CA capability, applicability changes and core spec updates to Section 8 36.521-1 TDD TM3 CA test cases CR QUALCOMM UK Ltd 36.521-1 12.5.0 CR#1948 catF TEI10_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151457 Addition of CA capability, applicability changes and core spec updates to Section 8 36.521-1 TDD TM4 CA test cases CR QUALCOMM UK Ltd 36.521-1 12.5.0 CR#1949 catF TEI10_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151460 Updates to 36.521-1 Annnex F and G CR QUALCOMM UK Ltd 36.521-1 12.5.0 CR#1952 catF TEI10_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151477 Correction to 9.3.1.3.1_E.1 FDD CQI Reporting test CR Anritsu 36.521-1 12.5.0 CR#1953 catF TEI11_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151569 Correction to the number of HARQ processes of CSI reference measurement channels CR LG Electronics Inc. 36.521-1 12.5.0 CR#1964 catF TEI12_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151571 Removal of the correlation matrix of HST propagation conditions CR LG Electronics Inc. 36.521-1 12.5.0 CR#1966 catF TEI12_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151586 Correction to message contents for 8.4.1.2.3_E.2 FDD PCFICH/PDCCH Transmit Diversity 2x2 for feICIC (MBSFN ABS) CR LG Electronics Inc. 36.521-1 12.5.0 CR#1973 catF TEI12_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151587 Editorial correction to 8.2.1.1.1_A.1 and 8.2.1.3.1_A.1 CR LG Electronics Inc. 36.521-1 12.5.0 CR#1974 catF TEI12_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151590 Clarification of the test applicability for feICIC CR LG Electronics Inc. 36.521-1 12.5.0 CR#1975 catF TEI12_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151591 36.521-1: CA Soft buffering corrections CR Keysight Technologies UK Ltd, Ericsson 36.521-1 12.5.0 CR#1976 catF TEI10_Test Rel-10 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151621 Updates to CoMP test cases 9.5.5.x CR QUALCOMM UK Ltd 36.521-1 12.5.0 CR#1979 catF TEI11_Test Rel-12 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]
R5-151646 36.521-1: DL Sustained Data Rate clarifications CR Keysight Technologies UK Ltd 36.521-1 12.5.0 CR#1981 catF TEI9_Test Rel-9 R5-67

AI: 5.4.1.2.3

available [WTS] [JSN]

51 documents (0.3279721736908 seconds)