Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-182745 | Correction to test configuration tables in intra-band non-contiguous CA Rx test cases |
CR revised to R5-183749 |
Anritsu | 36.521-1 15.1.2 CR#4274 catF | TEI11_Test | Rel-15 |
R5-79 AI: 5.4.1.2.2 |
revised | [WTS] [JSN] |
| R5-182861 | Decreasing test frequency for NB-IoT test |
CR revised to R5-183750 |
Huawei, HiSilicon | 36.521-1 15.1.2 CR#4300 catF | TEI13_Test, NB_IOT-UEConTest | Rel-15 |
R5-79 AI: 5.4.1.2.2 |
revised | [WTS] [JSN] |
| R5-183010 | Alignment of test configuration tables for CA receiver test cases | CR | ROHDE & SCHWARZ | 36.521-1 15.1.2 CR#4325 catF | TEI12_Test, LTE_SC_enh_L1-UEConTest | Rel-15 |
R5-79 AI: 5.4.1.2.2 |
agreed | [WTS] [JSN] |
| R5-183749 | Correction to test configuration tables in intra-band non-contiguous CA Rx test cases |
CR revision of R5-182745 |
Anritsu | 36.521-1 15.1.2 CR#42741 catF | TEI11_Test | Rel-15 |
R5-79 AI: 5.4.1.2.2 |
agreed | [WTS] [JSN] |
| R5-183750 | Decreasing test frequency for NB-IoT test |
CR revision of R5-182861 |
Huawei, HiSilicon | 36.521-1 15.1.2 CR#43001 catF | TEI13_Test, NB_IOT-UEConTest | Rel-15 |
R5-79 AI: 5.4.1.2.2 |
agreed | [WTS] [JSN] |
5 documents (0.32572388648987 seconds)