Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
Download results in JSON format
| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-205546 | Incorrect test requirement for power class 5 in test case 6.2.5EA | CR | Ericsson | 36.521-1 16.6.0 CR#5217 catF | TEI13_Test | Rel-16 |
R5-89-e AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-205548 | Alignment with core specification of clause 9.8 in 36.521-1 | CR | Ericsson | 36.521-1 16.6.0 CR#5218 catF | TEI13_Test | Rel-16 |
R5-89-e AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-205549 | Editorial, wrong references in test case 6.3.5EC Power Control for UE category M2 | CR | Ericsson | 36.521-1 16.6.0 CR#5219 catF | TEI14_Test | Rel-16 |
R5-89-e AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-205688 | Update to test applicability of NB-IoT RF tests in clause 6 | CR | Bureau Veritas | 36.521-1 16.6.0 CR#5220 catF | TEI13_Test | Rel-16 |
R5-89-e AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-205848 | Correction of UL allocations for In-band emissions TC 6.5.2A.3.1 | CR | Anritsu | 36.521-1 16.6.0 CR#5228 catF | TEI10_Test | Rel-16 |
R5-89-e AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-205899 | Update of V2X MOP and MPR test cases | CR | Huawei, HiSilicon | 36.521-1 16.6.0 CR#5229 catF | TEI14_Test, LTE_V2X-UEConTest | Rel-16 |
R5-89-e AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-205901 | Alignment of V2X A-MPR, A-SEM and A-SE | CR | Huawei, HiSilicon | 36.521-1 16.6.0 CR#5230 catF | TEI14_Test, LTE_V2X-UEConTest | Rel-16 |
R5-89-e AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-205902 | Cleanning up of V2X test configurations | CR | Huawei, HiSilicon | 36.521-1 16.6.0 CR#5231 catF | TEI14_Test, LTE_V2X-UEConTest | Rel-16 |
R5-89-e AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-205903 | Clarification of V2X spurious emission measurement method | CR | Huawei, HiSilicon | 36.521-1 16.6.0 CR#5232 catF | TEI14_Test, LTE_V2X-UEConTest | Rel-16 |
R5-89-e AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
9 documents (0.34348011016846 seconds)