Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-186580 | Update NB-IOT Spurious Emission UE co-existence | CR | Huawei, HiSilicon | 36.521-1 15.3.1 CR#4528 catF | TEI13_Test | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-186806 | Alignment of 256QAM EVM Test Tolerance between LTE and NR | CR | Intel Deutschland GmbH | 36.521-1 15.3.1 CR#4539 catF | TEI14_Test | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-187004 | Update 6.2.4G.1 the V2V AMPR test case to remove brackets and add Power Class 2 | CR | Huawei, HiSilicon | 36.521-1 15.3.1 CR#4540 catF | TEI14_Test, LTE_SL_V2V-UEConTest | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-187054 | Editorial correction to 6.6.3.1A.2 Transmitter Spurious emissions for CA | CR | Anritsu | 36.521-1 15.3.1 CR#4546 catF | TEI11_Test, LTE_CA_Rel12_2UL-UEConTest | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-187055 | Editorial correction to 6.5.1A.2 Frequency error for CA | CR | Anritsu, Dekra | 36.521-1 15.3.1 CR#4547 catF | TEI11_Test, LTE_CA_Rel12_2UL-UEConTest | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-187056 | Correction to 6.2.5A.3 Configured UE transmitted Output Power for CA | CR | Anritsu | 36.521-1 15.3.1 CR#4548 catF | TEI11_Test, LTE_CA_Rel12_2UL-UEConTest | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-187068 | Correction to 6.6.3.3A.2 Additional spurious emissions for CA | CR | Anritsu | 36.521-1 15.3.1 CR#4554 catF | TEI11_Test, LTE_CA_Rel12_2UL-UEConTest | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-187069 | Correction to 6.2.4A.2 Additional Maximum Power Reduction (A-MPR) for CA | CR | Anritsu | 36.521-1 15.3.1 CR#4555 catF | TEI11_Test, LTE_CA_Rel12_2UL-UEConTest | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-187070 | Correction to 6.2.4A.2_1 and 6.6.2.2A.2_1 | CR | Anritsu, CETECOM, DEKRA | 36.521-1 15.3.1 CR#4556 catF | TEI11_Test, LTE_CA_Rel12_2UL-UEConTest | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-187071 | Editorial correction to 6.6.2.2A.2 Additional Spectrum Emission Mask for CA | CR | Anritsu | 36.521-1 15.3.1 CR#4557 catF | TEI11_Test, LTE_CA_Rel12_2UL-UEConTest | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-187073 | Correction to the MU for UL CA | CR | Anritsu | 36.521-1 15.3.1 CR#4559 catF | TEI11_Test, LTE_CA_Rel12_2UL-UEConTest | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-187343 | Correction of applicability statement in TC 6.2.4A.1 | CR | CETECOM GmbH | 36.521-1 15.3.1 CR#4616 catF | LTE_UL64QAM-UEConTest, TEI13_Test | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-187346 | Correction of applicability in TC 6.6.2.2A.2 and TC.6.6.3.3A.2 | CR | CETECOM GmbH | 36.521-1 15.3.1 CR#4619 catF | TEI13_Test | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-187347 | Correction for test procedure step 4 in TC 6.6.3.3A.1 | CR | CETECOM GmbH | 36.521-1 15.3.1 CR#4620 catF | TEI10_Test | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-187348 | Correction for test procedure in TC 6.6.3.3A.2 | CR | CETECOM GmbH | 36.521-1 15.3.1 CR#4621 catF | TEI11_Test | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
withdrawn | [WTS] [JSN] |
| R5-187349 | Correction for test procedure in TC 6.6.3.3A.1_1 | CR | CETECOM GmbH | 36.521-1 15.3.1 CR#4622 catF | LTE_UL64QAM-UEConTest, TEI13_Test | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-187350 | Correction for test procedure in TC 6.6.3.3A.2_1 | CR | CETECOM GmbH | 36.521-1 15.3.1 CR#4623 catF | TEI13_Test | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-187488 | Updating test case 6.6.2.2 Additional spectrum emission mask and test case 6.6.3.3 Additional spurious emission | CR | Intel Corporation (UK) Ltd | 36.521-1 15.3.1 CR#4634 catF | TEI14_Test | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-187493 | Updating test case 6.2.4A.2 Additional Maximum Power Reduction (A-MPR) for CA (inter-band DL CA and UL CA) | CR | Intel Corporation (UK) Ltd | 36.521-1 15.3.1 CR#4635 catF | TEI12_Test | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-187916 | Editorial correction to 6.5.1A.2 Frequency error for CA | CR | Anritsu, Dekra | 36.521-1 15.3.1 CR#45471 catF | TEI11_Test, LTE_CA_Rel12_2UL-UEConTest | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-187917 | Correction to 6.2.4A.2_1 and 6.6.2.2A.2_1 | CR | Anritsu, CETECOM, DEKRA | 36.521-1 15.3.1 CR#45561 catF | TEI11_Test, LTE_CA_Rel12_2UL-UEConTest | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-187980 | Updating test case 6.2.4A.2 Additional Maximum Power Reduction (A-MPR) for CA (inter-band DL CA and UL CA) | CR | Intel Corporation (UK) Ltd | 36.521-1 15.3.1 CR#46351 catF | TEI12_Test | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-187991 | Alignment of 256QAM EVM Test Tolerance between LTE and NR | CR | Intel Deutschland GmbH | 36.521-1 15.3.1 CR#45391 catF | TEI14_Test | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-187992 | Updating test case 6.6.2.2 Additional spectrum emission mask and test case 6.6.3.3 Additional spurious emission | CR | Intel Corporation (UK) Ltd | 36.521-1 15.3.1 CR#46341 catF | TEI14_Test | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-188051 | Correction to the MU for UL CA | CR | Anritsu | 36.521-1 15.3.1 CR#45591 catF | TEI11_Test, LTE_CA_Rel12_2UL-UEConTest | Rel-15 |
R5-81 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
25 documents (0.34465312957764 seconds)