Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-160164 | Corrections to EVM test case 6.5.2A.1.1 | CR | CATR | 36.521-1 13.0.1 CR#2386 catF | TEI10_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-160362 | Test configuration correction for AMPR tests |
CR revised to R5-161041 |
CMCC | 36.521-1 13.0.1 CR#2433 catF | TEI8_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-160364 | Test configuration correction for ASE tests |
CR revised to R5-161042 |
CMCC | 36.521-1 13.0.1 CR#2434 catF | TEI8_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-160365 | Test configuration correction for ASEM tests |
CR revised to R5-161043 |
CMCC | 36.521-1 13.0.1 CR#2435 catF | TEI8_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-160370 | Rel-10 Test point reduction for UL 64QAM multi-cluster MPR and ACLR tests |
CR revised to R5-160825 |
CMCC | 36.521-1 13.0.1 CR#2436 catF | TEI10_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-160377 | R10 Remove editor's note for CA_39C spurious emission test | CR | CMCC | 36.521-1 13.0.1 CR#2437 catF | TEI10_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-160440 | Test configuration correction for UL 64QAM AMPR tests |
CR revised to R5-161044 |
CMCC | 36.521-1 13.0.1 CR#2438 catF | LTE_UL64QAM-UEConTest | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-160457 | Test configuration correction for UL 64QAM ASE tests |
CR revised to R5-161045 |
CMCC | 36.521-1 13.0.1 CR#2441 catF | LTE_UL64QAM-UEConTest | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-160458 | Test configuration correction for UL 64QAM ASEM tests |
CR revised to R5-161046 |
CMCC | 36.521-1 13.0.1 CR#2442 catF | LTE_UL64QAM-UEConTest | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-160459 | Rel-13 Test point reduction for UL 64QAM multi-cluster MPR and ACLR tests | CR | CMCC | 36.521-1 13.0.1 CR#2443 catF | LTE_UL64QAM-UEConTest, TEI13_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-160460 | Rel-8 Test point reduction for UL 64QAM AMPR, ASEM and ASE tests |
CR revised to R5-161047 |
CMCC | 36.521-1 13.0.1 CR#2444 catF | TEI8_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-160461 | Rel-13 Test point reduction for UL 64QAM AMPR and ASEM tests | CR | CMCC | 36.521-1 13.0.1 CR#2445 catF | LTE_UL64QAM-UEConTest, TEI13_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-160462 | Rel-13 Test point reduction for UL 64QAM CA MPR and ACLR tests | CR | CMCC | 36.521-1 13.0.1 CR#2446 catF | LTE_UL64QAM-UEConTest, TEI13_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-160463 | Rel-10 Test point reduction for UL 64QAM CA AMPR, ASEM and ASE tests |
CR revised to R5-161061 |
CMCC | 36.521-1 13.0.1 CR#2447 catF | TEI10_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-160464 | Rel-13 Test point reduction for UL 64QAM CA AMPR, ASEM and ASE tests | CR | CMCC | 36.521-1 13.0.1 CR#2448 catF | LTE_UL64QAM-UEConTest, TEI13_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-160483 | Correction to UL CA Tx tests | CR | Anritsu | 36.521-1 13.0.1 CR#2452 catF | TEI10_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-160548 | Correction to the UL CA Frequency Erorr Testcase |
CR revised to R5-161062 |
Intel Corporation (UK) Ltd | 36.521-1 13.0.1 CR#2472 catF | TEI10_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-160549 | Correction to the UL CA Testcases – Removal of references to Annex A.3 | CR | Intel Corporation (UK) Ltd | 36.521-1 13.0.1 CR#2473 catF | TEI10_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
withdrawn | [WTS] [JSN] |
| R5-160550 | Addition of expected power disctribution in UL CA testcases. | CR | Intel Corporation (UK) Ltd | 36.521-1 13.0.1 CR#2474 catF | TEI10_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
withdrawn | [WTS] [JSN] |
| R5-160581 | Minor correction to TC 6.6.3.2 |
CR revised to R5-160802 |
Rohde & Schwarz | 36.521-1 13.0.1 CR#2483 catF | TEI8_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-160582 | CA RF: Corrections to Notes in TC 7.3A.3 | CR | Rohde & Schwarz | 36.521-1 13.0.1 CR#2484 catF | TEI10_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-160585 | Removal of editor’s notes in TC 6.5.2A.2.1 & 6.5.2A.3.1 |
CR revised to R5-160803 |
Rohde & Schwarz | 36.521-1 13.0.1 CR#2487 catF | TEI10_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-160689 | A-SEM test with frequency hopping | CR | Ericsson | 36.521-1 13.0.1 CR#2521 catF | TEI8_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
withdrawn | [WTS] [JSN] |
| R5-160690 | Correction to A-MPR test with frequency hopping |
CR revised to R5-161064 |
Ericsson | 36.521-1 13.0.1 CR#2522 catF | TEI8_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-160697 | Introduction of Spectrum emissions test cases with PUSCH frequency hopping |
CR revised to R5-161063 |
Ericsson | 36.521-1 13.0.1 CR#2523 catF | TEI8_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
revised | [WTS] [JSN] |
| R5-160802 | Minor correction to TC 6.6.3.2 |
CR revision of R5-160581 |
Rohde & Schwarz | 36.521-1 13.0.1 CR#24831 catF | TEI8_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-160803 | Removal of editor’s notes in TC 6.5.2A.2.1 & 6.5.2A.3.1 |
CR revision of R5-160585 |
Rohde & Schwarz | 36.521-1 13.0.1 CR#24871 catF | TEI10_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-160825 | Rel-10 Test point reduction for UL 64QAM multi-cluster MPR and ACLR tests |
CR revision of R5-160370 |
CMCC | 36.521-1 13.0.1 CR#24361 catF | TEI10_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-161041 | Test configuration correction for AMPR tests |
CR revision of R5-160362 |
CMCC | 36.521-1 13.0.1 CR#24331 catF | TEI8_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-161042 | Test configuration correction for ASE tests |
CR revision of R5-160364 |
CMCC | 36.521-1 13.0.1 CR#24341 catF | TEI8_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-161043 | Test configuration correction for ASEM tests |
CR revision of R5-160365 |
CMCC | 36.521-1 13.0.1 CR#24351 catF | TEI8_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-161044 | Test configuration correction for UL 64QAM AMPR tests |
CR revision of R5-160440 |
CMCC | 36.521-1 13.0.1 CR#24381 catF | TEI13_Test, LTE_UL64QAM-UEConTest | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-161045 | Test configuration correction for UL 64QAM ASE tests |
CR revision of R5-160457 |
CMCC | 36.521-1 13.0.1 CR#24411 catF | TEI13_Test, LTE_UL64QAM-UEConTest | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-161046 | Test configuration correction for UL 64QAM ASEM tests |
CR revision of R5-160458 |
CMCC | 36.521-1 13.0.1 CR#24421 catF | TEI13_Test, LTE_UL64QAM-UEConTest | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-161047 | Rel-8 Test point reduction for UL 64QAM AMPR, ASEM and ASE tests |
CR revision of R5-160460 |
CMCC | 36.521-1 13.0.1 CR#24441 catF | TEI8_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-161061 | Rel-10 Test point reduction for UL 64QAM CA AMPR, ASEM and ASE tests |
CR revision of R5-160463 |
CMCC | 36.521-1 13.0.1 CR#24471 catF | TEI10_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-161062 | Correction to the UL CA Frequency Erorr Testcase |
CR revision of R5-160548 |
Intel Corporation (UK) Ltd | 36.521-1 13.0.1 CR#24721 catF | TEI10_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
| R5-161063 | Introduction of Spectrum emissions test cases with PUSCH frequency hopping |
CR revision of R5-160697 |
Ericsson | 36.521-1 13.0.1 CR#25231 catF | TEI8_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
not pursued | [WTS] [JSN] |
| R5-161064 | Correction to A-MPR test with frequency hopping |
CR revision of R5-160690 |
Ericsson | 36.521-1 13.0.1 CR#25221 catF | TEI8_Test | Rel-13 |
R5-70 AI: 5.4.1.2.1 |
agreed | [WTS] [JSN] |
39 documents (0.33160901069641 seconds)