Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-232337 | Addition of test frequencies for new 3CC EN-DC comb within FR2 | CR | KDDI Corporation | 38.508-1 17.8.0 CR#2756 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-99 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-232359 | Correction of test frequency parameters for n79 |
CR revised to R5-233699 |
Keysight Technologies UK Ltd, Huawei,Hisilicon | 38.508-1 17.8.0 CR#2759 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-99 AI: 5.4.1.1 |
revised | [WTS] [JSN] |
| R5-232441 | Introduction of test channel bandwidths for new NR band n13 | CR | Nokia, Nokia Shanghai Bell | 38.508-1 17.8.0 CR#2762 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-99 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-232442 | Introduction of test frequencies for new NR band n13 | CR | Nokia, Nokia Shanghai Bell | 38.508-1 17.8.0 CR#2763 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-99 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-233096 | Updating lowest testing channel bandwidth for n79 | CR | Huawei, HiSilicon | 38.508-1 17.8.0 CR#2800 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-99 AI: 5.4.1.1 |
withdrawn | [WTS] [JSN] |
| R5-233097 | Updating n79 test frequencies for 10MHz channel bandwidth | CR | Huawei, HiSilicon | 38.508-1 17.8.0 CR#2801 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-99 AI: 5.4.1.1 |
withdrawn | [WTS] [JSN] |
| R5-233099 | Updating test frequency for n79 10MHz CBW with 30kHz SCS | CR | Huawei, HiSilicon | 38.508-1 17.8.0 CR#2803 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-99 AI: 5.4.1.1 |
withdrawn | [WTS] [JSN] |
| R5-233699 | Correction of test frequency parameters for n79 |
CR revision of R5-232359 |
Keysight Technologies UK Ltd, Huawei,Hisilicon | 38.508-1 17.8.0 CR#27591 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-99 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
8 documents (0.32003211975098 seconds)