Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
Download results in JSON format
| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-253776 | Editorial corrections to the EN in clause 4.3.1.1.3 | CR | MediaTek Inc. | 38.508-1 19.0.0 CR#3519 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-253789 | Addition of test frequencies for R15 EN-DC combos within FR1 | CR | KDDI Corporation | 38.508-1 19.0.0 CR#3521 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-253961 | Correction of test frequencies for Band n254 | CR | China Telecom | 38.508-1 19.0.0 CR#3525 catF | TEI18_Test | Rel-19 |
R5-108 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-254207 | Modification of the references for the RRM FR2 intra-band contiguous tables in Annex E | CR | Keysight Technologies UK Ltd | 38.508-1 19.0.0 CR#3542 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-19 |
R5-108 AI: 5.4.1.1 |
withdrawn | [WTS] [JSN] |
| R5-254314 | Updates on test freq for R15 EN-DC configuration with more than three bands | CR | ZTE Corporation | 38.508-1 19.0.0 CR#3554 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-254326 | Addition of test freq for EN-DC configuration DC_1A-41A_n78A | CR | ZTE Corporation | 38.508-1 19.0.0 CR#3555 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-254373 | Correction of test frequencies for Band n99 | CR | ROHDE & SCHWARZ | 38.508-1 19.0.0 CR#3557 catF | TEI17_Test | Rel-19 |
R5-108 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-254374 | Correction of test frequencies for Band n29 | CR | ROHDE & SCHWARZ | 38.508-1 19.0.0 CR#3558 catF | TEI16_Test | Rel-19 |
R5-108 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-254375 | Correction of test frequencies for Band n75 and n76 | CR | ROHDE & SCHWARZ | 38.508-1 19.0.0 CR#3559 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-254736 | Definition of UL Mid CBW for n8 | CR | Anritsu | 38.508-1 19.0.0 CR#3589 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-254737 | Correction to test frequencies of n105 | CR | Anritsu | 38.508-1 19.0.0 CR#3590 catF | TEI18_Test | Rel-19 |
R5-108 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-254793 | Adding test frequencies for several EN-DC configurations including band n40 | CR | Huawei, HiSilicon | 38.508-1 19.0.0 CR#3593 catF | TEI15_Test | Rel-19 |
R5-108 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
12 documents (0.38577318191528 seconds)