Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-236333 | n70 frequencies - Typo correction in offset to carrier | CR | Keysight Technologies UK Ltd | 38.508-1 18.0.0 CR#2938 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-236342 | Defined frequencies for n7 and certain Release 16 CBWs |
CR revised to R5-237939 |
Keysight Technologies UK Ltd, Rohde&Schwarz | 38.508-1 18.0.0 CR#2939 catF | TEI16_Test, NR_bands_BW_R16-UEConTest | Rel-18 |
R5-101 AI: 5.4.1.1 |
revised | [WTS] [JSN] |
| R5-236346 | Test frequency corrections for n66 | CR | Keysight Technologies UK Ltd, Anritsu | 38.508-1 18.0.0 CR#2940 catF | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-18 |
R5-101 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-236483 | Simplification of tables for test freqs for CA_n48(2A) | CR | Ericsson | 38.508-1 18.0.0 CR#2951 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-236484 | Correction of table for test freqs for n48 | CR | Ericsson | 38.508-1 18.0.0 CR#2952 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.1.1 |
withdrawn | [WTS] [JSN] |
| R5-236485 | Correction of table for test freqs for n78 | CR | Ericsson | 38.508-1 18.0.0 CR#2953 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.1.1 |
withdrawn | [WTS] [JSN] |
| R5-236486 | Correction of table for test freqs for n79 | CR | Ericsson | 38.508-1 18.0.0 CR#2954 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.1.1 |
withdrawn | [WTS] [JSN] |
| R5-236490 | Correction of Test freqs for n77 | CR | Ericsson | 38.508-1 18.0.0 CR#2958 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.1.1 |
withdrawn | [WTS] [JSN] |
| R5-236492 | Editorial change of format for Header of clause 4.3.1.2.3.2 | CR | Ericsson | 38.508-1 18.0.0 CR#2960 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-236800 | Correction to FR1 Mid CBW selection | CR | Anritsu, Eurofins KCTL | 38.508-1 18.0.0 CR#2972 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.1.1 |
withdrawn | [WTS] [JSN] |
| R5-236863 | Update of test frequencies for band n7 | CR | ROHDE & SCHWARZ | 38.508-1 18.0.0 CR#2979 catF | NR_bands_BW_R16-UEConTest, TEI16_Test | Rel-18 |
R5-101 AI: 5.4.1.1 |
withdrawn | [WTS] [JSN] |
| R5-236940 | Removal of mid test channel bandwidth for n18 to 4.3.1.0A | CR | ZTE Corporation | 38.508-1 18.0.0 CR#2985 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-237073 | Updating test frequency for band n30 | CR | Huawei, HiSilicon | 38.508-1 18.0.0 CR#2990 catF | TEI16_Test, NR_bands_BW_R16-UEConTest | Rel-18 |
R5-101 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-237266 | Update to Note 1 and Note 1a of Table 4.3.1.0A-1: Mid Test Channel bandwidths |
CR revised to R5-237943 |
Samsung R&D Institute UK | 38.508-1 17.10.0 CR#2996 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-17 |
R5-101 AI: 5.4.1.1 |
revised | [WTS] [JSN] |
| R5-237472 | Update to Note 1 and Note 1a of Table 4.3.1.0A-1: Mid Test Channel bandwidths | CR | Samsung R&D Institute UK | 36.521-3 18.2.0 CR#29962 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.1.1 |
rejected | [WTS] [JSN] |
| R5-237939 | Defined frequencies for n7 and certain Release 16 CBWs |
CR revision of R5-236342 |
Keysight Technologies UK Ltd, Rohde&Schwarz | 38.508-1 18.0.0 CR#29391 catF | TEI16_Test, NR_bands_BW_R16-UEConTest | Rel-18 |
R5-101 AI: 5.4.1.1 |
agreed | [WTS] [JSN] |
| R5-237943 | Update to Note 1 and Note 1a of Table 4.3.1.0A-1: Mid Test Channel bandwidths |
CR revision of R5-237266 |
Samsung R&D Institute UK | 38.508-1 18.0.0 CR#29961 catF | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-101 AI: 5.4.1.1 |
revised | [WTS] [JSN] |
17 documents (0.33420491218567 seconds)