Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-244167 | Discussion on MU and TT analysis for FR2c and FR2b | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-104 AI: 5.4. |
noted | [WTS] [JSN] | |
| R5-244347 | Discussion on CQI report limitation with Table 4 | discussion | Mediatek India Technology Pvt. | TEI17_Test, NR_DL1024QAM_FR1-UEConTest |
R5-104 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-244441 | SE QoQZ MU for 40cm QZ Size | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-104 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-244448 | PC6 MUs based on antenna array assumptions | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-104 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-244758 | FR2 RRM test cases: Known Issue List |
discussion revised to R5-245913 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-104 AI: 5.4. |
revised | [WTS] [JSN] | ||
| R5-244798 | MU discussion on FR2c | discussion | Anritsu | TEI16_Test, NR_bands_BW_R16-UEConTest |
R5-104 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-244802 | Testability analysis on Transmit OFF power for FR2b | discussion | Anritsu | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-104 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-244804 | MU discussion on FR2d | discussion | Anritsu | TEI17_Test, NR_lic_bands_BW_R17-UEConTest |
R5-104 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-244806 | MU discussion on EVM for FR2 PC5 |
discussion revised to R5-245922 |
Anritsu | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-104 AI: 5.4. |
revised | [WTS] [JSN] | ||
| R5-244807 | QoQZ for Spurious test cases for QZ size 40 cm | discussion | Anritsu | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-104 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-244809 | Testability analysis on UL power setting in FR2 Random Access | discussion | Anritsu | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-104 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-244893 | On the MU for n259 | discussion | ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-104 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-244895 | On the MU and TT for MIMO test cases | discussion | ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-104 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-245145 | Discussion on reference sensitivity for inter-band EN-DC |
discussion revised to R5-246013 |
Huawei, HiSilicon | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-104 AI: 5.4. |
revised | [WTS] [JSN] | ||
| R5-245251 | On the MU for RRM FR2 PC1 | discussion | ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-104 AI: 5.4. |
noted | [WTS] [JSN] | |
| R5-245913 | FR2 RRM test cases: Known Issue List |
discussion revision of R5-244758 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-104 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-245922 | MU discussion on EVM for FR2 PC5 |
discussion revision of R5-244806 |
Anritsu | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-104 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-246013 | Discussion on reference sensitivity for inter-band EN-DC |
discussion revision of R5-245145 |
Huawei, HiSilicon | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-104 AI: 5.4. |
noted | [WTS] [JSN] |
18 documents (0.3904230594635 seconds)