Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-240257 | Discussion on UE channel bandwidths capabilities | discussion | CAICT | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | |
| R5-240259 | Discussion on removal of LTE anchor agnostic approach testing in 6.5B.3.3.2 of 38.521-3 | discussion | CAICT | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | |
| R5-240306 | Discussion on updating FR1 Inter-band 2UL CA AMPR test case | discussion | Huawei, Hisilicon | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-240311 | Discussion on FR1 REFSENS exceptions test requirements for CA | discussion | Huawei, Hisilicon | TEI17_Test, NR_PC2_CA_R17_2BDL_2BUL-UEConTest |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-240401 | Discussion on MU and TT analysis for FR2c | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | |
| R5-240408 | Discussion on ACS and IBB testing | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | |
| R5-240467 | Bands n25 and n71 asymmetric UL/DL REFSENS | discussion | Nokia, T-Mobile USA, Keysight Technologies, Skyworks Solutions, Inc. | NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | |
| R5-240523 | Test frequencies for asymmetric UL/DL CBW | discussion | Nokia, T-Mobile USA, Keysight Technologies, Skyworks Solutions, Inc. | NR_lic_bands_BW_R17-UEConTest | Rel-17 |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | |
| R5-240595 | On Alternate EIS Search Procedure with Interpolation | discussion | Keysight Technologies UK Ltd | TEI17_Test, NR_FR1_TRP_TRS-UEConTest |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-240601 | On Re-Positioning Concept for FR2 RRM TCs | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-240603 | On Coarse&Fine Beam Peak Search Grids | discussion | Keysight Technologies UK Ltd, CAICT | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-240605 | On 30cm QoQZ MU Topics | discussion | Keysight Technologies UK Ltd | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-240618 | Further discussion on FR1 EVM testing in shorter transient period | discussion | Keysight Technologies UK Ltd | TEI16_Test | Rel-18 |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | |
| R5-240786 | FR2 RRM test cases: Known Issue List |
discussion revised to R5-241867 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-102 AI: 5.4. |
revised | [WTS] [JSN] | ||
| R5-240970 | Test frequencies calculation review for asymmetric channel bandwidths | discussion | Keysight Technologies UK Ltd, Nokia, Skyworks Solutions Inc., T-Mobile USA | TEI17_Test, NR_lic_bands_BW_R17-UEConTest | Rel-18 |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | |
| R5-241051 | On TRP test result variations adopting reduced grids | discussion | Apple (UK) Limited | Rel-17 |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-241078 | On the QoQZ MU for n262 and TRP | discussion | ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-241083 | MU discussion on FR2c |
discussion revised to R5-241858 |
Anritsu | TEI16_Test, NR_bands_BW_R16-UEConTest |
R5-102 AI: 5.4. |
revised | [WTS] [JSN] | ||
| R5-241087 | QoQZ up to FR2d | discussion | Anritsu | TEI17_Test, NR_lic_bands_BW_R17-UEConTest |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-241088 | MU discussion on FR1 EVM including symbols with transient period | discussion | Anritsu | TEI16_Test |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-241205 | EIS search interpolation methods | discussion | ROHDE & SCHWARZ | TEI17_Test, NR_FR1_TRP_TRS-UEConTest |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-241307 | Status on Test Selection Criteria for 38.522 | discussion | Qualcomm Germany | TEI15_Test, 5GS_NR_LTE-UEConTest | Rel-18 |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | |
| R5-241344 | On the MU for n259 | discussion | ROHDE & SCHWARZ | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-241356 | On the MU for FR1 EVM including symbols with transient period | discussion | ROHDE & SCHWARZ | TEI16_Test |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-241415 | On Coarse Measurement Grids | discussion | Keysight Technologies UK Ltd | TEI17_Test, NR_FR1_TRP_TRS-UEConTest | Rel-17 |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | |
| R5-241423 | Views on FR1 TRP TRS TT |
discussion revised to R5-241930 |
Apple Benelux B.V. | TEI17_Test, NR_FR1_TRP_TRS-UEConTest | Rel-17 |
R5-102 AI: 5.4. |
revised | [WTS] [JSN] | |
| R5-241424 | Empirical data inputs on coarse grids | discussion | Apple Benelux B.V. | TEI17_Test, NR_FR1_TRP_TRS-UEConTest | Rel-17 |
R5-102 AI: 5.4. |
withdrawn | [WTS] [JSN] | |
| R5-241426 | On Rel17 TRP TRS status updates | discussion | Apple Benelux B.V. | TEI17_Test, NR_FR1_TRP_TRS-UEConTest | Rel-17 |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | |
| R5-241427 | Maintainence Work Plan for Rel17 TRP TRS |
Work Plan revised to R5-241933 |
Apple Benelux B.V. | TEI17_Test, NR_FR1_TRP_TRS-UEConTest | Rel-17 |
R5-102 AI: 5.4. |
revised | [WTS] [JSN] | |
| R5-241445 | Views on FR1 EVM test with transients | discussion | Apple Trading | TEI16_Test | Rel-18 |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | |
| R5-241858 | MU discussion on FR2c |
discussion revision of R5-241083 |
Anritsu | TEI16_Test, NR_bands_BW_R16-UEConTest |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-241867 | FR2 RRM test cases: Known Issue List |
discussion revision of R5-240786 |
Ericsson | TEI15_Test, 5GS_NR_LTE-UEConTest |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | ||
| R5-241930 | Views on FR1 TRP TRS TT |
discussion revision of R5-241423 |
Apple Benelux B.V. | TEI17_Test, NR_FR1_TRP_TRS-UEConTest | Rel-17 |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] | |
| R5-241933 | Maintainence Work Plan for Rel17 TRP TRS |
Work Plan revision of R5-241427 |
Apple Benelux B.V. | TEI17_Test, NR_FR1_TRP_TRS-UEConTest | Rel-17 |
R5-102 AI: 5.4. |
noted | [WTS] [JSN] |
34 documents (0.33430290222168 seconds)