Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-186663 | Updates to test case 6.5B.2.1.3, Adjacent channel leakage ratio for intra-band contiguous EN-DC | CR | Ericsson | 38.521-3 15.0.0 CR#43 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-186708 | Adding test case 6.2B.2.4, UE Maximum Output Power reduction for Inter-Band EN-DC including FR2 | CR | Ericsson | 38.521-3 15.0.0 CR#48 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-186899 | Addition OBW intra-band contiguous EN-DC | CR | Keysight Technologies UK Ltd | 38.521-3 15.0.0 CR#50 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-186900 | Addition SEM intra-band contiguous EN-DC | CR | Keysight Technologies UK Ltd | 38.521-3 15.0.0 CR#51 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-186906 | Addition OBW intraband non contiguous EN-DC | CR | Keysight Technologies UK Ltd | 38.521-3 15.0.0 CR#52 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-186907 | Update general parameter Connection without release in initial conditions in TS 38.521-3 | CR | Keysight Technologies UK Ltd | 38.521-3 15.0.0 CR#53 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187084 | Introduction of New test case 6.4B.2.2.1 Error Vector Magnitude for intra-band non-contiguous EN-DC | CR | KTL | 38.521-3 15.0.0 CR#55 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187085 | Introduction of New test case 6.4B.2.2.2 Carrier Leakage for intra-band non-contiguous EN-DC | CR | KTL | 38.521-3 15.0.0 CR#56 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187087 | Introduction of New test case 6.4B.2.2.3 In-band Emissions for intra-band non-contiguous EN-DC | CR | KTL | 38.521-3 15.0.0 CR#57 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187088 | Introduction of New test case 6.4B.2.3.1 Error Vector Magnitude for inter-band EN-DC within FR1 | CR | KTL | 38.521-3 15.0.0 CR#58 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187089 | Introduction of New test case 6.4B.2.3.2 Carrier Leakage for inter-band EN-DC within FR1 | CR | KTL, MTCC | 38.521-3 15.0.0 CR#59 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187090 | Introduction of New test case 6.4B.2.3.3 In-band Emissions for inter-band EN-DC within FR1 | CR | KTL, MTCC | 38.521-3 15.0.0 CR#60 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187312 | Additonal Spurious Emissions for Intra-band contiguous EN-DC | CR | Qualcomm Incorporated | 38.521-3 15.0.0 CR#64 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187313 | Additonal Spurious Emissions for Intra-band non-contiguous EN-DC | CR | Qualcomm Incorporated | 38.521-3 15.0.0 CR#65 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187317 | Additonal Spurious emission for inter-band EN-DC | CR | Qualcomm Incorporated | 38.521-3 15.0.0 CR#66 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187361 | Introduction of Error Vector Magnitude for intra-band contiguous EN-DC | CR | LG Electronics | 38.521-3 15.0.0 CR#70 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187362 | Introduction of Carrier Leakage for intra-band contiguous EN-DC | CR | LG Electronics | 38.521-3 15.0.0 CR#71 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187366 | Introduction of In-band Emissions for intra-band contiguous EN-DC | CR | LG Electronics | 38.521-3 15.0.0 CR#72 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187368 | Addition of TC6.3B.3.1 Tx ON/OFF time mask for intra-band contiguous EN-DC | CR | SGS Wireless | 38.521-3 15.0.0 CR#73 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187369 | Addition of TC6.3B.3.2 Tx ON/OFF time mask for intra-band non-contiguous EN-DC | CR | SGS Wireless | 38.521-3 15.0.0 CR#74 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187370 | Addition of TC6.3B.3.3 Tx ON/OFF time mask for inter-band EN-DC within FR1 | CR | SGS Wireless | 38.521-3 15.0.0 CR#75 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187407 | Update of test case 6.2B.3.2 UE A-MPR for Intra-band non-contigous EN-DC for NS_04 | CR | Ericsson-LG Co., LTD | 38.521-3 15.0.0 CR#79 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
withdrawn | [WTS] [JSN] |
| R5-187408 | Update of test case 6.5B.2.1.2 Additional spectrum emission mask for intra-band contigous EN-DC for NS_04 | CR | Ericsson-LG Co., LTD | 38.521-3 15.0.0 CR#80 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187409 | Update of test case 6.2B.3.1 UE A-MPR for Intra-band contiguous EN-DC for NS_04 | CR | Ericsson-LG Co., LTD | 38.521-3 15.0.0 CR#81 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187572 | FR2 General Spurious Emission test case update | CR | Qualcomm Austria RFFE GmbH | 38.521-3 15.0.0 CR#88 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
revised | [WTS] [JSN] |
| R5-187816 | Adding test case 6.2B.2.4, UE Maximum Output Power reduction for Inter-Band EN-DC including FR2 | CR | Ericsson | 38.521-3 15.0.0 CR#481 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-187819 | Update general parameter Connection without release in initial conditions in TS 38.521-3 | CR | Keysight Technologies UK Ltd | 38.521-3 15.0.0 CR#531 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-187820 | Updates to test case 6.5B.2.1.3, Adjacent channel leakage ratio for intra-band contiguous EN-DC | CR | Ericsson | 38.521-3 15.0.0 CR#431 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-187821 | Addition OBW intraband non contiguous EN-DC | CR | Keysight Technologies UK Ltd | 38.521-3 15.0.0 CR#521 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-187822 | Introduction of New test case 6.4B.2.2.1 Error Vector Magnitude for intra-band non-contiguous EN-DC | CR | KTL | 38.521-3 15.0.0 CR#551 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-187823 | Introduction of New test case 6.4B.2.2.2 Carrier Leakage for intra-band non-contiguous EN-DC | CR | KTL | 38.521-3 15.0.0 CR#561 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-187825 | Introduction of New test case 6.4B.2.3.1 Error Vector Magnitude for inter-band EN-DC within FR1 | CR | KTL | 38.521-3 15.0.0 CR#581 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-187826 | Introduction of New test case 6.4B.2.3.2 Carrier Leakage for inter-band EN-DC within FR1 | CR | KTL, MTCC | 38.521-3 15.0.0 CR#591 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-187827 | Introduction of New test case 6.4B.2.3.3 In-band Emissions for inter-band EN-DC within FR1 | CR | KTL, MTCC | 38.521-3 15.0.0 CR#601 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-187828 | Introduction of Error Vector Magnitude for intra-band contiguous EN-DC | CR | LG Electronics | 38.521-3 15.0.0 CR#701 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-187829 | Introduction of Carrier Leakage for intra-band contiguous EN-DC | CR | LG Electronics | 38.521-3 15.0.0 CR#711 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-187831 | FR2 General Spurious Emission test case update | CR | Qualcomm Austria RFFE GmbH | 38.521-3 15.0.0 CR#881 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-188012 | Introduction of New test case 6.4B.2.2.3 In-band Emissions for intra-band non-contiguous EN-DC | CR | KTL | 38.521-3 15.0.0 CR#571 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-188013 | Addition OBW intra-band contiguous EN-DC | CR | Keysight Technologies UK Ltd | 38.521-3 15.0.0 CR#501 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-188014 | Addition SEM intra-band contiguous EN-DC | CR | Keysight Technologies UK Ltd | 38.521-3 15.0.0 CR#511 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-188015 | Additonal Spurious Emissions for Intra-band contiguous EN-DC | CR | Qualcomm Incorporated | 38.521-3 15.0.0 CR#641 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-188016 | Additonal Spurious Emissions for Intra-band non-contiguous EN-DC | CR | Qualcomm Incorporated | 38.521-3 15.0.0 CR#651 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-188017 | Additonal Spurious emission for inter-band EN-DC | CR | Qualcomm Incorporated | 38.521-3 15.0.0 CR#661 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-188019 | Introduction of In-band Emissions for intra-band contiguous EN-DC | CR | LG Electronics | 38.521-3 15.0.0 CR#721 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-188020 | Addition of TC6.3B.3.1 Tx ON/OFF time mask for intra-band contiguous EN-DC | CR | SGS Wireless | 38.521-3 15.0.0 CR#731 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-188021 | Addition of TC6.3B.3.2 Tx ON/OFF time mask for intra-band non-contiguous EN-DC | CR | SGS Wireless | 38.521-3 15.0.0 CR#741 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-188022 | Addition of TC6.3B.3.3 Tx ON/OFF time mask for inter-band EN-DC within FR1 | CR | SGS Wireless | 38.521-3 15.0.0 CR#751 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-188023 | Update of test case 6.5B.2.1.2 Additional spectrum emission mask for intra-band contigous EN-DC for NS_04 | CR | Ericsson-LG Co., LTD | 38.521-3 15.0.0 CR#801 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
| R5-188024 | Update of test case 6.2B.3.1 UE A-MPR for Intra-band contiguous EN-DC for NS_04 | CR | Ericsson-LG Co., LTD | 38.521-3 15.0.0 CR#811 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.6.1 |
agreed | [WTS] [JSN] |
49 documents (0.34729695320129 seconds)