3GPP tdocs

Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc	Title	Type / Revs	Source	Spec / CR	S/WID	Release	Meeting	Status	Links

R5-186454	TP analysis for test case 6.5.2.4.2	CR	Ericsson	38.905 15.0.0 CR#16 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186455	TP analysis for EN-DC test case 6.2B.2.3	CR	Ericsson	38.905 15.0.0 CR#17 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186460	Update Clause 1 Scope of TS 38.522	CR	CMCC	38.522 15.0.0 CR#8 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	revised	[WTS] [JSN]
R5-186461	Update Clause 3 of TS 38.522	CR	CMCC	38.522 15.0.0 CR#9 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	revised	[WTS] [JSN]
R5-186462	TP for Clause 4.1.1 of TS 38.522	CR	CMCC	38.522 15.0.0 CR#10 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	revised	[WTS] [JSN]
R5-186463	TP for Clause 4.1.2 of TS 38.522	CR	CMCC	38.522 15.0.0 CR#11 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	revised	[WTS] [JSN]
R5-186464	TP for Clause 4.1.3 of TS 38.522	CR	CMCC	38.522 15.0.0 CR#12 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	revised	[WTS] [JSN]
R5-186501	Applicability rules implementation in 38.522	CR	Qualcomm Finland RFFE Oy	38.522 15.0.0 CR#13 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186502	FR2 Spurious Emission test case updates	CR	Qualcomm Finland RFFE Oy	38.521-2 15.0.0 CR#20 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	revised	[WTS] [JSN]
R5-186503	FR2 Spurious Emission test case updates	CR	Qualcomm Finland RFFE Oy	38.521-3 15.0.0 CR#33 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186504	FR2 RefSens test case updates	CR	Qualcomm Finland RFFE Oy	38.521-2 15.0.0 CR#21 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186505	Update Text on Store Beam Peak Coordinate	CR	Qualcomm Finland RFFE Oy	38.521-2 15.0.0 CR#22 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186506	Update Text on Store Beam Peak Coordinate	CR	Qualcomm Finland RFFE Oy	38.521-3 15.0.0 CR#34 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186507	38.521-3 Applicability Rules	CR	Qualcomm Finland RFFE Oy	38.521-3 15.0.0 CR#35 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186508	FR2 UE and TE radiated connection diagram	CR	Qualcomm Finland RFFE Oy	38.508-1 15.1.0 CR#249 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186510	Structure updates to Annex C and G	CR	Qualcomm Finland RFFE Oy	38.521-2 15.0.0 CR#23 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186601	5G NR_EN_DC with FR1_Text update for Intra-Band Contiguous RX sensitivity	CR	Qualcomm inc.	38.521-3 15.0.0 CR#39 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186602	5G NR_Text update for TX spurious emission intra-band contiguous EN-DC	CR	Qualcomm Inc.	38.521-3 15.0.0 CR#40 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186604	5G_FR1 Text update for 7.3 Reference sensitivity	CR	Qualcomm Inc.	38.521-1 15.0.0 CR#72 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186605	5R_FR1 Text Update for 6.5.3.1_General spurious emissions	CR	Qualcomm Inc	38.521-1 15.0.0 CR#73 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186606	5R FR1 Text Update for 6.5.3.2 Spurious emission for UE co-existence	CR	Qualcomm Inc	38.521-1 15.0.0 CR#74 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186608	Spurious emission band UE co-existence for Inter-band EN-DC within FR1	CR	Qualcomm Inc	38.521-3 15.0.0 CR#42 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186609	TP_analysis for TX spurious emission UE co-existence for intra-band contiguous EN-DC with FR1	CR	Qualcomm Inc	38.905 15.0.0 CR#18 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186610	TP analysis for Reference sensitivity for Intra-band Contiguous EN-DC with FR1	CR	Qualcomm Inc	38.905 15.0.0 CR#19 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186611	TP analysis for Reference sensitivity for Inter-band EN-DC with FR1	CR	Qualcomm Inc	38.905 15.0.0 CR#20 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186670	Updating test case 6.2.3 UE additional maximum output power reduction	CR	Ericsson-LG Co., LTD	38.521-1 15.0.0 CR#78 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186671	Updating test case 6.5.2.3 Additional spectrum emission mask	CR	Ericsson-LG Co., LTD	38.521-1 15.0.0 CR#79 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186672	Updating test case 6.2B.3.1 Additional Maximum Output Power reduction for Intra-band contiguous EN-DC	CR	Ericsson-LG Co., LTD	38.521-3 15.0.0 CR#44 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186673	Updating test case 6.5B.2.1.2 Additional spectrum emissions mask for intra-band contiguous EN-DC	CR	Ericsson-LG Co., LTD	38.521-3 15.0.0 CR#45 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186674	Test point analysis for AMPR Intra-band contiguous EN-DC in FR1 for NS_35	CR	Ericsson-LG Co., LTD	38.905 15.0.0 CR#21 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186675	Updating test case 6.2.3 maximum output power with additional requirements	CR	Ericsson-LG Co., LTD	38.521-2 15.0.0 CR#26 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186677	Resubmission of update to 38.508 for mid channel bandwidth	CR	Qualcomm Finland RFFE Oy	38.508-1 15.1.0 CR#261 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186680	Update of test case 6.5.2.4.2, UTRA ACLR in 38.521-1	CR	Ericsson	38.521-1 15.0.0 CR#80 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186681	Updates to EN-DC test case 6.2B.2.1, UE Maximum Output Power reduction for Intra-Band Contiguous EN-DC	CR	Ericsson	38.521-3 15.0.0 CR#46 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186683	Updates to EN-DC test case 6.2B.2.2, UE Maximum Output Power reduction for Intra-Band Non-Contiguous EN-DC	CR	Ericsson	38.521-1 15.0.0 CR#81 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	withdrawn	[WTS] [JSN]
R5-186684	Updates to test case 6.2B.2.3, UE Maximum Output Power reduction for Inter-Band EN-DC within FR1	CR	Ericsson	38.521-3 15.0.0 CR#47 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186773	Addition of 6.3D.1 Minimum output power for UL-MIMO	CR	China Telecommunications	38.521-1 15.0.0 CR#87 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	withdrawn	[WTS] [JSN]
R5-186774	Addition of 6.3D.1 Minimum output power for UL-MIMO	CR	China Telecommunications	38.521-1 15.0.0 CR#88 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186776	Addition of 6.3D.2 Transmit OFF power for UL-MIMO	CR	China Telecommunications	38.521-1 15.0.0 CR#89 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186781	Addition of 6.3D.3 Transmit ON/OFF time mask for UL-MIMO	CR	China Telecommunications	38.521-1 15.0.0 CR#90 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186788	Minor update OBW, SEM and ACLR inter-band FR1 test cases	CR	Keysight Technologies UK Ltd	38.521-3 15.0.0 CR#49 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186791	TP analysis OBW intraband contiguous EN-DC	CR	Keysight Technologies UK Ltd	38.905 15.0.0 CR#28 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186792	TP analysis SEM intraband contiguous EN-DC	CR	Keysight Technologies UK Ltd	38.905 15.0.0 CR#29 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186845	Correction of test frequencies for NR band n76	CR	Ericsson	38.508-1 15.1.0 CR#299 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186901	Update SEM requirements to TS 38.101-1 v15.3.0	CR	Keysight Technologies UK Ltd	38.521-1 15.0.0 CR#91 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-186902	Update ACS and inband blocking test cases in TS 38.521-1	CR	Keysight Technologies UK Ltd	38.521-1 15.0.0 CR#92 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187023	Editorial update of Annex B	CR	Huawei, HiSilicon	38.903 15.0.0 CR#10 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187024	Addition of MU contribution for demodulation test cases	CR	Huawei, HiSilicon	38.903 15.0.0 CR#11 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187025	Addition of MU contribution for RRM test cases	CR	Huawei, HiSilicon	38.903 15.0.0 CR#12 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187028	Addition of test frequencies for SUL band n80	CR	Huawei, HiSilicon	38.508-1 15.1.0 CR#350 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187029	Addition of test frequencies for SUL band n81	CR	Huawei, HiSilicon	38.508-1 15.1.0 CR#351 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	revised	[WTS] [JSN]
R5-187030	Addition of test frequencies for SUL band n82	CR	Huawei, HiSilicon	38.508-1 15.1.0 CR#352 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187031	Addition of test frequencies for SUL band n83	CR	Huawei, HiSilicon	38.508-1 15.1.0 CR#353 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187032	Addition of test frequencies for SUL band n84	CR	Huawei, HiSilicon	38.508-1 15.1.0 CR#354 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187033	Addition of test frequencies for SUL band n86	CR	Huawei, HiSilicon	38.508-1 15.1.0 CR#355 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187034	Adding edge allcation into common uplink configuration in 6.1	CR	Huawei, HiSilicon,CAICT	38.521-1 15.0.0 CR#107 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187035	Update test points analysis for multiple FR1 test cases	CR	Huawei, HiSilicon, Keysight, CAICT	38.905 15.0.0 CR#31 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187148	General clauses updated for TR38.903	CR	Bureau Veritas, Huawei, HiSilicon	38.903 15.0.0 CR#13 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187149	Updated to Annexes for FR1 tests	CR	Bureau Veritas	38.521-1 15.0.0 CR#111 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187270	Updating 4.2.1 General functional requirements	CR	Anritsu	38.508-1 15.1.0 CR#381 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187271	Update the section for test equipment requirements for TRx	CR	Anritsu	38.508-1 15.1.0 CR#382 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187272	FR2 downlink signal level(38.508-1)	CR	Anritsu	38.508-1 15.1.0 CR#383 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187371	Addition of TC6.3B.2.1 Transmit OFF Power for intra-band contiguous EN-DC	CR	SGS Wireless	38.521-3 15.0.0 CR#76 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187372	Addition of TC6.3B.2.3 Transmit OFF Power for inter-band EN-DC within FR1	CR	SGS Wireless	38.521-3 15.0.0 CR#77 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187373	Addition of TC6.3B.2.2 Transmit OFF Power for intra-band non-contiguous EN-DC	CR	SGS Wireless	38.521-3 15.0.0 CR#78 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187376	Update of 6.2.1 MOP	CR	Huawei, HiSilicon	38.521-1 15.0.0 CR#120 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187377	Update of 6.2.4 Configured Output Power	CR	Huawei, HiSilicon	38.521-1 15.0.0 CR#121 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	revised	[WTS] [JSN]
R5-187378	Update of 6.3.1 Minimum Output Power	CR	Huawei, HiSilicon	38.521-1 15.0.0 CR#122 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187379	Update of 6.3.3.2 General ON/OFF time mask	CR	Huawei, HiSilicon	38.521-1 15.0.0 CR#123 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187380	Addition of 6.2D.1 MOP for MIMO	CR	Huawei, HiSilicon	38.521-1 15.0.0 CR#124 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187381	Addition of 6.2D.2 MPR for MIMO	CR	Huawei, HiSilicon	38.521-1 15.0.0 CR#125 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187382	Addition of 6.2D.4 Configured Output Power for MIMO	CR	Huawei, HiSilicon	38.521-1 15.0.0 CR#126 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187383	Addition of 6.4D.1 Frequency error for MIMO	CR	Huawei, HiSilicon	38.521-1 15.0.0 CR#127 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187384	Addition of 6.4D.2.1 EVM for MIMO	CR	Huawei, HiSilicon	38.521-1 15.0.0 CR#128 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187385	Addition of 6.4D.2.2 Carrier Leakage for MIMO	CR	Huawei, HiSilicon	38.521-1 15.0.0 CR#129 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187386	Addition of 6.4D.2.3 In-band emissions for MIMO	CR	Huawei, HiSilicon	38.521-1 15.0.0 CR#130 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187387	Addition of 6.4D.2.4 EVM equalizer spectrum flatness for MIMO	CR	Huawei, HiSilicon	38.521-1 15.0.0 CR#131 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187419	Addition of SUL condition	CR revised to R5-187889	Huawei, Hisilicon	38.508-1 15.1.0 CR#392 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	revised	[WTS] [JSN]
R5-187420	Addition of connection diagram for 2 TX UL MIMO	CR	Huawei, Hisilicon	38.508-1 15.1.0 CR#393 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187421	Introduction of TC 6.5D.1 Occupied bandwidth for UL MIMO	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#136 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187422	Introduction of TC 6.5D.2.2 Spectrum Emission Mask for UL MIMO	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#137 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187423	Introduction of TC 6.5D.2.3 Additional Spectrum Emission Mask for UL MIMO	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#138 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187424	Introduction of TC 6.5D.2.4.1 NR ACLR for UL MIMO	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#139 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187425	Introduction of TC 6.5D.2.4.2 UTRA ACLR for UL MIMO	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#140 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187426	Introduction of TC 6.5D.3.2 General spurious emissions for UL MIMO	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#141 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	withdrawn	[WTS] [JSN]
R5-187427	Introduction of TC 6.5D.3.3 Spurious Emission for UE co-existence for UL MIMO	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#142 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	withdrawn	[WTS] [JSN]
R5-187428	Introduction of TC 6.5D.3.4 Additional Spurious Emission for UL MIMO	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#143 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	withdrawn	[WTS] [JSN]
R5-187429	Introduction of TC 6.5D.4 Transmit intermodulation for UL MIMO	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#144 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187431	Introduction of TC 7.4D Maximum input level for UL-MIMO	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#146 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187432	Updation of 6.2C.1 Configured transmitted power for SUL	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#147 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187433	Introduction of TC 6.5C.1 Occupied bandwidth for SUL	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#148 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187434	Introduction of TC 6.5C.2.2 Spectrum Emission Mask for SUL	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#149 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187435	Introduction of TC 6.5C.2.3 Additional Spectrum Emission Mask for SUL	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#150 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187436	Introduction of TC 6.5C.2.4.1 NR ACLR for SUL	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#151 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187437	Introduction of TC 6.5C.2.4.2 UTRA ACLR for SUL	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#152 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187438	Introduction of TC 6.5C.3.2 General spurious emissions for SUL	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#153 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187439	Introduction of TC 6.5C.3.3 Spurious Emission for UE co-existence for SUL	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#154 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187440	Introduction of TC 6.5C.3.4 Additional Spurious Emission for SUL	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#155 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187441	Introduction of TC 6.5C.4 Transmit intermodulation for SUL	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#156 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	revised	[WTS] [JSN]
R5-187442	Updation of Uplink channel for SUL in Annex A	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#157 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	withdrawn	[WTS] [JSN]
R5-187455	Updating test case 6.3.4.2 Absolute Power Tolerance	CR	Intel Corporation (UK) Ltd	38.521-1 15.0.0 CR#158 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187456	Updating test case 6.3.4.4 Aggregate Power Tolerance	CR	Intel Corporation (UK) Ltd	38.521-1 15.0.0 CR#159 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187552	Updates to TS 38.521-3 common sections 1-4 to align with core spec	CR	Qualcomm Japan Inc	38.521-3 15.0.0 CR#83 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187557	Addition of low and high test channel bandwidth in 38.508	CR	Qualcomm Japan Inc	38.508-1 15.1.0 CR#396 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187559	Updates to TS 38.521-3 Section 5 to align with core spec	CR	Qualcomm Japan Inc	38.521-3 15.0.0 CR#84 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187560	Update to Table 5.3.5-1 in TS 38.521-1	CR	Qualcomm Japan Inc	38.521-1 15.0.0 CR#162 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187561	Update to Table 5.3.5-1 in TS 38.521-2	CR	Qualcomm Japan Inc	38.521-2 15.0.0 CR#42 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187562	Update to TC6.5B.3.2.1 - General Spurious Emissions for intra-band non-contiguous EN-DC	CR	Qualcomm Japan Inc	38.521-3 15.0.0 CR#85 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187563	Update to 7.3B.2.2 - REFSENS for Intra-band Non-Contiguous EN-DC	CR	Qualcomm Japan Inc	38.521-3 15.0.0 CR#86 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187565	Updates to TS 38.521-3 Section 4 with LTE anchor details	CR	Qualcomm Japan Inc	38.521-3 15.0.0 CR#87 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187566	Update note in section 4.1 to include CBW and SCS in RF test applicability	CR	Qualcomm Japan Inc	38.522 15.0.0 CR#16 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187582	Discussion on test point selection for EVM in FR2	CR	ROHDE & SCHWARZ	38.905 15.0.0 CR#43 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187583	Discussion on test point selection for Carrier Leakage in FR2	CR	ROHDE & SCHWARZ	38.905 15.0.0 CR#44 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187584	Update of test point selection for EVM equalizer spectrum flatness in FR1	CR	ROHDE & SCHWARZ	38.905 15.0.0 CR#45 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187587	Discussion on test point selection for In-band Emissions in FR2	CR	ROHDE & SCHWARZ	38.905 15.0.0 CR#46 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187589	Discussion on test point selection for EVM equalizer spectrum flatness in FR2	CR	ROHDE & SCHWARZ	38.905 15.0.0 CR#47 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187593	Discussion on test point selection for EVM equalizer spectrum flatness for Pi/2 BPSK in FR1	CR	ROHDE & SCHWARZ	38.905 15.0.0 CR#48 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187614	Updates to EN-DC test case 6.2B.2.2, UE Maximum Output Power reduction for Intra-Band Non-Contiguous EN-DC	CR	Ericsson	38.521-3 15.0.0 CR#94 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187615	Introduction of TC 6.5D.3.1 General spurious emissions for UL MIMO	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#167 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187616	Introduction of TC 6.5D.3.2 Spurious Emission for UE co-existence for UL MIMO	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#168 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187617	Introduction of TC 6.5D.3.3 Additional Spurious Emission for UL MIMO	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#169 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187618	Updation of Uplink channel for SUL in Annex G	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#170 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187619	Update of Section 6.3.3.1 General	CR	SGS wireless	38.521-2 15.0.0 CR#50 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187881	Update Clause 1 Scope of TS 38.522	CR	CMCC	38.522 15.0.0 CR#81 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187882	Update Clause 3 of TS 38.522	CR	CMCC	38.522 15.0.0 CR#91 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187883	TP for Clause 4.1.1 of TS 38.522	CR	CMCC	38.522 15.0.0 CR#101 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187884	TP for Clause 4.1.2 of TS 38.522	CR	CMCC	38.522 15.0.0 CR#111 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187885	TP for Clause 4.1.3 of TS 38.522	CR	CMCC	38.522 15.0.0 CR#121 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187886	FR2 Spurious Emission test case updates	CR	Qualcomm Finland RFFE Oy	38.521-2 15.0.0 CR#201 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187887	Addition of test frequencies for SUL band n81	CR	Huawei, HiSilicon	38.508-1 15.1.0 CR#3511 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187888	Update of 6.2.4 Configured Output Power	CR	Huawei, HiSilicon	38.521-1 15.0.0 CR#1211 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]
R5-187889	Addition of SUL condition	CR revision of R5-187419	Huawei, Hisilicon	38.508-1 15.1.0 CR#3921 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	withdrawn	[WTS] [JSN]
R5-187890	Introduction of TC 6.5C.4 Transmit intermodulation for SUL	CR	Huawei, Hisilicon	38.521-1 15.0.0 CR#1561 catF	5GS_NR_LTE-UEConTest	Rel-15	R5-81 AI: 5.3.9.18	agreed	[WTS] [JSN]

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