Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-186710 | TP analysis for test case 6.2B.2.4, UE Maximum Output Power reduction for Inter-Band EN-DC including FR2 | CR | Ericsson | 38.905 15.0.0 CR#22 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
agreed | [WTS] [JSN] |
| R5-186712 | Test Point analysis for FR1 7.4 Maximum input level | CR | CAICT, Huawei | 38.905 15.0.0 CR#23 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
revised | [WTS] [JSN] |
| R5-186713 | Test Point analysis for FR1 MPR test case | CR | CAICT, Huawei | 38.905 15.0.0 CR#24 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
revised | [WTS] [JSN] |
| R5-186737 | Test Point analysis for FR2 7.4 Maximum input level | CR | CAICT, Huawei | 38.905 15.0.0 CR#25 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
revised | [WTS] [JSN] |
| R5-186749 | Test Point analysis for NR Narrow band in FR1 | CR | CAICT | 38.905 15.0.0 CR#26 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
withdrawn | [WTS] [JSN] |
| R5-186750 | Test Point analysis for NR spurious response in FR1 | CR | CAICT | 38.905 15.0.0 CR#27 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
withdrawn | [WTS] [JSN] |
| R5-186805 | TP analysis for time alignment error for MIMO FR1 | CR | China Unicom | 38.905 15.0.0 CR#30 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
withdrawn | [WTS] [JSN] |
| R5-187083 | Test Point analysis for FR1 PRACH test case | CR | KTL | 38.905 15.0.0 CR#32 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
withdrawn | [WTS] [JSN] |
| R5-187278 | TP analysis for receiver spurious emission tests for FR1 inter-band EN-DC | CR | Anritsu | 38.905 15.0.0 CR#33 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
revised | [WTS] [JSN] |
| R5-187280 | TP analysis for wideband intermodulation tests for FR1 inter-band EN-DC | CR | Anritsu | 38.905 15.0.0 CR#34 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
revised | [WTS] [JSN] |
| R5-187282 | TP analysis for receiver spurious emission tests for FR1 SA | CR | Anritsu | 38.905 15.0.0 CR#35 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
revised | [WTS] [JSN] |
| R5-187284 | TP analysis for wideband intermodulation tests for FR1 SA | CR | Anritsu | 38.905 15.0.0 CR#36 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
revised | [WTS] [JSN] |
| R5-187396 | Update of TR 38.905 with SA FR1 A-MPR test point analyses, NS_04 | CR | Ericsson-LG Co., LTD | 38.905 15.0.0 CR#37 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
agreed | [WTS] [JSN] |
| R5-187398 | Update of TR 38.905 with SA FR1 Additional spectrum emission mask NS_04 test point analyses | CR | Ericsson-LG Co., LTD | 38.905 15.0.0 CR#38 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
withdrawn | [WTS] [JSN] |
| R5-187400 | Update of TR 38.905 with EN-DC A-MPR test point analyses, NS_04 | CR | Ericsson-LG Co., LTD | 38.905 15.0.0 CR#39 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
revised | [WTS] [JSN] |
| R5-187402 | Update of TR 38.905 with EN-DC A-MPR test point analyses, NS_04 non-contigous | CR | Ericsson-LG Co., LTD | 38.905 15.0.0 CR#40 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
withdrawn | [WTS] [JSN] |
| R5-187483 | Test Point analysis for FR2 Maximum Output Power | CR | Ericsson | 38.905 15.0.0 CR#41 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
revised | [WTS] [JSN] |
| R5-187489 | TP analysis for FR1 test case 6.3.4.3, relative power tolerance | CR | Ericsson France | 38.905 15.0.0 CR#42 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
agreed | [WTS] [JSN] |
| R5-187806 | Test Point analysis for FR1 7.4 Maximum input level | CR | CAICT, Huawei | 38.905 15.0.0 CR#231 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
agreed | [WTS] [JSN] |
| R5-187808 | TP analysis for receiver spurious emission tests for FR1 SA | CR | Anritsu | 38.905 15.0.0 CR#351 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
agreed | [WTS] [JSN] |
| R5-187809 | TP analysis for wideband intermodulation tests for FR1 SA | CR | Anritsu | 38.905 15.0.0 CR#361 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
agreed | [WTS] [JSN] |
| R5-187817 | TP analysis for receiver spurious emission tests for FR1 inter-band EN-DC | CR | Anritsu | 38.905 15.0.0 CR#331 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
agreed | [WTS] [JSN] |
| R5-187818 | TP analysis for wideband intermodulation tests for FR1 inter-band EN-DC | CR | Anritsu | 38.905 15.0.0 CR#341 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
agreed | [WTS] [JSN] |
| R5-187836 | Test Point analysis for FR2 7.4 Maximum input level | CR | CAICT, Huawei | 38.905 15.0.0 CR#251 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
agreed | [WTS] [JSN] |
| R5-187907 | Test Point analysis for FR1 MPR test case | CR | CAICT, Huawei | 38.905 15.0.0 CR#241 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
agreed | [WTS] [JSN] |
| R5-188227 | Test Point analysis for FR2 Maximum Output Power | CR | Ericsson | 38.905 15.0.0 CR#411 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
agreed | [WTS] [JSN] |
| R5-188240 | Update of TR 38.905 with EN-DC A-MPR test point analyses, NS_04 | CR | Ericsson-LG Co., LTD | 38.905 15.0.0 CR#391 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-81 AI: 5.3.9.16 |
agreed | [WTS] [JSN] |
27 documents (0.34801816940308 seconds)