Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-260036 | TT analysis for ATG RRM test case 19.3.1.1 |
CR revised to R5-261558 |
ZTE Corporation | 38.903 19.1.0 CR#1131 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
revised | [WTS] [JSN] |
| R5-260039 | TT analysis for ATG RRM test case 19.3.3.1 | CR | ZTE Corporation | 38.903 19.1.0 CR#1132 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
agreed | [WTS] [JSN] |
| R5-260042 | TT analysis for ATG RRM test case 19.4.2.1 |
CR revised to R5-261522 |
ZTE Corporation | 38.903 19.1.0 CR#1133 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
revised | [WTS] [JSN] |
| R5-260045 | TT analysis for ATG RRM test case 19.4.2.2 |
CR revised to R5-261523 |
ZTE Corporation | 38.903 19.1.0 CR#1134 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
revised | [WTS] [JSN] |
| R5-260049 | TT analysis for ATG RRM test cases 19.2.3.2.3 and 19.2.3.2.4 |
CR revised to R5-261520 |
ZTE Corporation | 38.903 19.1.0 CR#1135 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
revised | [WTS] [JSN] |
| R5-260733 | TT analysis for NR ATG RRM test case 19.6.6.2.1 |
CR revised to R5-261525 |
Huawei, HiSilicon | 38.903 19.1.0 CR#1150 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
revised | [WTS] [JSN] |
| R5-260734 | TT analysis for NR ATG RRM test case 19.6.6.2.2 |
CR revised to R5-261603 |
Huawei, HiSilicon | 38.903 19.1.0 CR#1151 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
revised | [WTS] [JSN] |
| R5-260735 | TT analysis for NR ATG RRM test case 19.6.7.2.1 |
CR revised to R5-261604 |
Huawei, HiSilicon | 38.903 19.1.0 CR#1152 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
revised | [WTS] [JSN] |
| R5-260736 | TT analysis for NR ATG RRM test case 19.6.7.2.2 |
CR revised to R5-261605 |
Huawei, HiSilicon | 38.903 19.1.0 CR#1153 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
revised | [WTS] [JSN] |
| R5-260737 | TT analysis for NR ATG RRM test case 19.6.8.2.1 |
CR revised to R5-261606 |
Huawei, HiSilicon | 38.903 19.1.0 CR#1154 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
revised | [WTS] [JSN] |
| R5-260738 | TT analysis for NR ATG RRM test case 19.6.8.2.2 |
CR revised to R5-261607 |
Huawei, HiSilicon | 38.903 19.1.0 CR#1155 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
revised | [WTS] [JSN] |
| R5-260974 | Test tolerance analysis for the Intra-frequency measurement test cases for ATG |
CR revised to R5-261536 |
Ericsson | 38.903 19.1.0 CR#1166 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
revised | [WTS] [JSN] |
| R5-260975 | Test tolerance analysis for the Inter-frequency measurement test cases for ATG |
CR revised to R5-261537 |
Ericsson | 38.903 19.1.0 CR#1167 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
revised | [WTS] [JSN] |
| R5-261520 | TT analysis for ATG RRM test cases 19.2.3.2.3 and 19.2.3.2.4 |
CR revision of R5-260049 |
ZTE Corporation | 38.903 19.1.0 CR#11351 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
agreed | [WTS] [JSN] |
| R5-261522 | TT analysis for ATG RRM test case 19.4.2.1 |
CR revision of R5-260042 |
ZTE Corporation | 38.903 19.1.0 CR#11331 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
agreed | [WTS] [JSN] |
| R5-261523 | TT analysis for ATG RRM test case 19.4.2.2 |
CR revision of R5-260045 |
ZTE Corporation | 38.903 19.1.0 CR#11341 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
agreed | [WTS] [JSN] |
| R5-261525 | TT analysis for NR ATG RRM test case 19.6.6.2.1 |
CR revision of R5-260733 |
Huawei, HiSilicon | 38.903 19.1.0 CR#11501 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
agreed | [WTS] [JSN] |
| R5-261536 | Test tolerance analysis for the Intra-frequency measurement test cases for ATG |
CR revision of R5-260974 |
Ericsson | 38.903 19.1.0 CR#11661 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
agreed | [WTS] [JSN] |
| R5-261537 | Test tolerance analysis for the Inter-frequency measurement test cases for ATG |
CR revision of R5-260975 |
Ericsson | 38.903 19.1.0 CR#11671 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
agreed | [WTS] [JSN] |
| R5-261558 | TT analysis for ATG RRM test case 19.3.1.1 |
CR revision of R5-260036 |
ZTE Corporation | 38.903 19.1.0 CR#11311 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
agreed | [WTS] [JSN] |
| R5-261603 | TT analysis for NR ATG RRM test case 19.6.6.2.2 |
CR revision of R5-260734 |
Huawei, HiSilicon | 38.903 19.1.0 CR#11511 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
agreed | [WTS] [JSN] |
| R5-261604 | TT analysis for NR ATG RRM test case 19.6.7.2.1 |
CR revision of R5-260735 |
Huawei, HiSilicon | 38.903 19.1.0 CR#11521 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
agreed | [WTS] [JSN] |
| R5-261605 | TT analysis for NR ATG RRM test case 19.6.7.2.2 |
CR revision of R5-260736 |
Huawei, HiSilicon | 38.903 19.1.0 CR#11531 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
agreed | [WTS] [JSN] |
| R5-261606 | TT analysis for NR ATG RRM test case 19.6.8.2.1 |
CR revision of R5-260737 |
Huawei, HiSilicon | 38.903 19.1.0 CR#11541 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
agreed | [WTS] [JSN] |
| R5-261607 | TT analysis for NR ATG RRM test case 19.6.8.2.2 |
CR revision of R5-260738 |
Huawei, HiSilicon | 38.903 19.1.0 CR#11551 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.7 |
agreed | [WTS] [JSN] |
25 documents (0.4072790145874 seconds)