Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-191340 | Adding test case 6.5A.2.3, Adjacent channel leakage ratio for CA without EN-DC | CR | Ericsson | 38.521-3 15.1.0 CR#178 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-191799 | Addition of TC6.3B.4.3 PRACH Time Mask for inter-band EN-DC within FR1 |
CR revised to R5-192442 |
SGS Wireless | 38.521-3 15.1.0 CR#195 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-191800 | Addition of TC6.3B.4.1 PRACH Time Mask for intra-band contiguous EN-DC |
CR revised to R5-192600 |
SGS Wireless | 38.521-3 15.1.0 CR#196 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-191801 | Addition of TC6.3B.4.2 PRACH Time Mask for intra-band non-contiguous EN-DC |
CR revised to R5-192601 |
SGS Wireless | 38.521-3 15.1.0 CR#197 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-191831 | FR2 NSA Spurious Emission Coexistance test case |
CR revised to R5-192453 |
Qualcomm UK Ltd | 38.521-3 15.1.0 CR#198 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-191835 | FR2 NSA Frequency Error test case |
CR revised to R5-192454 |
Qualcomm UK Ltd | 38.521-3 15.1.0 CR#199 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-191856 | Text Update for 6.5B.3.2 Spurious Emissions for intra-band non-contiguous EN-DC |
CR revised to R5-192603 |
Qualcomm UK Ltd | 38.521-3 15.1.0 CR#201 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-191858 | Text Update for 6.5B.3.1 Spurious Emissions for intra-band contiguous EN-DC |
CR revised to R5-192604 |
Qualcomm UK Ltd | 38.521-3 15.1.0 CR#202 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-191861 | Text Update for 6.5B.3.3 Spurious Emissions for Inter-band EN-DC within FR1 |
CR revised to R5-192605 |
Qualcomm UK Ltd | 38.521-3 15.1.0 CR#203 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-191863 | Text Update for 6.5B.4 Additional Spurious Emissions for EN-DC |
CR revised to R5-192606 |
Qualcomm UK Ltd | 38.521-3 15.1.0 CR#204 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-191879 | Update to Carrier Leakage for intra-band contiguous EN-DC |
CR revised to R5-192607 |
LG Electronics | 38.521-3 15.1.0 CR#209 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-191882 | Introduction of Error Vector Magnitude for intra-band contiguous EN-DC |
CR revised to R5-192608 |
LG Electronics | 38.521-3 15.1.0 CR#210 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-191888 | Update to In-band Emissions for intra-band contiguous EN-DC |
CR revised to R5-192609 |
LG Electronics | 38.521-3 15.1.0 CR#211 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-192004 | Update of TC 6.2B.1.1 | CR | Huawei, Hisilicon | 38.521-3 15.1.0 CR#215 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192005 | Update of TC 6.2B.1.2 | CR | Huawei, Hisilicon | 38.521-3 15.1.0 CR#216 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192006 | Update of TC 6.2B.1.3 | CR | Huawei, Hisilicon | 38.521-3 15.1.0 CR#217 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192055 | Update of 6.2B.4.1.1 Configured output power Intra-band contigous EN-DC |
CR revised to R5-192689 |
Huawei, HiSilicon | 38.521-3 15.1.0 CR#218 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-192057 | Update of EN-DC 6.2B.4.1.2 Configured transmitted power Intra-band non-contigous |
CR revised to R5-192690 |
Huawei, HiSilicon | 38.521-3 15.1.0 CR#219 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-192059 | Update of EN-DC 6.2B.4.1.3 Configured transmitted power inter-band within FR1 |
CR revised to R5-192443 |
Huawei, HiSilicon | 38.521-3 15.1.0 CR#220 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-192127 | Addition of transmit modulation quality test cases for inter-band EN-DC including FR2 |
CR revised to R5-192455 |
ROHDE & SCHWARZ | 38.521-3 15.1.0 CR#221 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-192153 | Introduction 6.5B.1.4 OBW interband EN-DC including FR2 |
CR revised to R5-192456 |
Keysight Technologies UK Ltd | 38.521-3 15.1.0 CR#222 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-192173 | Introduction 6.5B.2.4.1 SEM interband EN-DC including FR2 |
CR revised to R5-192457 |
Keysight Technologies UK Ltd | 38.521-3 15.1.0 CR#223 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-192176 | TIB,c updated for CA and EN-DC cases | CR | Bureau Veritas | 38.521-3 15.1.0 CR#224 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192178 | Introduction 6.5B.2.4.3 ACLR interband EN-DC including FR2 |
CR revised to R5-192458 |
Keysight Technologies UK Ltd | 38.521-3 15.1.0 CR#226 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-192184 | Clarification on UL slots in OBW, SEM and ACLR in TS 38.521-3 |
CR revised to R5-192610 |
Keysight Technologies UK Ltd | 38.521-3 15.1.0 CR#227 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-192217 | TS 38.521-3 corrections and clean-up to TC categories within Clause 6 |
CR revised to R5-192445 |
Qualcomm Austria RFFE GmbH | 38.521-3 15.1.0 CR#233 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-192224 | Addition of TC6.2B.1.4 - Max Output Power for EN-DC Interband including FR2 |
CR revised to R5-192681 |
Qualcomm Austria RFFE GmbH | 38.521-3 15.1.0 CR#235 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-192225 | Addition of TC6.3B.1.4 - Minimum Output Power for EN-DC Interband including FR2 |
CR revised to R5-192459 |
Qualcomm Austria RFFE GmbH | 38.521-3 15.1.0 CR#236 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
revised | [WTS] [JSN] |
| R5-192442 | Addition of TC6.3B.4.3 PRACH Time Mask for inter-band EN-DC within FR1 |
CR revision of R5-191799 |
SGS Wireless | 38.521-3 15.1.0 CR#1951 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192443 | Update of EN-DC 6.2B.4.1.3 Configured transmitted power inter-band within FR1 |
CR revision of R5-192059 |
Huawei, HiSilicon | 38.521-3 15.1.0 CR#2201 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192445 | TS 38.521-3 corrections and clean-up to TC categories within Clause 6 |
CR revision of R5-192217 |
Qualcomm Austria RFFE GmbH | 38.521-3 15.1.0 CR#2331 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192453 | FR2 NSA Spurious Emission Coexistance test case |
CR revision of R5-191831 |
Qualcomm UK Ltd | 38.521-3 15.1.0 CR#1981 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192454 | FR2 NSA Frequency Error test case |
CR revision of R5-191835 |
Qualcomm UK Ltd | 38.521-3 15.1.0 CR#1991 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192455 | Addition of transmit modulation quality test cases for inter-band EN-DC including FR2 |
CR revision of R5-192127 |
ROHDE & SCHWARZ | 38.521-3 15.1.0 CR#2211 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192456 | Introduction 6.5B.1.4 OBW interband EN-DC including FR2 |
CR revision of R5-192153 |
Keysight Technologies UK Ltd | 38.521-3 15.1.0 CR#2221 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192457 | Introduction 6.5B.2.4.1 SEM interband EN-DC including FR2 |
CR revision of R5-192173 |
Keysight Technologies UK Ltd | 38.521-3 15.1.0 CR#2231 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192458 | Introduction 6.5B.2.4.3 ACLR interband EN-DC including FR2 |
CR revision of R5-192178 |
Keysight Technologies UK Ltd | 38.521-3 15.1.0 CR#2261 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192459 | Addition of TC6.3B.1.4 - Minimum Output Power for EN-DC Interband including FR2 |
CR revision of R5-192225 |
Qualcomm Austria RFFE GmbH | 38.521-3 15.1.0 CR#2361 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192600 | Addition of TC6.3B.4.1 PRACH Time Mask for intra-band contiguous EN-DC |
CR revision of R5-191800 |
SGS Wireless | 38.521-3 15.1.0 CR#1961 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192601 | Addition of TC6.3B.4.2 PRACH Time Mask for intra-band non-contiguous EN-DC |
CR revision of R5-191801 |
SGS Wireless | 38.521-3 15.1.0 CR#1971 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192603 | Text Update for 6.5B.3.2 Spurious Emissions for intra-band non-contiguous EN-DC |
CR revision of R5-191856 |
Qualcomm UK Ltd | 38.521-3 15.1.0 CR#2011 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192604 | Text Update for 6.5B.3.1 Spurious Emissions for intra-band contiguous EN-DC |
CR revision of R5-191858 |
Qualcomm UK Ltd | 38.521-3 15.1.0 CR#2021 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192605 | Text Update for 6.5B.3.3 Spurious Emissions for Inter-band EN-DC within FR1 |
CR revision of R5-191861 |
Qualcomm UK Ltd | 38.521-3 15.1.0 CR#2031 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192606 | Text Update for 6.5B.4 Additional Spurious Emissions for EN-DC |
CR revision of R5-191863 |
Qualcomm UK Ltd | 38.521-3 15.1.0 CR#2041 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192607 | Update to Carrier Leakage for intra-band contiguous EN-DC |
CR revision of R5-191879 |
LG Electronics | 38.521-3 15.1.0 CR#2091 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192608 | Introduction of Error Vector Magnitude for intra-band contiguous EN-DC |
CR revision of R5-191882 |
LG Electronics | 38.521-3 15.1.0 CR#2101 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192609 | Update to In-band Emissions for intra-band contiguous EN-DC |
CR revision of R5-191888 |
LG Electronics | 38.521-3 15.1.0 CR#2111 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192610 | Clarification on UL slots in OBW, SEM and ACLR in TS 38.521-3 |
CR revision of R5-192184 |
Keysight Technologies UK Ltd | 38.521-3 15.1.0 CR#2271 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192681 | Addition of TC6.2B.1.4 - Max Output Power for EN-DC Interband including FR2 |
CR revision of R5-192224 |
Qualcomm Austria RFFE GmbH | 38.521-3 15.1.0 CR#2351 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192689 | Update of 6.2B.4.1.1 Configured output power Intra-band contigous EN-DC |
CR revision of R5-192055 |
Huawei, HiSilicon | 38.521-3 15.1.0 CR#2181 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
| R5-192690 | Update of EN-DC 6.2B.4.1.2 Configured transmitted power Intra-band non-contigous |
CR revision of R5-192057 |
Huawei, HiSilicon | 38.521-3 15.1.0 CR#2191 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.6.1 |
agreed | [WTS] [JSN] |
51 documents (0.32359480857849 seconds)