Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-260034 | Correction to Annex F for ATG test case 19.3.1.1 including TT | CR | ZTE Corporation | 38.533 19.1.0 CR#4281 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-260035 | Correction to ATG RRM test case 19.3.1.1 with TT | CR | ZTE Corporation | 38.533 19.1.0 CR#4282 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-260037 | Correction to Annex F for ATG test case 19.3.3.1 including TT | CR | ZTE Corporation | 38.533 19.1.0 CR#4283 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-260038 | Correction to ATG RRM test case 19.3.3.1 with TT | CR | ZTE Corporation | 38.533 19.1.0 CR#4284 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-260040 | Correction to Annex F for ATG test case 19.4.2.1 including TT | CR | ZTE Corporation | 38.533 19.1.0 CR#4285 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-260041 | Correction to ATG RRM test case 19.4.2.1 with TT | CR | ZTE Corporation | 38.533 19.1.0 CR#4286 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-260043 | Correction to Annex F for ATG test case 19.4.2.2 including TT | CR | ZTE Corporation | 38.533 19.1.0 CR#4287 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-260044 | Correction to ATG RRM test case 19.4.2.2 with TT |
CR revised to R5-261524 |
ZTE Corporation | 38.533 19.1.0 CR#4288 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
revised | [WTS] [JSN] |
| R5-260046 | Correction to Annex F for ATG test cases 19.2.3.2.3 and 19.2.3.2.4 including TT | CR | ZTE Corporation | 38.533 19.1.0 CR#4289 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-260047 | Correction to ATG RRM test case 19.2.3.2.3 with TT | CR | ZTE Corporation | 38.533 19.1.0 CR#4290 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-260048 | Correction to ATG RRM test case 19.2.3.2.4 with TT | CR | ZTE Corporation | 38.533 19.1.0 CR#4291 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-260127 | Update to EN of ATG TC 19.2.2.1 and 19.2.2.2 |
CR revised to R5-261545 |
MediaTek Inc. | 38.533 19.1.0 CR#4300 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
revised | [WTS] [JSN] |
| R5-260466 | Addition of ATG RRM TC 19.1.1 |
CR revised to R5-261555 |
CMCC | 38.533 19.1.0 CR#4312 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
revised | [WTS] [JSN] |
| R5-260467 | Addition of ATG RRM TC 19.1.2 |
CR revised to R5-261556 |
CMCC | 38.533 19.1.0 CR#4313 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
revised | [WTS] [JSN] |
| R5-260468 | Addition of ATG RRM TC 19.1.3 |
CR revised to R5-261557 |
CMCC | 38.533 19.1.0 CR#4314 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
revised | [WTS] [JSN] |
| R5-260724 | Updating editor's note of NR ATG RRM test cases | CR | Huawei, HiSilicon | 38.533 19.1.0 CR#4331 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-260725 | Correction to NR ATG RRM test case 19.6.6.2.1 with TT |
CR revised to R5-261526 |
Huawei, HiSilicon | 38.533 19.1.0 CR#4332 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
revised | [WTS] [JSN] |
| R5-260726 | Correction to NR ATG RRM test case 19.6.6.2.2 with TT |
CR revised to R5-261527 |
Huawei, HiSilicon | 38.533 19.1.0 CR#4333 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
revised | [WTS] [JSN] |
| R5-260727 | Correction to NR ATG RRM test case 19.6.7.2.1 with TT | CR | Huawei, HiSilicon | 38.533 19.1.0 CR#4334 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-260728 | Correction to NR ATG RRM test case 19.6.7.2.2 with TT | CR | Huawei, HiSilicon | 38.533 19.1.0 CR#4335 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-260729 | Correction to NR ATG RRM test case 19.6.8.2.1 with TT | CR | Huawei, HiSilicon | 38.533 19.1.0 CR#4336 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-260730 | Correction to NR ATG RRM test case 19.6.8.2.2 with TT |
CR revised to R5-261528 |
Huawei, HiSilicon | 38.533 19.1.0 CR#4337 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
revised | [WTS] [JSN] |
| R5-260731 | Correction to Annex B for NR ATG RRM test cases | CR | Huawei, HiSilicon | 38.533 19.1.0 CR#4338 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-260732 | Correction to Annex F for NR ATG RRM test cases |
CR revised to R5-261564 |
Huawei, HiSilicon | 38.533 19.1.0 CR#4339 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
revised | [WTS] [JSN] |
| R5-260976 | Annex F correction for event triggered measurement test cases for ATG |
CR revised to R5-261540 |
Ericsson | 38.533 19.1.0 CR#4367 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
revised | [WTS] [JSN] |
| R5-260977 | Correction of SA intra-frequency event triggered reporting test case 19.5.1.x including Test Tolerance |
CR revised to R5-261538 |
Ericsson | 38.533 19.1.0 CR#4368 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
revised | [WTS] [JSN] |
| R5-260978 | Correction of SA inter-frequency event triggered reporting test case 19.5.2.x including Test Tolerance |
CR revised to R5-261539 |
Ericsson | 38.533 19.1.0 CR#4369 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
revised | [WTS] [JSN] |
| R5-260979 | Correction of SA event triggered reporting test case 19.5.2.1 |
CR revised to R5-261585 |
Ericsson | 38.533 19.1.0 CR#4370 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
revised | [WTS] [JSN] |
| R5-260980 | Correction of SA event triggered reporting test case 19.5.2.2 |
CR revised to R5-261586 |
Ericsson | 38.533 19.1.0 CR#4371 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
revised | [WTS] [JSN] |
| R5-260981 | Correction of SA event triggered reporting test case 19.5.2.3 |
CR revised to R5-261587 |
Ericsson | 38.533 19.1.0 CR#4372 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
revised | [WTS] [JSN] |
| R5-261524 | Correction to ATG RRM test case 19.4.2.2 with TT |
CR revision of R5-260044 |
ZTE Corporation | 38.533 19.1.0 CR#42881 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-261526 | Correction to NR ATG RRM test case 19.6.6.2.1 with TT |
CR revision of R5-260725 |
Huawei, HiSilicon | 38.533 19.1.0 CR#43321 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-261527 | Correction to NR ATG RRM test case 19.6.6.2.2 with TT |
CR revision of R5-260726 |
Huawei, HiSilicon | 38.533 19.1.0 CR#43331 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-261528 | Correction to NR ATG RRM test case 19.6.8.2.2 with TT |
CR revision of R5-260730 |
Huawei, HiSilicon | 38.533 19.1.0 CR#43371 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-261538 | Correction of SA intra-frequency event triggered reporting test case 19.5.1.x including Test Tolerance |
CR revision of R5-260977 |
Ericsson | 38.533 19.1.0 CR#43681 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-261539 | Correction of SA inter-frequency event triggered reporting test case 19.5.2.x including Test Tolerance |
CR revision of R5-260978 |
Ericsson | 38.533 19.1.0 CR#43691 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-261540 | Annex F correction for event triggered measurement test cases for ATG |
CR revision of R5-260976 |
Ericsson | 38.533 19.1.0 CR#43671 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-261545 | Update to EN of ATG TC 19.2.2.1 and 19.2.2.2 |
CR revision of R5-260127 |
MediaTek Inc. | 38.533 19.1.0 CR#43001 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-261555 | Addition of ATG RRM TC 19.1.1 |
CR revision of R5-260466 |
CMCC | 38.533 19.1.0 CR#43121 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-261556 | Addition of ATG RRM TC 19.1.2 |
CR revision of R5-260467 |
CMCC | 38.533 19.1.0 CR#43131 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-261557 | Addition of ATG RRM TC 19.1.3 |
CR revision of R5-260468 |
CMCC | 38.533 19.1.0 CR#43141 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-261564 | Correction to Annex F for NR ATG RRM test cases |
CR revision of R5-260732 |
Huawei, HiSilicon | 38.533 19.1.0 CR#43391 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-261585 | Correction of SA event triggered reporting test case 19.5.2.1 |
CR revision of R5-260979 |
Ericsson | 38.533 19.1.0 CR#43701 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-261586 | Correction of SA event triggered reporting test case 19.5.2.2 |
CR revision of R5-260980 |
Ericsson | 38.533 19.1.0 CR#43711 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
| R5-261587 | Correction of SA event triggered reporting test case 19.5.2.3 |
CR revision of R5-260981 |
Ericsson | 38.533 19.1.0 CR#43721 catF | NR_ATG-UEConTest | Rel-19 |
R5-110 AI: 5.3.8.6 |
agreed | [WTS] [JSN] |
45 documents (0.39033102989197 seconds)