Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-242500 | Introduction of new NR NTN test case - 6.5.1 Occupied bandwidth | CR | Keysight Technologies | 38.521-5 18.1.0 CR#38 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-242501 | Introduction of new NR NTN test case - 6.4.2.1 Error Vector Magnitude | CR | Keysight Technologies | 38.521-5 18.1.0 CR#39 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-242502 | Introduction of new NR NTN test case - 6.4.2.1a Error Vector Magnitude including symbols with transient period |
CR revised to R5-243896 |
Keysight Technologies | 38.521-5 18.1.0 CR#40 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
revised | [WTS] [JSN] |
| R5-242503 | Introduction of new NR NTN test case - 6.4.2.2 Carrier leakage |
CR revised to R5-243673 |
Keysight Technologies | 38.521-5 18.1.0 CR#41 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
revised | [WTS] [JSN] |
| R5-242504 | Introduction of new NR NTN test case - 6.4.2.3 In-band emissions |
CR revised to R5-243674 |
Keysight Technologies | 38.521-5 18.1.0 CR#42 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
revised | [WTS] [JSN] |
| R5-242505 | Introduction of new NR NTN test case - 6.4.2.4 EVM equalizer spectrum flatness |
CR revised to R5-243675 |
Keysight Technologies | 38.521-5 18.1.0 CR#43 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
revised | [WTS] [JSN] |
| R5-242506 | Introduction of new NR NTN test case - 6.4.2.5 EVM equalizer spectrum flatness for Pi2 BPSK | CR | Keysight Technologies | 38.521-5 18.1.0 CR#44 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-242507 | Update of NR NTN test case - 6.2.1 UE maximum output power |
CR revised to R5-243676 |
Keysight Technologies | 38.521-5 18.1.0 CR#45 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
revised | [WTS] [JSN] |
| R5-242508 | Update of NR NTN test case - 6.2.2 UE maximum output power reduction | CR | Keysight Technologies | 38.521-5 18.1.0 CR#46 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-242509 | Update of NR NTN test case - 6.2.3 UE additional maximum output power reduction |
CR revised to R5-243677 |
Keysight Technologies | 38.521-5 18.1.0 CR#47 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
revised | [WTS] [JSN] |
| R5-242510 | Update of NR NTN test case - 6.2.4 Configured transmitted power | CR | Keysight Technologies | 38.521-5 18.1.0 CR#48 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-242511 | Update MU and TT for NR NTN test cases |
CR revised to R5-243678 |
Keysight Technologies | 38.521-5 18.1.0 CR#49 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
revised | [WTS] [JSN] |
| R5-242946 | Updates to additional Spurious emissions TC 6.5.3.3 | CR | Qualcomm Tech. Netherlands B.V | 38.521-5 18.1.0 CR#50 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
withdrawn | [WTS] [JSN] |
| R5-242947 | Updates to additional spurious emissions TC 6.5.3.3 | CR | Qualcomm Tech. Netherlands B.V | 38.521-5 18.1.0 CR#51 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-242951 | Adding new NTN test case 6.3.4 Power control |
CR revised to R5-243679 |
Qualcomm Tech. Netherlands B.V | 38.521-5 18.1.0 CR#52 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
revised | [WTS] [JSN] |
| R5-243288 | Corrections on 5.1 for NTN FR1 frequency range designation | CR | ZTE Corporation | 38.521-5 18.1.0 CR#53 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-243289 | Corrections on 6.2.3 for NTN UE additional maximum output power reduction | CR | ZTE Corporation | 38.521-5 18.1.0 CR#54 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-243290 | Corrections on 6.5.3.3 for NTN UE additional spurious emissions | CR | ZTE Corporation | 38.521-5 18.1.0 CR#55 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-243291 | Updates on Annex for satellite access conformance test |
CR revised to R5-243680 |
ZTE Corporation | 38.521-5 18.1.0 CR#56 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
revised | [WTS] [JSN] |
| R5-243415 | Annex F updates for NTN RF test on Tx on-off time mask |
CR revised to R5-243681 |
Apple Benelux B.V. | 38.521-5 18.1.0 CR#57 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
revised | [WTS] [JSN] |
| R5-243416 | Annex F updates for NTN RF test on Spectrum emission mask |
CR revised to R5-243814 |
Apple Benelux B.V. | 38.521-5 18.1.0 CR#58 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
revised | [WTS] [JSN] |
| R5-243417 | Annex F updates for NTN RF test on ACLR | CR | Apple Benelux B.V. | 38.521-5 18.1.0 CR#59 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-243441 | Update to nrn-ntn pdsch demod test case to update min test time |
CR revised to R5-243899 |
Qualcomm Inc | 38.521-5 18.1.0 CR#65 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
revised | [WTS] [JSN] |
| R5-243673 | Introduction of new NR NTN test case - 6.4.2.2 Carrier leakage |
CR revision of R5-242503 |
Keysight Technologies | 38.521-5 18.1.0 CR#411 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-243674 | Introduction of new NR NTN test case - 6.4.2.3 In-band emissions |
CR revision of R5-242504 |
Keysight Technologies | 38.521-5 18.1.0 CR#421 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-243675 | Introduction of new NR NTN test case - 6.4.2.4 EVM equalizer spectrum flatness |
CR revision of R5-242505 |
Keysight Technologies | 38.521-5 18.1.0 CR#431 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-243676 | Update of NR NTN test case - 6.2.1 UE maximum output power |
CR revision of R5-242507 |
Keysight Technologies | 38.521-5 18.1.0 CR#451 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-243677 | Update of NR NTN test case - 6.2.3 UE additional maximum output power reduction |
CR revision of R5-242509 |
Keysight Technologies | 38.521-5 18.1.0 CR#471 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-243678 | Update MU and TT for NR NTN test cases |
CR revision of R5-242511 |
Keysight Technologies | 38.521-5 18.1.0 CR#491 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-243679 | Adding new NTN test case 6.3.4 Power control |
CR revision of R5-242951 |
Qualcomm Tech. Netherlands B.V | 38.521-5 18.1.0 CR#521 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-243680 | Updates on Annex for satellite access conformance test |
CR revision of R5-243291 |
ZTE Corporation | 38.521-5 18.1.0 CR#561 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-243681 | Annex F updates for NTN RF test on Tx on-off time mask |
CR revision of R5-243415 |
Apple Benelux B.V. | 38.521-5 18.1.0 CR#571 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-243814 | Annex F updates for NTN RF test on Spectrum emission mask |
CR revision of R5-243416 |
Apple Benelux B.V. | 38.521-5 18.1.0 CR#581 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-243896 | Introduction of new NR NTN test case - 6.4.2.1a Error Vector Magnitude including symbols with transient period |
CR revision of R5-242502 |
Keysight Technologies | 38.521-5 18.1.0 CR#401 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
| R5-243899 | Update to nrn-ntn pdsch demod test case to update min test time |
CR revision of R5-243441 |
Qualcomm Inc | 38.521-5 18.1.0 CR#651 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-103 AI: 5.3.8.4 |
agreed | [WTS] [JSN] |
35 documents (0.34394097328186 seconds)