Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-191071 | Discussion on the way to write Clause 7.5B in TS 38.521-3 |
discussion revised to R5-192422 |
CMCC | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
revised | [WTS] [JSN] | ||
| R5-191148 | Multi-band relaxation impacts on conformance test | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | |
| R5-191149 | Handling of Multi-band relaxation in conformance test | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | |
| R5-191150 | Handling of Tp analysis for spurious tests (EN-DC inter-band) |
discussion revised to R5-192688 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
revised | [WTS] [JSN] | |
| R5-191151 | Applicability of TT among different types of DUT size |
discussion revised to R5-192666 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
revised | [WTS] [JSN] | |
| R5-191250 | Discussion paper on statistical tput calculation for demod test cases | discussion | Qualcomm communications-France | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-191350 | Test Tolerance review process for NR |
discussion revised to R5-192615 |
ANRITSU LTD |
R5-82 AI: 5.3.8.17 |
revised | [WTS] [JSN] | |||
| R5-191451 | Resolving ambiguity in LTE anchor agnostic approach |
discussion revised to R5-192602 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
revised | [WTS] [JSN] | ||
| R5-191516 | FR1 TT Way Forward update |
discussion revised to R5-192596 |
Telecom Italia | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
revised | [WTS] [JSN] | |
| R5-191524 | FR2 TT for SEM and ACLR | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | |
| R5-191525 | PDCCH parameter for demodulation tests | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | |
| R5-191532 | On applicability of DUT repositioning concept to FR2 spurious measurement |
discussion revised to R5-192668 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
revised | [WTS] [JSN] | ||
| R5-191533 | DUT repositioning and its relations with QoQZ for OTA measurement | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-191536 | DUT repositioning and FR2 link | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-191537 | Divisor for multiple measurement antenna MU | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
withdrawn | [WTS] [JSN] | ||
| R5-191611 | On SEM measurement uncertainty | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-191612 | On ACLR measurement uncertainty |
discussion revised to R5-192661 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
revised | [WTS] [JSN] | ||
| R5-191613 | On gNB uncertainty on absolute level MU | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
withdrawn | [WTS] [JSN] | ||
| R5-191614 | On noise impact | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
withdrawn | [WTS] [JSN] | ||
| R5-191615 | On Amplifiers uncertainty | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-191616 | On Calibration VNA uncertainty |
discussion revised to R5-192662 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
revised | [WTS] [JSN] | ||
| R5-191617 | On OBW measurement uncertainty | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-191623 | On Re-Repositioning Approach for Spurious Emission QoQZ Validation | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | |
| R5-191624 | MU for QoQZ for OBW | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | |
| R5-191625 | MU for QoQZ for ACLR | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | |
| R5-191626 | MU Threshold Definition for UE RF Test Cases |
discussion revised to R5-192658 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
revised | [WTS] [JSN] | |
| R5-191628 | MU Elements: documentation of justification and interdependence | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | |
| R5-191629 | On MU Reduction Possibilities | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | |
| R5-191727 | Consideration of FR2 Test Tolerance values for Spherical Coverage |
discussion revised to R5-192656 |
Apple Europe Limited | Rel-15 |
R5-82 AI: 5.3.8.17 |
revised | [WTS] [JSN] | ||
| R5-191794 | SNR estimation update for FR2 priority 1 and 2 TRx TCs | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-191795 | On the QoQZ impact for ACLR |
discussion revised to R5-192659 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
revised | [WTS] [JSN] | ||
| R5-191796 | On the FR2 OBW MU |
discussion revised to R5-192660 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
revised | [WTS] [JSN] | ||
| R5-191797 | On the FR2 ACLR MU | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
withdrawn | [WTS] [JSN] | ||
| R5-191836 | Discussion on FR2 Min EIRP and EIS spherical coverage TT for PC3 UE | discussion | Qualcomm UK Ltd | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-191857 | Discussion on test point selection for Aggregate power tolerance in SA FR2 |
discussion revised to R5-192448 |
LG Electronics | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
revised | [WTS] [JSN] | ||
| R5-191956 | Spherical Coverage TT Proposal |
discussion revised to R5-192657 |
Telecom Italia, Orange, AT&T, Vodafone | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
revised | [WTS] [JSN] | |
| R5-192024 | Discussion on the waveform selection for UL MIMO tests | discussion | Huawei, Hisilicon | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-192038 | Discussion on Measurement Uncertainty definitions and applicability |
discussion revised to R5-192665 |
Ericsson | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
revised | [WTS] [JSN] | |
| R5-192125 | On the SNR for FR2 TRx test cases | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-192128 | On the QoQZ Procedure for Spurious Emissions | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-192175 | Discussion on OBW test procedure | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-192179 | Discussion Out-of-band emission intraband non-contiguous EN-DC | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-192201 | ACLR absolute requirement in FR2 | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
withdrawn | [WTS] [JSN] | |
| R5-192202 | AI list for introduction of EN-DC combinations | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
withdrawn | [WTS] [JSN] | |
| R5-192220 | Discussion on RRC_Connected generic procedure within RRM tests | discussion | Qualcomm Austria RFFE GmbH | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | |
| R5-192422 | Discussion on the way to write Clause 7.5B in TS 38.521-3 |
discussion revision of R5-191071 |
CMCC | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-192448 | Discussion on test point selection for Aggregate power tolerance in SA FR2 |
discussion revision of R5-191857 |
LG Electronics | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-192596 | FR1 TT Way Forward update |
discussion revision of R5-191516 |
Telecom Italia | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | |
| R5-192602 | Resolving ambiguity in LTE anchor agnostic approach |
discussion revision of R5-191451 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-192615 | Test Tolerance review process for NR |
discussion revision of R5-191350 |
ANRITSU LTD |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | |||
| R5-192656 | Consideration of FR2 Test Tolerance values for Spherical Coverage |
discussion revision of R5-191727 |
Apple Europe Limited | Rel-15 |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-192657 | Spherical Coverage TT Proposal |
discussion revision of R5-191956 |
Telecom Italia, Orange, AT&T, Vodafone | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | |
| R5-192658 | MU Threshold Definition for UE RF Test Cases |
discussion revision of R5-191626 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | |
| R5-192659 | On the QoQZ impact for ACLR |
discussion revision of R5-191795 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-192660 | On the FR2 OBW MU |
discussion revision of R5-191796 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-192661 | On ACLR measurement uncertainty |
discussion revision of R5-191612 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-192662 | On Calibration VNA uncertainty |
discussion revision of R5-191616 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-192665 | Discussion on Measurement Uncertainty definitions and applicability |
discussion revision of R5-192038 |
Ericsson | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | |
| R5-192666 | Applicability of TT among different types of DUT size |
discussion revision of R5-191151 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | |
| R5-192668 | On applicability of DUT repositioning concept to FR2 spurious measurement |
discussion revision of R5-191532 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] | ||
| R5-192688 | Handling of Tp analysis for spurious tests (EN-DC inter-band) |
discussion revision of R5-191150 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.17 |
noted | [WTS] [JSN] |
61 documents (0.30900716781616 seconds)