Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-191072 | TP analysis for FR1 Rx 7.9A.1 Spurious Emission for 2DL CA |
CR revised to R5-192684 |
CMCC | 38.905 15.1.0 CR#73 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-191073 | TP analysis for FR1 Rx 7.9A.2 Spurious Emission for 3DL CA | CR | CMCC | 38.905 15.1.0 CR#74 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
withdrawn | [WTS] [JSN] |
| R5-191074 | TP analysis for FR1 Rx 7.9A.3 Spurious Emission for 4DL CA | CR | CMCC | 38.905 15.1.0 CR#75 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
withdrawn | [WTS] [JSN] |
| R5-191085 | Test point analysis for TxIM (inter-band EN-DC within FR1) | CR | NTT DOCOMO, INC. | 38.905 15.1.0 CR#76 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
withdrawn | [WTS] [JSN] |
| R5-191335 | Adding FR2 test case 6.3.4.3 to 38.905 |
CR revised to R5-192449 |
Ericsson | 38.905 15.1.0 CR#80 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-191528 | Test Point analysis for FR1 6.3.3.6 SRS time mask |
CR revised to R5-192546 |
MTCC | 38.905 15.1.0 CR#82 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-191529 | Test Point analysis for FR1 6.3.3.7 PUSCH-PUCCH and PUSCH-SRS time masks | CR | MTCC | 38.905 15.1.0 CR#83 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
withdrawn | [WTS] [JSN] |
| R5-191672 | Update of TP analysis of FR1 6.2.1 MOP |
CR revised to R5-192599 |
Huawei, HiSilicon | 38.905 15.1.0 CR#84 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-191674 | Addition of TP analysis of FR1 6.2.4 Configured transmitted power |
CR revised to R5-192401 |
Huawei, HiSilicon | 38.905 15.1.0 CR#85 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-191817 | Addition of TP analysis of FR1 6.2D.1 MOP for MIMO | CR | Huawei, HiSilicon | 38.905 15.1.0 CR#88 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
withdrawn | [WTS] [JSN] |
| R5-191819 | Addition of TP analysis of FR1 6.2D.2 MPR for MIMO | CR | Huawei, HiSilicon | 38.905 15.1.0 CR#89 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
withdrawn | [WTS] [JSN] |
| R5-191821 | Addition of TP analysis of FR1 6.2D.4 Configured transmitted power for MIMO | CR | Huawei, HiSilicon | 38.905 15.1.0 CR#90 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
withdrawn | [WTS] [JSN] |
| R5-191860 | Addition of Test Point analysis of FR2 6.3.4.4 Aggregate power tolerance |
CR revised to R5-192647 |
LG Electronics | 38.905 15.1.0 CR#92 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-191891 | TP analysis for FR1 6.3D.1 Minimum Output Power for UL-MIMO | CR | China Telecommunications | 38.905 15.1.0 CR#93 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
withdrawn | [WTS] [JSN] |
| R5-191987 | TP analysis for FR1 6.4A.1.1 Frequency error for CA (2UL CA) |
CR revised to R5-192569 |
Samsung | 38.905 15.1.0 CR#94 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-191988 | TP analysis for FR1 6.4A.2.1.1 Error Vector Magnitude for CA (2UL CA) |
CR revised to R5-192568 |
Samsung | 38.905 15.1.0 CR#95 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-191989 | TP analysis for FR1 6.4A.2.2.1 Carrier leakage for CA (2UL CA) |
CR revised to R5-192571 |
Samsung | 38.905 15.1.0 CR#96 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-191990 | TP analysis for FR1 6.4A.2.3.1 In-band emissions for CA (2UL CA) |
CR revised to R5-192572 |
Samsung | 38.905 15.1.0 CR#97 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-191991 | TP analysis for FR1 6.5A.2.2.1 Spectrum emission mask for CA (2UL CA) |
CR revised to R5-192573 |
Samsung | 38.905 15.1.0 CR#98 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-191992 | TP analysis for FR1 6.5A.2.4.1.1 NR ACLR for CA (2UL CA) |
CR revised to R5-192404 |
Samsung | 38.905 15.1.0 CR#99 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-191993 | TP analysis for FR1 6.5A.2.4.2.1 UTRA ACLR for CA (2UL CA) |
CR revised to R5-192405 |
Samsung | 38.905 15.1.0 CR#100 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-191994 | TP analysis for FR1 6.5A.3.1.1 General spurious emissions for CA (2UL CA) |
CR revised to R5-192574 |
Samsung | 38.905 15.1.0 CR#101 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-191995 | TP analysis for FR1 6.5A.3.2.1 Spurious emissions for UE co-existence for CA (2UL CA) |
CR revised to R5-192575 |
Samsung | 38.905 15.1.0 CR#102 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-191996 | TP analysis for FR1 6.5A.4.1 Transmit intermodulation for CA (2UL CA) |
CR revised to R5-192406 |
Samsung | 38.905 15.1.0 CR#103 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-192002 | Adding test case 7.4B.1 to 38.905 | CR | Huawei, Hisilicon | 38.905 15.1.0 CR#104 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192003 | Adding test case 7.4B.2 to 38.905 | CR | Huawei, Hisilicon | 38.905 15.1.0 CR#105 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192007 | Adding test case 6.2B.1.1 to 38.905 | CR | Huawei, Hisilicon | 38.905 15.1.0 CR#106 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192008 | Adding test case 6.2B.1.2 to 38.905 | CR | Huawei, Hisilicon | 38.905 15.1.0 CR#107 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192009 | Adding test case 6.2B.1.3 to 38.905 | CR | Huawei, Hisilicon | 38.905 15.1.0 CR#108 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192023 | Add Tp analysis sttatements for MIMO tests |
CR revised to R5-192582 |
Huawei, Hisilicon | 38.905 15.1.0 CR#109 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-192025 | TP analysis of FR1 time alignment error for UL MIMO | CR | China Unicom | 38.521-1 15.1.0 CR#308 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
withdrawn | [WTS] [JSN] |
| R5-192054 | Update of TP analysis of FR1 6.3.1 Minimum Output Power |
CR revised to R5-192410 |
Huawei, HiSilicon | 38.905 15.1.0 CR#110 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-192056 | Addition of TP analysis for EN-DC 6.2B.4.1.1 Configured transmitted power Intra-band contigous |
CR revised to R5-192691 |
Huawei, HiSilicon | 38.905 15.1.0 CR#111 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-192058 | Addition of TP analysis for EN-DC 6.2B.4.1.2 Configured transmitted power Intra-band non-contigous |
CR revised to R5-192692 |
Huawei, HiSilicon | 38.905 15.1.0 CR#112 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-192060 | Addition of TP analysis for EN-DC 6.2B.4.1.3 Configured transmitted power inter-band within FR1 |
CR revised to R5-192444 |
Huawei, HiSilicon | 38.905 15.1.0 CR#113 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-192189 | Introduction of new section for Tp analysis of Tx spurious |
CR revised to R5-192687 |
NTT DOCOMO, INC. | 38.905 15.1.0 CR#114 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-192200 | TP_analysis_38.905_6.5B.3_TX_SpurEmission |
CR revised to R5-192624 |
Qualcomm UK Ltd | 38.905 15.1.0 CR#115 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-192239 | TP analysis of FR1 time alignment error for UL MIMO | CR | China Unicom | 38.905 15.1.0 CR#116 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192401 | Addition of TP analysis of FR1 6.2.4 Configured transmitted power |
CR revision of R5-191674 |
Huawei, HiSilicon | 38.905 15.1.0 CR#851 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192404 | TP analysis for FR1 6.5A.2.4.1.1 NR ACLR for CA (2UL CA) |
CR revision of R5-191992 |
Samsung | 38.905 15.1.0 CR#991 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192405 | TP analysis for FR1 6.5A.2.4.2.1 UTRA ACLR for CA (2UL CA) |
CR revision of R5-191993 |
Samsung | 38.905 15.1.0 CR#1001 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192406 | TP analysis for FR1 6.5A.4.1 Transmit intermodulation for CA (2UL CA) |
CR revision of R5-191996 |
Samsung | 38.905 15.1.0 CR#1031 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192410 | Update of TP analysis of FR1 6.3.1 Minimum Output Power |
CR revision of R5-192054 |
Huawei, HiSilicon | 38.905 15.1.0 CR#1101 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192444 | Addition of TP analysis for EN-DC 6.2B.4.1.3 Configured transmitted power inter-band within FR1 |
CR revision of R5-192060 |
Huawei, HiSilicon | 38.905 15.1.0 CR#1131 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192449 | Adding FR2 test case 6.3.4.3 to 38.905 |
CR revision of R5-191335 |
Ericsson | 38.905 15.1.0 CR#801 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192546 | Test Point analysis for FR1 6.3.3.6 SRS time mask |
CR revision of R5-191528 |
MTCC | 38.905 15.1.0 CR#821 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192568 | TP analysis for FR1 6.4A.2.1.1 Error Vector Magnitude for CA (2UL CA) |
CR revision of R5-191988 |
Samsung | 38.905 15.1.0 CR#951 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192569 | TP analysis for FR1 6.4A.1.1 Frequency error for CA (2UL CA) |
CR revision of R5-191987 |
Samsung | 38.905 15.1.0 CR#941 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192571 | TP analysis for FR1 6.4A.2.2.1 Carrier leakage for CA (2UL CA) |
CR revision of R5-191989 |
Samsung | 38.905 15.1.0 CR#961 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192572 | TP analysis for FR1 6.4A.2.3.1 In-band emissions for CA (2UL CA) |
CR revision of R5-191990 |
Samsung | 38.905 15.1.0 CR#971 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192573 | TP analysis for FR1 6.5A.2.2.1 Spectrum emission mask for CA (2UL CA) |
CR revision of R5-191991 |
Samsung | 38.905 15.1.0 CR#981 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192574 | TP analysis for FR1 6.5A.3.1.1 General spurious emissions for CA (2UL CA) |
CR revision of R5-191994 |
Samsung | 38.905 15.1.0 CR#1011 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192575 | TP analysis for FR1 6.5A.3.2.1 Spurious emissions for UE co-existence for CA (2UL CA) |
CR revision of R5-191995 |
Samsung | 38.905 15.1.0 CR#1021 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192582 | Add Tp analysis sttatements for MIMO tests |
CR revision of R5-192023 |
Huawei, Hisilicon | 38.905 15.1.0 CR#1091 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192599 | Update of TP analysis of FR1 6.2.1 MOP |
CR revision of R5-191672 |
Huawei, HiSilicon | 38.905 15.1.0 CR#841 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192624 | TP_analysis_38.905_6.5B.3_TX_SpurEmission |
CR revision of R5-192200 |
Qualcomm UK Ltd | 38.905 15.1.0 CR#1151 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192647 | Addition of Test Point analysis of FR2 6.3.4.4 Aggregate power tolerance |
CR revision of R5-191860 |
LG Electronics | 38.905 15.1.0 CR#921 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192684 | TP analysis for FR1 Rx 7.9A.1 Spurious Emission for 2DL CA |
CR revision of R5-191072 |
CMCC | 38.905 15.1.0 CR#731 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192687 | Introduction of new section for Tp analysis of Tx spurious |
CR revision of R5-192189 revised to R5-192846 |
NTT DOCOMO, INC. | 38.905 15.1.0 CR#1141 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
revised | [WTS] [JSN] |
| R5-192691 | Addition of TP analysis for EN-DC 6.2B.4.1.1 Configured transmitted power Intra-band contigous |
CR revision of R5-192056 |
Huawei, HiSilicon | 38.905 15.1.0 CR#1111 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192692 | Addition of TP analysis for EN-DC 6.2B.4.1.2 Configured transmitted power Intra-band non-contigous |
CR revision of R5-192058 |
Huawei, HiSilicon | 38.905 15.1.0 CR#1121 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
| R5-192846 | Introduction of new section for Tp analysis of Tx spurious |
CR revision of R5-192687 |
NTT DOCOMO, INC. | 38.905 15.1.0 CR#1142 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-82 AI: 5.3.8.16 |
agreed | [WTS] [JSN] |
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