Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-210084 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_7A_n3A |
CR revised to R5-211774 |
Nokia, Nokia Shanghai Bell, Ericsson | 38.905 16.6.0 CR#337 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
revised | [WTS] [JSN] |
| R5-210085 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n3A |
CR revised to R5-211775 |
Nokia, Nokia Shanghai Bell, Ericsson | 38.905 16.6.0 CR#338 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
revised | [WTS] [JSN] |
| R5-210086 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n1A |
CR revised to R5-211776 |
Nokia, Nokia Shanghai Bell, Ericsson | 38.905 16.6.0 CR#339 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
revised | [WTS] [JSN] |
| R5-210916 | Addition of TP analysis for CA_n28A-n41A in Tx Spurious Emision cases | CR | Huawei, Hisilicon | 38.905 16.6.0 CR#357 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
withdrawn | [WTS] [JSN] |
| R5-210962 | Spur emission TP analysis R16 DC_2A_n41A |
CR revised to R5-211777 |
Qualcomm Korea, Ericsson | 38.905 16.6.0 CR#361 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
revised | [WTS] [JSN] |
| R5-210963 | Spur emission TP analysis R16 DC_5A_n2A | CR | Qualcomm Korea | 38.905 16.6.0 CR#362 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
agreed | [WTS] [JSN] |
| R5-210980 | Spur emission TP analysis R16 DC_13A_n2A |
CR revised to R5-211778 |
Qualcomm Korea | 38.905 16.6.0 CR#363 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
revised | [WTS] [JSN] |
| R5-210981 | Spur emission TP analysis R16 DC_48A_n5A |
CR revised to R5-211779 |
Qualcomm Korea | 38.905 16.6.0 CR#364 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
revised | [WTS] [JSN] |
| R5-210982 | Spur emission TP analysis R16 DC_48A_n66A |
CR revised to R5-211780 |
Qualcomm Korea | 38.905 16.6.0 CR#365 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
revised | [WTS] [JSN] |
| R5-210985 | Spur emission TP analysis R16 DC_66A_n41A |
CR revised to R5-211781 |
Qualcomm Korea, Ericsson | 38.905 16.6.0 CR#366 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
revised | [WTS] [JSN] |
| R5-211242 | Reference sensitivity TP analysis for DC_1A-28A_n3A |
CR revised to R5-211906 |
Ericsson | 38.905 16.6.0 CR#390 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
revised | [WTS] [JSN] |
| R5-211243 | Reference sensitivity analysis for DC_3A-7A_n1A |
CR revised to R5-211907 |
Ericsson | 38.905 16.6.0 CR#391 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
revised | [WTS] [JSN] |
| R5-211244 | Reference sensitivity TP analysis for DC_7A-20A_n1A |
CR revised to R5-211908 |
Ericsson | 38.905 16.6.0 CR#392 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
revised | [WTS] [JSN] |
| R5-211245 | Reference sensitivity TP analysis for DC_7A-28A_n3A |
CR revised to R5-211909 |
Ericsson | 38.905 16.6.0 CR#393 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
revised | [WTS] [JSN] |
| R5-211774 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_7A_n3A |
CR revision of R5-210084 |
Nokia, Nokia Shanghai Bell, Ericsson | 38.905 16.6.0 CR#3371 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
agreed | [WTS] [JSN] |
| R5-211775 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n3A |
CR revision of R5-210085 |
Nokia, Nokia Shanghai Bell, Ericsson | 38.905 16.6.0 CR#3381 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
agreed | [WTS] [JSN] |
| R5-211776 | Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n1A |
CR revision of R5-210086 |
Nokia, Nokia Shanghai Bell, Ericsson | 38.905 16.6.0 CR#3391 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
agreed | [WTS] [JSN] |
| R5-211777 | Spur emission TP analysis R16 DC_2A_n41A |
CR revision of R5-210962 |
Qualcomm Korea, Ericsson | 38.905 16.6.0 CR#3611 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
agreed | [WTS] [JSN] |
| R5-211778 | Spur emission TP analysis R16 DC_13A_n2A |
CR revision of R5-210980 |
Qualcomm Korea | 38.905 16.6.0 CR#3631 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
agreed | [WTS] [JSN] |
| R5-211779 | Spur emission TP analysis R16 DC_48A_n5A |
CR revision of R5-210981 |
Qualcomm Korea, Ericsson | 38.905 16.6.0 CR#3641 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
agreed | [WTS] [JSN] |
| R5-211780 | Spur emission TP analysis R16 DC_48A_n66A |
CR revision of R5-210982 |
Qualcomm Korea | 38.905 16.6.0 CR#3651 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
agreed | [WTS] [JSN] |
| R5-211781 | Spur emission TP analysis R16 DC_66A_n41A |
CR revision of R5-210985 |
Qualcomm Korea, Ericsson | 38.905 16.6.0 CR#3661 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
agreed | [WTS] [JSN] |
| R5-211906 | Reference sensitivity TP analysis for DC_1A-28A_n3A |
CR revision of R5-211242 |
Ericsson | 38.905 16.6.0 CR#3901 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
agreed | [WTS] [JSN] |
| R5-211907 | Reference sensitivity analysis for DC_3A-7A_n1A |
CR revision of R5-211243 |
Ericsson | 38.905 16.6.0 CR#3911 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
agreed | [WTS] [JSN] |
| R5-211908 | Reference sensitivity TP analysis for DC_7A-20A_n1A |
CR revision of R5-211244 |
Ericsson | 38.905 16.6.0 CR#3921 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
agreed | [WTS] [JSN] |
| R5-211909 | Reference sensitivity TP analysis for DC_7A-28A_n3A |
CR revision of R5-211245 |
Ericsson | 38.905 16.6.0 CR#3931 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-16 |
R5-90-e AI: 5.3.7. |
agreed | [WTS] [JSN] |
26 documents (0.35132598876953 seconds)