Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-214315 | Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_40A_n1A | CR | Ericsson | 38.905 17.1.0 CR#465 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
agreed | [WTS] [JSN] |
| R5-214316 | Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_40A_n78A | CR | Ericsson | 38.905 17.1.0 CR#466 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
agreed | [WTS] [JSN] |
| R5-215217 | Update of TP analysis for general spurious emissions for DC_3A_n41A |
CR revised to R5-216017 |
Huawei, HiSilicon | 38.905 17.1.0 CR#477 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
revised | [WTS] [JSN] |
| R5-215218 | Update of TP analysis for general spurious emissions for DC_8A_n41A | CR | Huawei, HiSilicon | 38.905 17.1.0 CR#478 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
withdrawn | [WTS] [JSN] |
| R5-215219 | Update of TP analysis for general spurious emissions for DC_12A_n78A | CR | Huawei, HiSilicon | 38.905 17.1.0 CR#479 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
agreed | [WTS] [JSN] |
| R5-215220 | Update of TP analysis for general spurious emissions for DC_28A_n3A | CR | Huawei, HiSilicon | 38.905 17.1.0 CR#480 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
agreed | [WTS] [JSN] |
| R5-215221 | Update of TP analysis for general spurious emissions for DC_39A_n41A |
CR revised to R5-216018 |
Huawei, HiSilicon | 38.905 17.1.0 CR#481 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
revised | [WTS] [JSN] |
| R5-215222 | Update of TP analysis for general spurious emissions for DC_40A_n41A |
CR revised to R5-216019 |
Huawei, HiSilicon | 38.905 17.1.0 CR#482 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
revised | [WTS] [JSN] |
| R5-215516 | Update_TP_analysis for Rel_16_DC_14A_n66A |
CR revised to R5-216064 |
Qualcomm Austria RFFE GmbH | 38.905 17.1.0 CR#500 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
revised | [WTS] [JSN] |
| R5-215543 | Update_TP_analysis for Rel_16_DC_14A_n2A | CR | Qualcomm Austria RFFE GmbH | 38.905 17.1.0 CR#502 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
agreed | [WTS] [JSN] |
| R5-215545 | Update_TP_analysis for Rel_16_DC_13A_n2A | CR | Qualcomm Austria RFFE GmbH | 38.905 17.1.0 CR#503 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
agreed | [WTS] [JSN] |
| R5-215669 | TP analysis for ref sensitivity DC_48A_n66A |
CR revised to R5-216109 |
Qualcomm Austria RFFE GmbH | 38.905 17.1.0 CR#506 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
revised | [WTS] [JSN] |
| R5-215801 | Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n41A |
CR revised to R5-216020 |
Keysight technologies UK Ltd, Ericsson, Huawei, HiSIlicon | 38.905 17.1.0 CR#507 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
revised | [WTS] [JSN] |
| R5-216017 | Update of TP analysis for general spurious emissions for DC_3A_n41A |
CR revision of R5-215217 |
Huawei, HiSilicon | 38.905 17.1.0 CR#4771 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
agreed | [WTS] [JSN] |
| R5-216018 | Update of TP analysis for general spurious emissions for DC_39A_n41A |
CR revision of R5-215221 |
Huawei, HiSilicon | 38.905 17.1.0 CR#4811 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
agreed | [WTS] [JSN] |
| R5-216019 | Update of TP analysis for general spurious emissions for DC_40A_n41A |
CR revision of R5-215222 |
Huawei, HiSilicon | 38.905 17.1.0 CR#4821 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
agreed | [WTS] [JSN] |
| R5-216020 | Update of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n41A |
CR revision of R5-215801 |
Keysight technologies UK Ltd, Ericsson, Huawei, HiSIlicon | 38.905 17.1.0 CR#5071 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
agreed | [WTS] [JSN] |
| R5-216064 | Update_TP_analysis for Rel_16_DC_14A_n66A |
CR revision of R5-215516 |
Qualcomm Austria RFFE GmbH | 38.905 17.1.0 CR#5001 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
agreed | [WTS] [JSN] |
| R5-216109 | TP analysis for ref sensitivity DC_48A_n66A |
CR revision of R5-215669 |
Qualcomm Austria RFFE GmbH | 38.905 17.1.0 CR#5061 catF | NR_CADC_NR_LTE_DC_R16-UEConTest | Rel-17 |
R5-92-e AI: 5.3.6. |
agreed | [WTS] [JSN] |
19 documents (0.33136916160583 seconds)