Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-193783 | Addition of default configuration in Annex H |
CR revised to R5-195017 |
Huawei, HiSilicon | 38.533 15.0.0 CR#129 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.9.5 |
revised | [WTS] [JSN] |
| R5-194328 | Additional of new reference used in RRM test spec | CR | Bureau Veritas | 38.533 15.0.0 CR#153 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.9.5 |
agreed | [WTS] [JSN] |
| R5-194329 | Correction of reference spec number in RRM spec | CR | Bureau Veritas | 38.533 15.0.0 CR#154 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.9.5 |
agreed | [WTS] [JSN] |
| R5-194330 | Updated to cell configuration mapping table for RRM tests |
CR revised to R5-195037 |
Bureau Veritas, Huawei, Hisilicon, Qualcomm Finland RFFE Oy, Ericsson | 38.533 15.0.0 CR#155 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.9.5 |
revised | [WTS] [JSN] |
| R5-194443 | Update of FR1 Test tolerance and uncertainties in AnnexF |
CR revised to R5-195185 |
Huawei, HiSilicon | 38.533 15.0.0 CR#158 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.9.5 |
revised | [WTS] [JSN] |
| R5-194542 | Correction of default message content for RRM in Annex H |
CR revised to R5-195040 |
Ericsson | 38.533 15.0.0 CR#166 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.9.5 |
revised | [WTS] [JSN] |
| R5-194574 | Test tolerance and measurement uncertainty in Annex F for Inter-Freq measurement test cases |
CR revised to R5-195016 |
Ericsson | 38.533 15.0.0 CR#198 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.9.5 |
revised | [WTS] [JSN] |
| R5-195016 | Test tolerance and measurement uncertainty in Annex F for Inter-Freq measurement test cases |
CR revision of R5-194574 |
Ericsson | 38.533 15.0.0 CR#1981 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.9.5 |
agreed | [WTS] [JSN] |
| R5-195017 | Addition of default configuration in Annex H |
CR revision of R5-193783 |
Huawei, HiSilicon | 38.533 15.0.0 CR#1291 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.9.5 |
agreed | [WTS] [JSN] |
| R5-195037 | Updated to cell configuration mapping table for RRM tests |
CR revision of R5-194330 |
Bureau Veritas, Huawei, Hisilicon, Qualcomm Finland RFFE Oy, Ericsson | 38.533 15.0.0 CR#1551 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.9.5 |
agreed | [WTS] [JSN] |
| R5-195040 | Correction of default message content for RRM in Annex H |
CR revision of R5-194542 |
Ericsson | 38.533 15.0.0 CR#1661 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.9.5 |
agreed | [WTS] [JSN] |
| R5-195185 | Update of FR1 Test tolerance and uncertainties in AnnexF |
CR revision of R5-194443 |
Huawei, HiSilicon | 38.533 15.0.0 CR#1581 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.9.5 |
agreed | [WTS] [JSN] |
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