Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-197812 | Addition of 5.2.2.1.3_1 2Rx FDD PDSCH mapping Type B |
CR revised to R5-199382 |
Huawei, HiSilicon, Bureau Veritas | 38.521-4 16.1.0 CR#129 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
revised | [WTS] [JSN] |
| R5-197825 | Addition of NR test case 5.2.3.1.2_1-FDD type A CSI-RS overlap 4x4 MIMO |
CR revised to R5-199383 |
Huawei, HiSilicon, Bureau Veritas | 38.521-4 16.1.0 CR#130 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
revised | [WTS] [JSN] |
| R5-197826 | Addition of NR test case 5.2.3.1.3_1-FDD type B 2x4 MIMO |
CR revised to R5-199414 |
Huawei, HiSilicon, Bureau Veritas | 38.521-4 16.1.0 CR#131 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
revised | [WTS] [JSN] |
| R5-197827 | Addition of NR test case 5.2.3.2.2_1-TDD type A CSI-RS overlap 2x4 MIMO |
CR revised to R5-199415 |
Huawei, HiSilicon, Bureau Veritas | 38.521-4 16.1.0 CR#132 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
revised | [WTS] [JSN] |
| R5-197828 | Addition of NR test case 5.2.3.2.3_1-TDD type B 2x4 MIMO |
CR revised to R5-199416 |
Huawei, HiSilicon, Bureau Veritas | 38.521-4 16.1.0 CR#133 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
revised | [WTS] [JSN] |
| R5-197829 | Addition of NR test case 6.2.3.1.1.1-FDD periodical CQI |
CR revised to R5-199384 |
Huawei, HiSilicon, Bureau Veritas | 38.521-4 16.1.0 CR#134 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
revised | [WTS] [JSN] |
| R5-197830 | Addition of NR test case 6.2.3.2.1.1-TDD periodical CQI |
CR revised to R5-199417 |
Huawei, HiSilicon, Bureau Veritas | 38.521-4 16.1.0 CR#135 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
revised | [WTS] [JSN] |
| R5-197831 | Addition of NR test case 6.4.2.1_1-FDD RI reporting |
CR revised to R5-199385 |
Huawei, HiSilicon, Bureau Veritas | 38.521-4 16.1.0 CR#136 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
revised | [WTS] [JSN] |
| R5-198243 | Adding new test case 6.2.3.1.2.1, 4Rx FDD FR1 periodic wideband CQI reporting under fading conditions for both SA and NSA |
CR revised to R5-199386 |
Ericsson | 38.521-4 16.1.0 CR#137 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
revised | [WTS] [JSN] |
| R5-198244 | Adding new test case 6.2.3.1.2.2, 4Rx FDD FR1 aperiodic subband CQI reporting under fading conditions for both SA and NSA |
CR revised to R5-199418 |
Ericsson | 38.521-4 16.1.0 CR#138 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
revised | [WTS] [JSN] |
| R5-198245 | Adding new test case 6.2.3.2.2.1, 4Rx TDD FR1 periodic wideband CQI reporting under fading conditions for both SA and NSA |
CR revised to R5-199419 |
Ericsson | 38.521-4 16.1.0 CR#139 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
revised | [WTS] [JSN] |
| R5-198247 | Adding new test case 6.2.3.2.2.2, 4Rx TDD FR1 aperiodic subband CQI reporting under fading conditions for both SA and NSA |
CR revised to R5-199420 |
Ericsson | 38.521-4 16.1.0 CR#140 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
revised | [WTS] [JSN] |
| R5-198281 | Update to FR1 4Rx FDD PDSCH Type A Demodulation performance | CR | LG Electronics | 38.521-4 16.1.0 CR#142 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-198374 | Clarification on PDCP SDU size for SDR SA Demod test case |
CR revised to R5-199525 |
Qualcomm Finland RFFE Oy | 38.521-4 16.1.0 CR#148 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
revised | [WTS] [JSN] |
| R5-198375 | Update to starting MCS index for CQI reporting test cases |
CR revised to R5-199387 |
Qualcomm Finland RFFE Oy | 38.521-4 16.1.0 CR#149 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
revised | [WTS] [JSN] |
| R5-198407 | Correction to 2Rx FDD FR1 periodic CQI reporting under AWGN conditions for both SA and NSA | CR | Anritsu | 38.521-4 16.1.0 CR#152 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-198408 | Correction to 2Rx and 4Rx TDD FR1 Single PMI with 4Tx Type1 - SinglePanel codebook for both SA and NSA | CR | Anritsu | 38.521-4 16.1.0 CR#153 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-198409 | Correction to Sections 5.2 and 5.3 | CR | Anritsu | 38.521-4 16.1.0 CR#154 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-198410 | Correction to chapter 5 and 6 to be aligned with core spec |
CR revised to R5-199421 |
Anritsu | 38.521-4 16.1.0 CR#155 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
revised | [WTS] [JSN] |
| R5-198411 | Editorial correction to CSI reporting tests |
CR revised to R5-199422 |
Anritsu | 38.521-4 16.1.0 CR#156 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
revised | [WTS] [JSN] |
| R5-198793 | Update to RI Reporting Accuracy test | CR | Qualcomm Japan Inc | 38.521-4 16.1.0 CR#163 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
withdrawn | [WTS] [JSN] |
| R5-199079 | Adding new test case 6.2.3.1.2.1, 4Rx FDD FR1 periodic wideband CQI reporting under fading conditions for both SA and NSA |
CR revision of R5-199386 |
Ericsson | 38.521-4 16.1.0 CR#1372 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-199382 | Addition of 5.2.2.1.3_1 2Rx FDD PDSCH mapping Type B |
CR revision of R5-197812 |
Huawei, HiSilicon, Bureau Veritas | 38.521-4 16.1.0 CR#1291 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-199383 | Addition of NR test case 5.2.3.1.2_1-FDD type A CSI-RS overlap 4x4 MIMO |
CR revision of R5-197825 |
Huawei, HiSilicon, Bureau Veritas | 38.521-4 16.1.0 CR#1301 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-199384 | Addition of NR test case 6.2.3.1.1.1-FDD periodical CQI |
CR revision of R5-197829 |
Huawei, HiSilicon, Bureau Veritas | 38.521-4 16.1.0 CR#1341 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-199385 | Addition of NR test case 6.4.2.1_1-FDD RI reporting |
CR revision of R5-197831 |
Huawei, HiSilicon, Bureau Veritas | 38.521-4 16.1.0 CR#1361 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-199386 | Adding new test case 6.2.3.1.2.1, 4Rx FDD FR1 periodic wideband CQI reporting under fading conditions for both SA and NSA |
CR revision of R5-198243 revised to R5-199079 |
Ericsson | 38.521-4 16.1.0 CR#1371 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
revised | [WTS] [JSN] |
| R5-199387 | Update to starting MCS index for CQI reporting test cases |
CR revision of R5-198375 |
Qualcomm Finland RFFE Oy | 38.521-4 16.1.0 CR#1491 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-199414 | Addition of NR test case 5.2.3.1.3_1-FDD type B 2x4 MIMO |
CR revision of R5-197826 |
Huawei, HiSilicon, Bureau Veritas | 38.521-4 16.1.0 CR#1311 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-199415 | Addition of NR test case 5.2.3.2.2_1-TDD type A CSI-RS overlap 2x4 MIMO |
CR revision of R5-197827 |
Huawei, HiSilicon, Bureau Veritas | 38.521-4 16.1.0 CR#1321 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-199416 | Addition of NR test case 5.2.3.2.3_1-TDD type B 2x4 MIMO |
CR revision of R5-197828 |
Huawei, HiSilicon, Bureau Veritas | 38.521-4 16.1.0 CR#1331 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-199417 | Addition of NR test case 6.2.3.2.1.1-TDD periodical CQI |
CR revision of R5-197830 |
Huawei, HiSilicon, Bureau Veritas | 38.521-4 16.1.0 CR#1351 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-199418 | Adding new test case 6.2.3.1.2.2, 4Rx FDD FR1 aperiodic subband CQI reporting under fading conditions for both SA and NSA |
CR revision of R5-198244 |
Ericsson | 38.521-4 16.1.0 CR#1381 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-199419 | Adding new test case 6.2.3.2.2.1, 4Rx TDD FR1 periodic wideband CQI reporting under fading conditions for both SA and NSA |
CR revision of R5-198245 |
Ericsson | 38.521-4 16.1.0 CR#1391 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-199420 | Adding new test case 6.2.3.2.2.2, 4Rx TDD FR1 aperiodic subband CQI reporting under fading conditions for both SA and NSA |
CR revision of R5-198247 |
Ericsson | 38.521-4 16.1.0 CR#1401 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-199421 | Correction to chapter 5 and 6 to be aligned with core spec |
CR revision of R5-198410 |
Anritsu | 38.521-4 16.1.0 CR#1551 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-199422 | Editorial correction to CSI reporting tests |
CR revision of R5-198411 |
Anritsu | 38.521-4 16.1.0 CR#1561 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
| R5-199525 | Clarification on PDCP SDU size for SDR SA Demod test case |
CR revision of R5-198374 |
Qualcomm Finland RFFE Oy | 38.521-4 16.1.0 CR#1481 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.7.1 |
agreed | [WTS] [JSN] |
38 documents (0.35163712501526 seconds)