Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-252797 | Test Tolerance analysis for intra frequency NR cell reselection for Satellite Access test 14.1.1 and 14.1.2. |
CR revised to R5-253543 |
Qualcomm Innovation Center Inc | 38.903 18.6.0 CR#1018 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-107 AI: 5.3.5.7 |
revised | [WTS] [JSN] |
| R5-252798 | Test Tolerance analysis for intra frequency NR cell reselection for Satellite Access test 14.1.3 and 14.1.4. |
CR revised to R5-253544 |
Qualcomm Innovation Center Inc | 38.903 18.6.0 CR#1019 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-107 AI: 5.3.5.7 |
revised | [WTS] [JSN] |
| R5-252799 | Test Tolerance analysis for inter frequency NR cell reselection for Satellite Access test 14.1.5. | CR | Qualcomm Innovation Center Inc | 38.903 18.6.0 CR#1020 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-107 AI: 5.3.5.7 |
agreed | [WTS] [JSN] |
| R5-252800 | Test Tolerance analysis for inter frequency NR cell reselection for UE configured with enhanced requirements for Satellite Access test 14.1.6. |
CR revised to R5-253545 |
Qualcomm Innovation Center Inc | 38.903 18.6.0 CR#1021 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-107 AI: 5.3.5.7 |
revised | [WTS] [JSN] |
| R5-252801 | Test Tolerance analysis for time based and Location based measurement initiation to inter frequency NR cell reselection for Satellite Access test 14.1.7 and 14.1.8. |
CR revised to R5-253626 |
Qualcomm Innovation Center Inc | 38.903 18.6.0 CR#1022 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-107 AI: 5.3.5.7 |
revised | [WTS] [JSN] |
| R5-252831 | Test Tolerance for NR NTN Beam failure detection and link recovery test cases |
CR revised to R5-253618 |
Keysight Technologies | 38.903 18.6.0 CR#1023 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-107 AI: 5.3.5.7 |
revised | [WTS] [JSN] |
| R5-252967 | Addition of TT analysis for NR-NTN test 14.2.2.1.1 | CR | Qualcomm Korea | 38.903 18.6.0 CR#1030 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-107 AI: 5.3.5.7 |
agreed | [WTS] [JSN] |
| R5-252968 | Addition of TT analysis for NR-NTN test 14.2.2.1.2 | CR | Qualcomm Korea | 38.903 18.6.0 CR#1031 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-107 AI: 5.3.5.7 |
agreed | [WTS] [JSN] |
| R5-252969 | Addition of TT analysis for NR-NTN test 14.4.3.1.1 | CR | Qualcomm Korea | 38.903 18.6.0 CR#1032 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-107 AI: 5.3.5.7 |
agreed | [WTS] [JSN] |
| R5-252970 | Addition of TT analysis for NR-NTN test 14.4.3.2.1 | CR | Qualcomm Korea | 38.903 18.6.0 CR#1033 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-107 AI: 5.3.5.7 |
agreed | [WTS] [JSN] |
| R5-252971 | Addition of TT analysis for NR-NTN test 14.4.4.1 | CR | Qualcomm Korea | 38.903 18.6.0 CR#1034 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-107 AI: 5.3.5.7 |
agreed | [WTS] [JSN] |
| R5-252972 | Addition of TT analysis for NR-NTN test 14.3.1.1 | CR | Qualcomm Korea | 38.903 18.6.0 CR#1035 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-107 AI: 5.3.5.7 |
agreed | [WTS] [JSN] |
| R5-252973 | Addition of TT analysis for NR-NTN test 14.3.2.1 | CR | Qualcomm Korea | 38.903 18.6.0 CR#1036 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-107 AI: 5.3.5.7 |
agreed | [WTS] [JSN] |
| R5-253543 | Test Tolerance analysis for intra frequency NR cell reselection for Satellite Access test 14.1.1 and 14.1.2. |
CR revision of R5-252797 |
Qualcomm Innovation Center Inc | 38.903 18.6.0 CR#10181 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-107 AI: 5.3.5.7 |
agreed | [WTS] [JSN] |
| R5-253544 | Test Tolerance analysis for intra frequency NR cell reselection for Satellite Access test 14.1.3 and 14.1.4. |
CR revision of R5-252798 |
Qualcomm Innovation Center Inc | 38.903 18.6.0 CR#10191 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-107 AI: 5.3.5.7 |
agreed | [WTS] [JSN] |
| R5-253545 | Test Tolerance analysis for inter frequency NR cell reselection for UE configured with enhanced requirements for Satellite Access test 14.1.6. |
CR revision of R5-252800 |
Qualcomm Innovation Center Inc | 38.903 18.6.0 CR#10211 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-107 AI: 5.3.5.7 |
agreed | [WTS] [JSN] |
| R5-253618 | Test Tolerance for NR NTN Beam failure detection and link recovery test cases |
CR revision of R5-252831 |
Keysight Technologies | 38.903 18.6.0 CR#10231 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-107 AI: 5.3.5.7 |
agreed | [WTS] [JSN] |
| R5-253626 | Test Tolerance analysis for time based and Location based measurement initiation to inter frequency NR cell reselection for Satellite Access test 14.1.7 and 14.1.8. |
CR revision of R5-252801 |
Qualcomm Innovation Center Inc | 38.903 18.6.0 CR#10221 catF | NR_NTN_solutions_plus_CT-UEConTest | Rel-18 |
R5-107 AI: 5.3.5.7 |
agreed | [WTS] [JSN] |
18 documents (0.3823070526123 seconds)