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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-197738 | Updates of test procedure for MOP and co-existence tests |
CR revised to R5-199518 |
NTT DOCOMO, INC. | 38.521-3 16.1.0 CR#467 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
revised | [WTS] [JSN] |
| R5-197936 | Update of 6.2B.1.1 MOP for Intra-Band contiguous EN-DC |
CR revised to R5-199514 |
Huawei, HiSilicon | 38.521-3 16.1.0 CR#469 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
revised | [WTS] [JSN] |
| R5-197937 | Update of 6.2B.1.3 MOP for Inter-Band contiguous within FR1 | CR | Huawei, HiSilicon | 38.521-3 16.1.0 CR#470 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
withdrawn | [WTS] [JSN] |
| R5-197939 | Update of 6.2B.1.4 MOP for Inter-Band EN-DC including FR2 |
CR revised to R5-199377 |
Huawei, HiSilicon, Intertek | 38.521-3 16.1.0 CR#471 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
revised | [WTS] [JSN] |
| R5-197940 | Addition of 6.2B.1.5 MOP for Inter-Band EN-DC including FR1 and FR2 | CR | Huawei, HiSilicon | 38.521-3 16.1.0 CR#472 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-197941 | Update of 6.2B.4.1.1 configured transmitted power for Intra-Band contiguous EN-DC |
CR revised to R5-199512 |
Huawei, HiSilicon | 38.521-3 16.1.0 CR#473 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
revised | [WTS] [JSN] |
| R5-197942 | Update of 6.2B.4.1.3 configured transmitted power for Inter-Band EN-DC within FR1 |
CR revised to R5-199513 |
Huawei, HiSilicon | 38.521-3 16.1.0 CR#474 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
revised | [WTS] [JSN] |
| R5-197944 | Update of 6.2B.4.1.4 configured transmitted power for Inter-Band EN-DC including FR2 | CR | Huawei, HiSilicon | 38.521-3 16.1.0 CR#475 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-197945 | Update of 6.2B.4.1.5 configured transmitted power for Inter-Band EN-DC including FR1 and FR2 | CR | Huawei, HiSilicon | 38.521-3 16.1.0 CR#476 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-198038 | Updates to test case 6.2B.2.1, UE Maximum Output Power reduction for Intra-Band Contiguous EN-DC |
CR revised to R5-199342 |
Ericsson | 38.521-3 16.1.0 CR#483 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
revised | [WTS] [JSN] |
| R5-198039 | Updates to test case 6.2B.2.2, UE Maximum Output Power reduction for Intra-Band Non-Contiguous EN-DC |
CR revised to R5-199508 |
Ericsson | 38.521-3 16.1.0 CR#484 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
revised | [WTS] [JSN] |
| R5-198104 | Editorial correction of test description in TC 6.4B.2.3.3 |
CR revised to R5-199343 |
TTA, Anritsu | 38.521-3 16.1.0 CR#487 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
revised | [WTS] [JSN] |
| R5-198172 | Updating incorrect note in test procedure | CR | Ericsson | 38.521-3 16.1.0 CR#488 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-198280 | Introduction of New TC 6.4B.2.1.4 EVM Equalizer Flatness for intra-band contiguous EN-DC | CR | LG Electronics | 38.521-3 16.1.0 CR#490 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-198402 | Correction to minimum output power for intra-band EN-DC |
CR revised to R5-199498 |
Anritsu | 38.521-3 16.1.0 CR#500 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
revised | [WTS] [JSN] |
| R5-198403 | Correction to TC 6.4B.1.3 test description | CR | Anritsu | 38.521-3 16.1.0 CR#501 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-198404 | Correction to Additional Spurious Emissions for Inter-band EN-DC within FR1 | CR | Anritsu | 38.521-3 16.1.0 CR#502 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-198405 | Editorial correction to In-band Emissions for inter-band EN-DC within FR1 | CR | Anritsu | 38.521-3 16.1.0 CR#503 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
withdrawn | [WTS] [JSN] |
| R5-198406 | Correction to Spurious emission band UE co-existence for Inter-band within FR1 | CR | Anritsu | 38.521-3 16.1.0 CR#504 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-198424 | Update of TC 6.2B.1.4_1.1.2 | CR | Intertek | 38.521-3 16.1.0 CR#505 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
withdrawn | [WTS] [JSN] |
| R5-198426 | Update of TC 6.2B.1.4_1.2.2 | CR | Intertek | 38.521-3 16.1.0 CR#506 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
withdrawn | [WTS] [JSN] |
| R5-198428 | Update of TC 6.2B.1.4_1.3.2 | CR | Intertek | 38.521-3 16.1.0 CR#507 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
withdrawn | [WTS] [JSN] |
| R5-198537 | Updates to 6.2B.3.1, UE A-MPR for Intra-band Contig EN-DC | CR | Ericsson | 38.521-3 16.1.0 CR#509 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-198538 | Updates to 6.2B.3.2, UE A-MPR for Intra-band Non-Contig EN-DC | CR | Ericsson | 38.521-3 16.1.0 CR#510 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-198539 | Updates to 6.5B.2.1.2, Additional spectrum emission mask for intra-band Contig EN-DC | CR | Ericsson | 38.521-3 16.1.0 CR#511 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-198658 | Update on FR2 Spurious Test in 38.521-3 | CR | Anritsu | 38.521-3 16.1.0 CR#514 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
withdrawn | [WTS] [JSN] |
| R5-198686 | Corrections on delta TIB for EN-DC configurations in 38.521-3 | CR | ZTE Corporation | 38.521-3 16.1.0 CR#516 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-198719 | Update for 6.5B.3.1.1 General spurious emissions for intra-band contiguous EN-DC |
CR revised to R5-199519 |
Qualcomm communications-France | 38.521-3 16.1.0 CR#517 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
revised | [WTS] [JSN] |
| R5-198720 | Update for 6.5B.3.2.1 General spurious emissions for Intra-band non-contiguous EN-DC |
CR revised to R5-199520 |
Qualcomm communications-France | 38.521-3 16.1.0 CR#518 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
revised | [WTS] [JSN] |
| R5-198724 | Correction of E-UTRA Mid channel bandwidth |
CR revised to R5-199543 |
ROHDE & SCHWARZ | 38.521-3 16.1.0 CR#520 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
revised | [WTS] [JSN] |
| R5-198725 | Editorial correction to test case 6.5B.4.3 | CR | ROHDE & SCHWARZ | 38.521-3 16.1.0 CR#521 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
withdrawn | [WTS] [JSN] |
| R5-198734 | Update for 6.5B.3.3.1 General spurious emissions for Inter-band EN-DC within FR1 | CR | Qualcomm communications-France | 38.521-3 16.1.0 CR#523 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-198735 | Update for 6.5B.3.3.2 Spurious emission band UE co-existence for Inter-band within FR1 | CR | Qualcomm communications-France | 38.521-3 16.1.0 CR#524 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-198741 | Update for Additional Spurious Emissions for Intra-band contiguous EN-DC |
CR revised to R5-199521 |
Qualcomm communications-France | 38.521-3 16.1.0 CR#527 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
revised | [WTS] [JSN] |
| R5-198791 | TS 38.521-3 updates across section 6 test cases |
CR revised to R5-199522 |
Qualcomm Japan Inc | 38.521-3 16.1.0 CR#530 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
revised | [WTS] [JSN] |
| R5-199342 | Updates to test case 6.2B.2.1, UE Maximum Output Power reduction for Intra-Band Contiguous EN-DC |
CR revision of R5-198038 |
Ericsson | 38.521-3 16.1.0 CR#4831 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-199343 | Editorial correction of test description in TC 6.4B.2.3.3 |
CR revision of R5-198104 |
TTA, Anritsu | 38.521-3 16.1.0 CR#4871 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-199377 | Update of 6.2B.1.4 MOP for Inter-Band EN-DC including FR2 |
CR revision of R5-197939 |
Huawei, HiSilicon, Intertek | 38.521-3 16.1.0 CR#4711 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-199498 | Correction to minimum output power for intra-band EN-DC |
CR revision of R5-198402 |
Anritsu | 38.521-3 16.1.0 CR#5001 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-199508 | Updates to test case 6.2B.2.2, UE Maximum Output Power reduction for Intra-Band Non-Contiguous EN-DC |
CR revision of R5-198039 |
Ericsson | 38.521-3 16.1.0 CR#4841 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-199512 | Update of 6.2B.4.1.1 configured transmitted power for Intra-Band contiguous EN-DC |
CR revision of R5-197941 |
Huawei, HiSilicon | 38.521-3 16.1.0 CR#4731 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
withdrawn | [WTS] [JSN] |
| R5-199513 | Update of 6.2B.4.1.3 configured transmitted power for Inter-Band EN-DC within FR1 |
CR revision of R5-197942 |
Huawei, HiSilicon | 38.521-3 16.1.0 CR#4741 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
withdrawn | [WTS] [JSN] |
| R5-199514 | Update of 6.2B.1.1 MOP for Intra-Band contiguous EN-DC |
CR revision of R5-197936 |
Huawei, HiSilicon | 38.521-3 16.1.0 CR#4691 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-199518 | Updates of test procedure for MOP and co-existence tests |
CR revision of R5-197738 |
NTT DOCOMO, INC. | 38.521-3 16.1.0 CR#4671 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-199519 | Update for 6.5B.3.1.1 General spurious emissions for intra-band contiguous EN-DC |
CR revision of R5-198719 |
Qualcomm communications-France | 38.521-3 16.1.0 CR#5171 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-199520 | Update for 6.5B.3.2.1 General spurious emissions for Intra-band non-contiguous EN-DC |
CR revision of R5-198720 |
Qualcomm communications-France | 38.521-3 16.1.0 CR#5181 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-199521 | Update for Additional Spurious Emissions for Intra-band contiguous EN-DC |
CR revision of R5-198741 |
Qualcomm communications-France | 38.521-3 16.1.0 CR#5271 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-199522 | TS 38.521-3 updates across section 6 test cases |
CR revision of R5-198791 |
Qualcomm Japan Inc | 38.521-3 16.1.0 CR#5301 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
| R5-199543 | Correction of E-UTRA Mid channel bandwidth |
CR revision of R5-198724 |
ROHDE & SCHWARZ | 38.521-3 16.1.0 CR#5201 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.6.1 |
agreed | [WTS] [JSN] |
49 documents (0.33148097991943 seconds)