Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-195691 Correction of test case numbering for UL CA CR NTT DOCOMO, INC. 38.521-3 16.0.0 CR#396 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 withdrawn [WTS] [JSN]
R5-195805 Update of UE A_MPR intra band contiguous EN DC test case in 6.2B.3.1 CR

revised to R5-197346

 Ericsson 38.521-3 16.0.0 CR#398 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-195806 Update of UE A_MPR intra band non contiguous EN DC test case in 6.2B.3.2 CR

revised to R5-197347

 Ericsson 38.521-3 16.0.0 CR#399 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-195807 Update of UE A_MPR inter band for EN DC test case in 6.2B.3.3 CR Ericsson 38.521-3 16.0.0 CR#400 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 withdrawn [WTS] [JSN]
R5-195808 Addition of test case 6.5B.2.1.2 Additional Spectrum emissions mask for intra band contiguous EN DC CR

revised to R5-197348

 Ericsson 38.521-3 16.0.0 CR#401 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-195809 Addition of test case 6.5B.2.2.2 Additional Spectrum emissions mask for intra band non contiguous EN DC CR

revised to R5-197349

 Ericsson 38.521-3 16.0.0 CR#402 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-195810 Addition of test case 6.5B.2.3.2 Additional Spectrum emissions mask for Inter band EN DC within FR1 CR

revised to R5-197350

 Ericsson 38.521-3 16.0.0 CR#403 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-195979 Spurious test case updates CR

revised to R5-197351

 Qualcomm Finland RFFE Oy 38.521-3 16.0.0 CR#405 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196064 Correction to ACLR inter-band EN-DC FR1 test case CR

revised to R5-197331

 Samsung R&D Institute UK 38.521-3 16.0.0 CR#406 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196160 Clean up test cases 6.4B.2.2 Transmit Modulation Quality CR KTL 38.521-3 16.0.0 CR#407 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-196200 Correction of uplink power setting for NSA transmitter test cases CR CAICT, Anritsu, Huawei 38.521-3 16.0.0 CR#409 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-196241 Correction to FR1 Transmit OFF Power CR Anritsu 38.521-3 16.0.0 CR#411 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-196243 Correction to NR RB allocations in FR1 maximum output power CR Anritsu 38.521-3 16.0.0 CR#413 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 withdrawn [WTS] [JSN]
R5-196244 Correction to FR1 PRACH time mask for EN-DC CR

revised to R5-197352

 Anritsu, Rohde&Schwarz 38.521-3 16.0.0 CR#414 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196281 Correction of NR uplink RB allocation for FR1 Inter-Band EN-DC MOP CR

revised to R5-197353

 CMCC, vivo, Anritsu 38.521-3 16.0.0 CR#415 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196438 Update of 6.2B.1.1 MOP for Intra-band contiguous EN-DC CR

revised to R5-197549

 Huawei, HiSilicon 38.521-3 16.0.0 CR#418 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196439 Update of 6.2B.1.2 MOP for Intra-band non-contiguous EN-DC CR

revised to R5-197550

 Huawei, HiSilicon 38.521-3 16.0.0 CR#419 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196440 Editorial update of EN-DC 6.5B.3.3.2 SE co-existence for inter-band within FR1 CR Huawei, HiSilicon 38.521-3 16.0.0 CR#420 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 withdrawn [WTS] [JSN]
R5-196457 Update for 6.5B.3.1.2 Spurious emission band UE co-existence for intra-band contiguous EN-DC CR

revised to R5-197354

 Qualcomm Wireless GmbH 38.521-3 16.0.0 CR#423 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196458 Update for 6.5B.3.3.2 Spurious emission band UE co-existence for Inter-band within FR1 CR

revised to R5-197553

 Qualcomm Wireless GmbH 38.521-3 16.0.0 CR#424 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196591 Updates to 6.2B.2.4, UE Maximum Output Power reduction for Inter-Band EN-DC including FR2 CR Ericsson 38.521-1 16.0.0 CR#519 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 withdrawn [WTS] [JSN]
R5-196622 Removing test points for CP-OFDM PI/2 BPSK in test case 6.5B.2.1.1 CR Ericsson 38.521-1 16.0.0 CR#520 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 withdrawn [WTS] [JSN]
R5-196707 Updates to 6.2B.2.1, UE Maximum Output Power reduction for Intra-Band Contiguous EN-DC CR

revised to R5-197554

 Ericsson 38.521-3 16.0.0 CR#434 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196714 Update of TC 6.3B.1.1 Minimum Output Power for intra-band contiguous EN-DC CR

revised to R5-197555

 SGS Wireless 38.521-3 16.0.0 CR#435 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196715 Update of TC 6.3B.1.2 Minimum output power for intra-band non-contiguous EN-DC CR

revised to R5-197556

 SGS Wireless 38.521-3 16.0.0 CR#436 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196716 Update of TC 6.3B.2.1 Transmit OFF Power for intra-band contiguous EN-DC CR

revised to R5-197340

 SGS Wireless 38.521-3 16.0.0 CR#437 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196717 Update of TC 6.3B.2.2 Transmit OFF Power for intra-band non-contiguous EN-DC CR

revised to R5-197341

 SGS Wireless 38.521-3 16.0.0 CR#438 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196718 Update of TC 6.3B.2.3 Transmit OFF Power for inter-band EN-DC within FR1 CR SGS Wireless 38.521-3 16.0.0 CR#439 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 withdrawn [WTS] [JSN]
R5-196719 Update of TC 6.4B.1.1 Frequency error for Intra-band contiguous EN-DC CR

revised to R5-197342

 SGS Wireless 38.521-3 16.0.0 CR#440 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196720 Update of TC 6.4B.1.2 Frequency error for Intra-band non-contiguous EN-DC CR

revised to R5-197557

 SGS Wireless 38.521-3 16.0.0 CR#441 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196721 Update of TC 6.4B.1.3 Frequency error for Inter-band EN-DC within FR1 CR

revised to R5-197343

 SGS Wireless 38.521-3 16.0.0 CR#442 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196798 Corrections on UE maximum output power for DC in 38.521-3 CR ZTE Corporation 38.521-3 15.3.0 CR#444 catF 5GS_NR_LTE-UEConTest Rel-15 R5-84

AI: 5.3.5.6.1

 withdrawn [WTS] [JSN]
R5-196800 Corrections on Minimum conformance requirements of A-MPR for DC_(n)71AA in 38.521-3 CR ZTE Corporation 38.521-3 15.3.0 CR#445 catF 5GS_NR_LTE-UEConTest Rel-15 R5-84

AI: 5.3.5.6.1

 withdrawn [WTS] [JSN]
R5-196842 Editorial corrections to Additional Spurious Emission test case CR ROHDE & SCHWARZ 38.521-3 16.0.0 CR#449 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-196846 Correction to PRACH time mask test cases CR ROHDE & SCHWARZ 38.521-3 16.0.0 CR#451 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 withdrawn [WTS] [JSN]
R5-196848 Correction to EN-DC Spurious Emissions CR

revised to R5-197558

 ROHDE & SCHWARZ 38.521-3 16.0.0 CR#452 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196887 Update OBW EN-DC intraband non-contiguous CR Keysight Technologies UK Ltd 38.521-3 16.0.0 CR#453 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 withdrawn [WTS] [JSN]
R5-196888 Update SEM EN-DC intraband non-contiguous CR Keysight Technologies UK Ltd 38.521-3 16.0.0 CR#454 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 withdrawn [WTS] [JSN]
R5-196889 Update ACLR EN-DC intraband non-contiguous CR Keysight Technologies UK Ltd 38.521-3 16.0.0 CR#455 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 withdrawn [WTS] [JSN]
R5-196890 Update OBW EN-DC FR2 test case CR

revised to R5-197345

 Keysight Technologies UK Ltd 38.521-3 16.0.0 CR#456 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196914 TS 38.521-3 updates across section 6 test cases CR

revised to R5-197542

 Qualcomm Technologies Netherlands B.V. 38.521-3 16.0.0 CR#458 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196940 Updates to 6.2B.2.4, UE Maximum Output Power reduction for Inter-Band EN-DC including FR2 CR

revised to R5-197559

 Ericsson 38.521-3 16.0.0 CR#460 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196941 Removing test points for CP-OFDM PI/2 BPSK in test case 6.5B.2.1.1 CR

revised to R5-197560

 Ericsson 38.521-1 16.0.0 CR#530 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-196946 Corrections on UE maximum output power for DC in 38.521-3 CR ZTE Corporation 38.521-3 16.0.0 CR#461 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-196947 Corrections on Minimum conformance requirements of A-MPR in 38.521-3 CR

revised to R5-197332

 ZTE Corporation 38.521-3 16.0.0 CR#462 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 revised [WTS] [JSN]
R5-197331 Correction to ACLR inter-band EN-DC FR1 test case CR

revision of R5-196064

 Samsung R&D Institute UK 38.521-3 16.0.0 CR#4061 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197332 Corrections on Minimum conformance requirements of A-MPR in 38.521-3 CR

revision of R5-196947

 ZTE Corporation 38.521-3 16.0.0 CR#4621 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197340 Update of TC 6.3B.2.1 Transmit OFF Power for intra-band contiguous EN-DC CR

revision of R5-196716

 SGS Wireless 38.521-3 16.0.0 CR#4371 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197341 Update of TC 6.3B.2.2 Transmit OFF Power for intra-band non-contiguous EN-DC CR

revision of R5-196717

 SGS Wireless 38.521-3 16.0.0 CR#4381 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197342 Update of TC 6.4B.1.1 Frequency error for Intra-band contiguous EN-DC CR

revision of R5-196719

 SGS Wireless 38.521-3 16.0.0 CR#4401 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197343 Update of TC 6.4B.1.3 Frequency error for Inter-band EN-DC within FR1 CR

revision of R5-196721

 SGS Wireless 38.521-3 16.0.0 CR#4421 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197345 Update OBW EN-DC FR2 test case CR

revision of R5-196890

 Keysight Technologies UK Ltd 38.521-3 16.0.0 CR#4561 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197346 Update of UE A_MPR intra band contiguous EN DC test case in 6.2B.3.1 CR

revision of R5-195805

 Ericsson 38.521-3 16.0.0 CR#3981 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197347 Update of UE A_MPR intra band non contiguous EN DC test case in 6.2B.3.2 CR

revision of R5-195806

 Ericsson 38.521-3 16.0.0 CR#3991 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197348 Addition of test case 6.5B.2.1.2 Additional Spectrum emissions mask for intra band contiguous EN DC CR

revision of R5-195808

 Ericsson 38.521-3 16.0.0 CR#4011 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197349 Addition of test case 6.5B.2.2.2 Additional Spectrum emissions mask for intra band non contiguous EN DC CR

revision of R5-195809

 Ericsson 38.521-3 16.0.0 CR#4021 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197350 Addition of test case 6.5B.2.3.2 Additional Spectrum emissions mask for Inter band EN DC within FR1 CR

revision of R5-195810

 Ericsson 38.521-3 16.0.0 CR#4031 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197351 Spurious test case updates CR

revision of R5-195979

 Qualcomm Finland RFFE Oy 38.521-3 16.0.0 CR#4051 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197352 Correction to FR1 PRACH time mask for EN-DC CR

revision of R5-196244

 Anritsu, Rohde&Schwarz 38.521-3 16.0.0 CR#4141 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197353 Correction of NR uplink RB allocation for FR1 Inter-Band EN-DC MOP CR

revision of R5-196281

 CMCC, vivo, Anritsu 38.521-3 16.0.0 CR#4151 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197354 Update for 6.5B.3.1.2 Spurious emission band UE co-existence for intra-band contiguous EN-DC CR

revision of R5-196457

 Qualcomm Wireless GmbH 38.521-3 16.0.0 CR#4231 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197542 TS 38.521-3 updates across section 6 test cases CR

revision of R5-196914

 Qualcomm Technologies Netherlands B.V. 38.521-3 16.0.0 CR#4581 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197549 Update of 6.2B.1.1 MOP for Intra-band contiguous EN-DC CR

revision of R5-196438

 Huawei, HiSilicon 38.521-3 16.0.0 CR#4181 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197550 Update of 6.2B.1.2 MOP for Intra-band non-contiguous EN-DC CR

revision of R5-196439

 Huawei, HiSilicon 38.521-3 16.0.0 CR#4191 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197553 Update for 6.5B.3.3.2 Spurious emission band UE co-existence for Inter-band within FR1 CR

revision of R5-196458

 Qualcomm Wireless GmbH 38.521-3 16.0.0 CR#4241 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197554 Updates to 6.2B.2.1, UE Maximum Output Power reduction for Intra-Band Contiguous EN-DC CR

revision of R5-196707

 Ericsson 38.521-3 16.0.0 CR#4341 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197555 Update of TC 6.3B.1.1 Minimum Output Power for intra-band contiguous EN-DC CR

revision of R5-196714

 SGS Wireless 38.521-3 16.0.0 CR#4351 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197556 Update of TC 6.3B.1.2 Minimum output power for intra-band non-contiguous EN-DC CR

revision of R5-196715

 SGS Wireless 38.521-3 16.0.0 CR#4361 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197557 Update of TC 6.4B.1.2 Frequency error for Intra-band non-contiguous EN-DC CR

revision of R5-196720

 SGS Wireless 38.521-3 16.0.0 CR#4411 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197558 Correction to EN-DC Spurious Emissions CR

revision of R5-196848

 ROHDE & SCHWARZ 38.521-3 16.0.0 CR#4521 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197559 Updates to 6.2B.2.4, UE Maximum Output Power reduction for Inter-Band EN-DC including FR2 CR

revision of R5-196940

 Ericsson 38.521-3 16.0.0 CR#4601 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]
R5-197560 Removing test points for CP-OFDM PI/2 BPSK in test case 6.5B.2.1.1 CR

revision of R5-196941

 Ericsson 38.521-1 16.0.0 CR#7001 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 withdrawn [WTS] [JSN]
R5-197633 Removing test points for CP-OFDM PI/2 BPSK in test case 6.5B.2.1.1 CR Ericsson 38.521-3 16.0.0 CR#465 catF 5GS_NR_LTE-UEConTest Rel-16 R5-84

AI: 5.3.5.6.1

 agreed [WTS] [JSN]

73 documents (0.35223293304443 seconds)