Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-195688 | On FR2 spherical coverage MU | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-195689 | On UL-MIMO core requirements |
discussion revised to R5-197344 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
| R5-195690 | On TRx applicability rule |
discussion revised to R5-197599 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
| R5-195736 | WF update for Rel-16 NR CADC band combinations WI |
discussion revised to R5-197600 |
CMCC, Ericsson, Huawei, Qualcomm, R&S | NR_CADC_NR_LTE_DC_R16-UEConTest |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
| R5-195737 | Solution to expanding R15 38521-3 WP with placeholders |
discussion revised to R5-197439 |
CMCC, Ericsson, Qualcomm | NR_CADC_NR_LTE_DC_R16-UEConTest |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
| R5-195912 | DUT repositioning and its relations with QoQZ for OTA measurement | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-195915 | DUT turnover MU for spurious region | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-195916 | Uncertainty of the absolute gain of the calibration antenna at spurious region | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-195918 | Mismatch MU for spurious emission measurement | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-195991 | FR2 NR TT Way Forward update | discussion | Telecom Italia | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
| R5-195994 | FR1 TT Way Forward update | discussion | Telecom Italia | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
| R5-196028 | FR2 SNR range for RRM and Demodulation | discussion | ANRITSU LTD |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |||
| R5-196065 | Considerations on FR2 SRS time mask for UL-MIMO TTs | discussion | Samsung R&D Institute UK | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196068 | Considerations on FR2 absolute power control method |
discussion revised to R5-197382 |
Samsung R&D Institute UK | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
| R5-196071 | Considerations on FR2 beam correspondence test case | discussion | Samsung R&D Institute UK | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196282 | On fading profile power uncertainty | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
withdrawn | [WTS] [JSN] | ||
| R5-196360 | AP#82.22 Assumption for the CDF curve |
discussion revised to R5-197495 |
Apple Europe Limited | Rel-15 |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
| R5-196361 | AP#83.22 Maximum difference in direction between the beam peak at NTC when compared to ETC | discussion | Apple Europe Limited | Rel-15 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196362 | Discussion on AP#83.21 Spurious emission testing region |
discussion revised to R5-197496 |
Qualcomm Finland RFFE Oy | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
| R5-196367 | Consideration of FR2 Test Tolerance values for Spherical Coverage | discussion | Apple Europe Limited | Rel-15 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196393 | On FR1 TT for CA receiver tests | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196394 | Handling of FR1 DL CA and EN-DC in TRx tests | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196399 | FR2 environmental condition on Carrier Leakage | discussion | Apple Europe Limited | Rel-15 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196401 | FR2 environmental condition on Beam Correspondence | discussion | Apple Europe Limited | Rel-15 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196410 | Discussion on test configuration of FR1 Rx CA test cases |
discussion revised to R5-197602 |
Huawei, HiSilicon | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
| R5-196412 | Discussion on MOP testing principle when lack of proper test point | discussion | Huawei, HiSilicon, CMCC | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
| R5-196423 | Discussion on FR1 UL power calculation with open loop power control |
discussion revised to R5-197490 |
Huawei, HiSilicon | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
| R5-196437 | Discussion on EN-DC MOP for intra-band configurations |
discussion revised to R5-197548 |
Huawei, HiSilicon | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
| R5-196527 | NSA TT Way Forward update |
discussion revised to R5-197603 |
Telecom Italia | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
| R5-196533 | Discussion on FR1 SDR test procedure |
discussion revised to R5-197511 |
QUALCOMM Europe Inc. - Italy | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
| R5-196537 | Discussion on restructuring of min test time tables for Demod tests in Annex G | discussion | QUALCOMM Europe Inc. - Italy, Ericsson | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
| R5-196540 | Discussion on handling 4Rx for Demod test cases |
discussion revised to R5-197509 |
QUALCOMM Europe Inc. - Italy | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
| R5-196542 | Discussion on UE positioning procedure for FR2 Demod tests |
discussion revised to R5-197552 |
QUALCOMM Europe Inc. - Italy | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
| R5-196572 | Impact of noise for FR2 ACLR | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196573 | Impact of noise for FR2 OBW |
discussion revised to R5-197626 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
| R5-196576 | Discussion on common aspect of FR2 CA testing |
discussion revised to R5-197383 |
Sporton International Inc., Huawei, HiSilicon, ECIT | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
| R5-196578 | DUT turnover MU for spherical coverage |
discussion revised to R5-197604 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
| R5-196582 | On FR2 Demodulation MU | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196585 | On the measurement grid MU for spurious emission | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
withdrawn | [WTS] [JSN] | ||
| R5-196589 | Testability of FR2 ACS and IBB | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196780 | Discussion on the relation between MPR and SEM/ACLR test cases |
discussion revised to R5-197586 |
Ericsson | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
| R5-196781 | Discussion on test coverage for EN-DC configured power test case | discussion | Ericsson | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
withdrawn | [WTS] [JSN] | ||
| R5-196789 | Discussion on MU, TT and UE fail rate for EIRP CDF | discussion | Ericsson | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196791 | Discussion on the practical outcome of Multiband relaxation in certification |
discussion revised to R5-197627 |
Ericsson | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
| R5-196814 | On TRP Grids for Spurious Emissions QoQZ | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196815 | Proposed Text for Spurious Emissions QoQZ Procedure | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196816 | On the Re-Positioning Concept for NR FR2 Test Cases | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196817 | Wireless Cable Mode Procedure for Demodulation Tests |
discussion revised to R5-197506 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
| R5-196818 | Min. Isolation Requirements for Wireless Cable Mode | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196819 | AoA Direction Search for RRM Setups | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196820 | On MU Elements for Demodulation test cases | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196821 | On the MU Term ‘Influence of TRP’ for spurious emissions | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196851 | Discussion on FR2 Demod MU contributors | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196852 | On the SNR for FR2 TRx test cases | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196853 | Discussion on testability of ACS and IBB |
discussion revised to R5-197497 |
Rohde & Schwarz, Anritsu, Keysight Technologies | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
| R5-196854 | Discussion on Quiet Zone sizes and measurement uncertainties |
discussion revised to R5-197498 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
| R5-196868 | On noise impact |
discussion revised to R5-197499 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
| R5-196869 | FR2 OBW measurement uncertainty | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196870 | Discussion paper on FR2 ACS and IIB | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-196871 | FR2 Tx spherical coverage noise impact | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
withdrawn | [WTS] [JSN] | ||
| R5-196872 | FR2 ACLR noise impact | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
withdrawn | [WTS] [JSN] | ||
| R5-196878 | Discussion on RRM FR2 test setups |
discussion revised to R5-197583 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
| R5-197344 | On UL-MIMO core requirements |
discussion revision of R5-195689 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-197382 | Considerations on FR2 absolute power control method |
discussion revision of R5-196068 |
Samsung R&D Institute UK | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-197383 | Discussion on common aspect of FR2 CA testing |
discussion revision of R5-196576 |
Sporton International Inc., Huawei, HiSilicon, ECIT | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
| R5-197439 | Solution to expanding R15 38521-3 WP with placeholders |
discussion revision of R5-195737 |
CMCC, Ericsson, Qualcomm | NR_CADC_NR_LTE_DC_R16-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-197469 | Summary of the main changes to TS 38.522 | discussion | CMCC | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-197490 | Discussion on FR1 UL power calculation with open loop power control |
discussion revision of R5-196423 |
Huawei, HiSilicon | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
| R5-197495 | AP#82.22 Assumption for the CDF curve |
discussion revision of R5-196360 |
Apple Europe Limited | Rel-15 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-197496 | Discussion on AP#83.21 Spurious emission testing region |
discussion revision of R5-196362 |
Qualcomm Finland RFFE Oy | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
| R5-197497 | Discussion on testability of ACS and IBB |
discussion revision of R5-196853 |
Rohde & Schwarz, Anritsu, Keysight Technologies | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-197498 | Discussion on Quiet Zone sizes and measurement uncertainties |
discussion revision of R5-196854 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-197499 | On noise impact |
discussion revision of R5-196868 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
| R5-197506 | Wireless Cable Mode Procedure for Demodulation Tests |
discussion revision of R5-196817 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-197509 | Discussion on handling 4Rx for Demod test cases |
discussion revision of R5-196540 |
QUALCOMM Europe Inc. - Italy | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
| R5-197511 | Discussion on FR1 SDR test procedure |
discussion revision of R5-196533 |
QUALCOMM Europe Inc. - Italy | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
| R5-197548 | Discussion on EN-DC MOP for intra-band configurations |
discussion revision of R5-196437 |
Huawei, HiSilicon | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
| R5-197552 | Discussion on UE positioning procedure for FR2 Demod tests |
discussion revision of R5-196542 |
QUALCOMM Europe Inc. - Italy | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
| R5-197583 | Discussion on RRM FR2 test setups |
discussion revision of R5-196878 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
| R5-197586 | Discussion on the relation between MPR and SEM/ACLR test cases |
discussion revision of R5-196780 |
Ericsson | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-197588 | WF on TX spherical coverage noise impact | discussion | Keysight Technologies, Anritsu, Rohde&Schwarz, Ericsson | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-197599 | On TRx applicability rule |
discussion revision of R5-195690 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-197600 | WF update for Rel-16 NR CADC band combinations WI |
discussion revision of R5-195736 |
CMCC, Ericsson, Huawei, Qualcomm, R&S | NR_CADC_NR_LTE_DC_R16-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-197602 | Discussion on test configuration of FR1 Rx CA test cases |
discussion revision of R5-196410 |
Huawei, HiSilicon | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
| R5-197603 | NSA TT Way Forward update |
discussion revision of R5-196527 |
Telecom Italia | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
| R5-197604 | DUT turnover MU for spherical coverage |
discussion revision of R5-196578 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-197613 | FR2 Measurement Uncertainty (MU) / Test Tolerances (TT) Target Completion Update | discussion | PCTEST Engineering Lab | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-197626 | Impact of noise for FR2 OBW |
discussion revision of R5-196573 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
| R5-197627 | Discussion on the practical outcome of Multiband relaxation in certification |
discussion revision of R5-196791 |
Ericsson | 5GS_NR_LTE-UEConTest |
R5-84 AI: 5.3.5.17 |
noted | [WTS] [JSN] |
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