Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".

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tdoc Title Type / Revs Source Spec / CR S/WID Release Meeting Status Links
R5-193686 On Re-Repositioning Approach for Spurious Emission QoQZ Validation and Test Cases discussion

revised to R5-195122

Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-193687 On the MU Term ‘Influence of TRP’ for spurious emissions discussion

revised to R5-195123

Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-193688 On Frequency Regions and Applicable TRP Measurement Grids for Spurious Emissions discussion Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-193689 TRP Integration with Offset Feed Antennas for IFF System discussion Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-193706 Handling on Low PSD items discussion NTT DOCOMO, INC. 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-193747 Low PSD relaxation (Channel BW) discussion NTT DOCOMO, INC. 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-193748 FR2 ACLR absolute requirement discussion NTT DOCOMO, INC. 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-193750 MU and TT for FR2 CA discussion

revised to R5-195150

NTT DOCOMO, INC. 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-193825 Specification structure of FR2 NSA UL CA discussion

revised to R5-195161

NTT DOCOMO, INC. 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-193830 MU for sum of power discussion

revised to R5-195141

Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-193834 On the MU for EIRP spherical coverage discussion Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-193858 FR1 Uplink power window setting discussion ANRITSU LTD 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-193935 Discussion on method of FR2 absolute power setting discussion Huawei, Hisilicon 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-193936 Introduction of NR FR2 WP update discussion

revised to R5-195407

Huawei, Hisilicon 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194011 Discussion on 2H characteristics for FR2 spurious test set up considerations discussion QUALCOMM Europe Inc. - Spain 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-194012 Discussion on FR2 UL demod based OTA tests using single pol Rx TE discussion

revised to R5-195195

QUALCOMM Europe Inc. - Spain 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194017 More Perspectives on Technical Analysis of FR2 Test Tolerance values for Spherical Coverage discussion

revised to R5-195128

Apple Europe Limited Rel-15 R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194023 Consideration on MU contributions of Tx/Rx spurious emission discussion

revised to R5-195129

Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194024 Influence of the calibration antenna feed cable MU at spurious region discussion Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-194025 Mismatch MU at spurious region discussion

revised to R5-195130

Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194026 Network analyzer MU at spurious region discussion

revised to R5-195131

Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194028 Frequency boundary of MU table for spurious emissions discussion

revised to R5-195132

Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194029 DUT re-orientation during spurious emission test discussion Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-194062 On Multi-band relaxation discussion NTT DOCOMO, INC. 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

withdrawn [WTS] [JSN]
R5-194063 On FR1 TT (UL-MIMO, NSA, UL CA) discussion NTT DOCOMO, INC. 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-194064 Channel spacing for intra-band contiguous CA discussion

revised to R5-195408

NTT DOCOMO, INC. 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194085 Discussion on UE Power Level configuration in Blocking test cases in FR2 discussion Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-194106 FR2 environmental condition on Peak EIRP/EIS discussion

revised to R5-195401

Apple Europe Limited Rel-15 R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194122 NR FR2 WF on MB Relaxation discussion

revised to R5-195110

Apple Europe Limited Rel-15 R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194130 On ACLR measurement uncertainty discussion Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

withdrawn [WTS] [JSN]
R5-194131 On Spurious Emisssions MU Terms discussion Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

withdrawn [WTS] [JSN]
R5-194133 On noise impact discussion Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-194285 Discussion on TP for ACS for 2DL CA in FR1 discussion

revised to R5-194903

China Telecomunication Corp. 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194290 FR1 TT Way Forward update discussion

revised to R5-195192

Telecom Italia 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194291 FR2 NR TT Way Forward update discussion

revised to R5-195194

Telecom Italia 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194351 On the noise impact for FR2 priority 1 and 2 TRx TCs discussion Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-194352 On the minimum TRP assumption for FR2 ACLR MU discussion

revised to R5-195133

Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194353 On the noise impact to FR2 OBW discussion Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-194354 On FR2 UL CA MU discussion Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

withdrawn [WTS] [JSN]
R5-194360 Introduction of NR FR1 WP update discussion

revised to R5-195409

Huawei, HiSilicon 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194361 AP#82.22 Acceptable assumption for CDF curve discussion QUALCOMM Europe Inc. - Spain 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-194411 On test procedure of out-of-band blocking for inter-band EN-DC within FR1 discussion

revised to R5-195166

Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194451 Way Forward for 38.522 discussion

revised to R5-195402

CMCC 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194467 Discussion on TT and the impact on UE fail rate for EIRP CDF discussion Ericsson 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

withdrawn [WTS] [JSN]
R5-194475 Discussion on MPR and ACLR linkage discussion Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

withdrawn [WTS] [JSN]
R5-194596 On FR2 OTA ETC Testing discussion Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-194597 On Correlation of MU Components discussion Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-194623 On Correlation of MU contributors for EIRP and EIS spherical coverage discussion ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-194624 On mismatch uncertainty for ACLR discussion ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-194625 Discussion on testability of ACS and IBB discussion

revised to R5-195134

ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194626 MU analysis of TRP grids discussion ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-194627 On testability of Rx spurious emission test case discussion

revised to R5-195135

ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194675 FR2 environmental condition on Carrier Leakage and Beam Correspondence discussion Apple Europe Limited Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-194687 Discussion on minimum test time for PDSCH and PDCCH with more simulation results discussion

revised to R5-194978

Qualcomm Austria RFFE GmbH 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-194694 Discussion on FR2 Demod testing discussion Qualcomm Austria RFFE GmbH 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-194721 Discussion on TS 38.521-3 WP structure change for EN-DC FR2 Tx tests discussion Qualcomm communications-France 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-194903 Discussion on TP for ACS for 2DL CA in FR1 discussion

revision of R5-194285

China Telecomunication Corp. 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

agreed [WTS] [JSN]
R5-194978 Discussion on minimum test time for PDSCH and PDCCH with more simulation results discussion

revision of R5-194687

Qualcomm Austria RFFE GmbH 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195110 NR FR2 WF on MB Relaxation discussion

revision of R5-194122

Apple Europe Limited LTE_CA_Rel13-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195122 On Re-Repositioning Approach for Spurious Emission QoQZ Validation and Test Cases discussion

revision of R5-193686

Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195123 On the MU Term ‘Influence of TRP’ for spurious emissions discussion

revision of R5-193687

Keysight Technologies UK Ltd 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195128 More Perspectives on Technical Analysis of FR2 Test Tolerance values for Spherical Coverage discussion

revision of R5-194017

Apple Europe Limited Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195129 Consideration on MU contributions of Tx/Rx spurious emission discussion

revision of R5-194023

Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195130 Mismatch MU at spurious region discussion

revision of R5-194025

Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195131 Network analyzer MU at spurious region discussion

revision of R5-194026

Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195132 Frequency boundary of MU table for spurious emissions discussion

revision of R5-194028

Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195133 On the minimum TRP assumption for FR2 ACLR MU discussion

revision of R5-194352

Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195134 Discussion on testability of ACS and IBB discussion

revision of R5-194625

ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195135 On testability of Rx spurious emission test case discussion

revision of R5-194627

ROHDE & SCHWARZ 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195141 MU for sum of power discussion

revision of R5-193830

Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195150 MU and TT for FR2 CA discussion

revision of R5-193750

NTT DOCOMO, INC. 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195161 Specification structure of FR2 NSA UL CA discussion

revision of R5-193825

NTT DOCOMO, INC. 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195166 On test procedure of out-of-band blocking for inter-band EN-DC within FR1 discussion

revision of R5-194411

Anritsu 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

withdrawn [WTS] [JSN]
R5-195192 FR1 TT Way Forward update discussion

revision of R5-194290

Telecom Italia 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195193 FR2 Measurement Uncertainty (MU) / Test Tolerances (TT) Target Completion Update discussion

revised to R5-195414

PCTEST Engineering Lab 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

revised [WTS] [JSN]
R5-195194 FR2 NR TT Way Forward update discussion

revision of R5-194291

Telecom Italia 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195401 FR2 environmental condition on Peak EIRP/EIS discussion

revision of R5-194106

Apple Europe Limited Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195402 Way Forward for 38.522 discussion

revision of R5-194451

CMCC 5GS_NR_LTE-UEConTest R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195407 Introduction of NR FR2 WP update discussion

revision of R5-193936

Huawei, Hisilicon 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195408 Channel spacing for intra-band contiguous CA discussion

revision of R5-194064

NTT DOCOMO, INC. 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195409 Introduction of NR FR1 WP update discussion

revision of R5-194360

Huawei, HiSilicon 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]
R5-195414 FR2 Measurement Uncertainty (MU) / Test Tolerances (TT) Target Completion Update discussion

revision of R5-195193

PCTEST Engineering Lab 5GS_NR_LTE-UEConTest Rel-15 R5-83

AI: 5.3.5.17

noted [WTS] [JSN]

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