Please enter the search related information in the fields below. Partial information works, e.g. "SP-21
" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501
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tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
---|---|---|---|---|---|---|---|---|---|
R5-193686 | On Re-Repositioning Approach for Spurious Emission QoQZ Validation and Test Cases |
discussion revised to R5-195122 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
R5-193687 | On the MU Term ‘Influence of TRP’ for spurious emissions |
discussion revised to R5-195123 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
R5-193688 | On Frequency Regions and Applicable TRP Measurement Grids for Spurious Emissions | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-193689 | TRP Integration with Offset Feed Antennas for IFF System | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-193706 | Handling on Low PSD items | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-193747 | Low PSD relaxation (Channel BW) | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-193748 | FR2 ACLR absolute requirement | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-193750 | MU and TT for FR2 CA |
discussion revised to R5-195150 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
R5-193825 | Specification structure of FR2 NSA UL CA |
discussion revised to R5-195161 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
R5-193830 | MU for sum of power |
discussion revised to R5-195141 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
R5-193834 | On the MU for EIRP spherical coverage | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-193858 | FR1 Uplink power window setting | discussion | ANRITSU LTD | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-193935 | Discussion on method of FR2 absolute power setting | discussion | Huawei, Hisilicon | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-193936 | Introduction of NR FR2 WP update |
discussion revised to R5-195407 |
Huawei, Hisilicon | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
R5-194011 | Discussion on 2H characteristics for FR2 spurious test set up considerations | discussion | QUALCOMM Europe Inc. - Spain | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-194012 | Discussion on FR2 UL demod based OTA tests using single pol Rx TE |
discussion revised to R5-195195 |
QUALCOMM Europe Inc. - Spain | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
R5-194017 | More Perspectives on Technical Analysis of FR2 Test Tolerance values for Spherical Coverage |
discussion revised to R5-195128 |
Apple Europe Limited | Rel-15 |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
R5-194023 | Consideration on MU contributions of Tx/Rx spurious emission |
discussion revised to R5-195129 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
R5-194024 | Influence of the calibration antenna feed cable MU at spurious region | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-194025 | Mismatch MU at spurious region |
discussion revised to R5-195130 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
R5-194026 | Network analyzer MU at spurious region |
discussion revised to R5-195131 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
R5-194028 | Frequency boundary of MU table for spurious emissions |
discussion revised to R5-195132 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
R5-194029 | DUT re-orientation during spurious emission test | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-194062 | On Multi-band relaxation | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
withdrawn | [WTS] [JSN] | |
R5-194063 | On FR1 TT (UL-MIMO, NSA, UL CA) | discussion | NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-194064 | Channel spacing for intra-band contiguous CA |
discussion revised to R5-195408 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
R5-194085 | Discussion on UE Power Level configuration in Blocking test cases in FR2 | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-194106 | FR2 environmental condition on Peak EIRP/EIS |
discussion revised to R5-195401 |
Apple Europe Limited | Rel-15 |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
R5-194122 | NR FR2 WF on MB Relaxation |
discussion revised to R5-195110 |
Apple Europe Limited | Rel-15 |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
R5-194130 | On ACLR measurement uncertainty | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
withdrawn | [WTS] [JSN] | |
R5-194131 | On Spurious Emisssions MU Terms | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
withdrawn | [WTS] [JSN] | ||
R5-194133 | On noise impact | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-194285 | Discussion on TP for ACS for 2DL CA in FR1 |
discussion revised to R5-194903 |
China Telecomunication Corp. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
R5-194290 | FR1 TT Way Forward update |
discussion revised to R5-195192 |
Telecom Italia | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
R5-194291 | FR2 NR TT Way Forward update |
discussion revised to R5-195194 |
Telecom Italia | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
R5-194351 | On the noise impact for FR2 priority 1 and 2 TRx TCs | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-194352 | On the minimum TRP assumption for FR2 ACLR MU |
discussion revised to R5-195133 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
R5-194353 | On the noise impact to FR2 OBW | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-194354 | On FR2 UL CA MU | discussion | Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
withdrawn | [WTS] [JSN] | ||
R5-194360 | Introduction of NR FR1 WP update |
discussion revised to R5-195409 |
Huawei, HiSilicon | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
R5-194361 | AP#82.22 Acceptable assumption for CDF curve | discussion | QUALCOMM Europe Inc. - Spain | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-194411 | On test procedure of out-of-band blocking for inter-band EN-DC within FR1 |
discussion revised to R5-195166 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
R5-194451 | Way Forward for 38.522 |
discussion revised to R5-195402 |
CMCC | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
R5-194467 | Discussion on TT and the impact on UE fail rate for EIRP CDF | discussion | Ericsson | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
withdrawn | [WTS] [JSN] | |
R5-194475 | Discussion on MPR and ACLR linkage | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
withdrawn | [WTS] [JSN] | ||
R5-194596 | On FR2 OTA ETC Testing | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-194597 | On Correlation of MU Components | discussion | Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-194623 | On Correlation of MU contributors for EIRP and EIS spherical coverage | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-194624 | On mismatch uncertainty for ACLR | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-194625 | Discussion on testability of ACS and IBB |
discussion revised to R5-195134 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
R5-194626 | MU analysis of TRP grids | discussion | ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-194627 | On testability of Rx spurious emission test case |
discussion revised to R5-195135 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | ||
R5-194675 | FR2 environmental condition on Carrier Leakage and Beam Correspondence | discussion | Apple Europe Limited | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-194687 | Discussion on minimum test time for PDSCH and PDCCH with more simulation results |
discussion revised to R5-194978 |
Qualcomm Austria RFFE GmbH | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
R5-194694 | Discussion on FR2 Demod testing | discussion | Qualcomm Austria RFFE GmbH | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-194721 | Discussion on TS 38.521-3 WP structure change for EN-DC FR2 Tx tests | discussion | Qualcomm communications-France | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-194903 | Discussion on TP for ACS for 2DL CA in FR1 |
discussion revision of R5-194285 |
China Telecomunication Corp. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
agreed | [WTS] [JSN] | |
R5-194978 | Discussion on minimum test time for PDSCH and PDCCH with more simulation results |
discussion revision of R5-194687 |
Qualcomm Austria RFFE GmbH | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-195110 | NR FR2 WF on MB Relaxation |
discussion revision of R5-194122 |
Apple Europe Limited | LTE_CA_Rel13-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-195122 | On Re-Repositioning Approach for Spurious Emission QoQZ Validation and Test Cases |
discussion revision of R5-193686 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-195123 | On the MU Term ‘Influence of TRP’ for spurious emissions |
discussion revision of R5-193687 |
Keysight Technologies UK Ltd | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-195128 | More Perspectives on Technical Analysis of FR2 Test Tolerance values for Spherical Coverage |
discussion revision of R5-194017 |
Apple Europe Limited | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-195129 | Consideration on MU contributions of Tx/Rx spurious emission |
discussion revision of R5-194023 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-195130 | Mismatch MU at spurious region |
discussion revision of R5-194025 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-195131 | Network analyzer MU at spurious region |
discussion revision of R5-194026 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-195132 | Frequency boundary of MU table for spurious emissions |
discussion revision of R5-194028 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-195133 | On the minimum TRP assumption for FR2 ACLR MU |
discussion revision of R5-194352 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-195134 | Discussion on testability of ACS and IBB |
discussion revision of R5-194625 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-195135 | On testability of Rx spurious emission test case |
discussion revision of R5-194627 |
ROHDE & SCHWARZ | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-195141 | MU for sum of power |
discussion revision of R5-193830 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-195150 | MU and TT for FR2 CA |
discussion revision of R5-193750 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-195161 | Specification structure of FR2 NSA UL CA |
discussion revision of R5-193825 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-195166 | On test procedure of out-of-band blocking for inter-band EN-DC within FR1 |
discussion revision of R5-194411 |
Anritsu | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
withdrawn | [WTS] [JSN] | ||
R5-195192 | FR1 TT Way Forward update |
discussion revision of R5-194290 |
Telecom Italia | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-195193 | FR2 Measurement Uncertainty (MU) / Test Tolerances (TT) Target Completion Update |
discussion revised to R5-195414 |
PCTEST Engineering Lab | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
revised | [WTS] [JSN] | |
R5-195194 | FR2 NR TT Way Forward update |
discussion revision of R5-194291 |
Telecom Italia | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-195401 | FR2 environmental condition on Peak EIRP/EIS |
discussion revision of R5-194106 |
Apple Europe Limited | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-195402 | Way Forward for 38.522 |
discussion revision of R5-194451 |
CMCC | 5GS_NR_LTE-UEConTest |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | ||
R5-195407 | Introduction of NR FR2 WP update |
discussion revision of R5-193936 |
Huawei, Hisilicon | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-195408 | Channel spacing for intra-band contiguous CA |
discussion revision of R5-194064 |
NTT DOCOMO, INC. | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-195409 | Introduction of NR FR1 WP update |
discussion revision of R5-194360 |
Huawei, HiSilicon | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] | |
R5-195414 | FR2 Measurement Uncertainty (MU) / Test Tolerances (TT) Target Completion Update |
discussion revision of R5-195193 |
PCTEST Engineering Lab | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.17 |
noted | [WTS] [JSN] |
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