Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-195923 | New addition of TP analysis for MOP & MOP Spherical Coverage for UL CA in SA FR2 |
CR revised to R5-197589 |
Sporton International Inc., Huawei, HiSilicon, ECIT | 38.905 16.0.0 CR#168 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-195924 | New addition of TP analysis for Carrier leakage for UL CA in SA FR2 |
CR revised to R5-197590 |
Sporton International Inc. | 38.905 16.0.0 CR#169 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-195990 | Adding test case 6.5B.2.1.3 to 38.905 |
CR revised to R5-197591 |
Ericsson | 38.905 16.0.0 CR#170 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-196067 | Addition of TP analysis of FR2 6.3D.3.4 SRS time mask for UL-MIMO | CR | Samsung R&D Institute UK | 38.905 16.0.0 CR#171 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
withdrawn | [WTS] [JSN] |
| R5-196070 | Addition of TP analysis of FR2 6.3A.4.2.1 Absolute Power Control Tolerance for CA | CR | Samsung R&D Institute UK | 38.905 16.0.0 CR#172 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
withdrawn | [WTS] [JSN] |
| R5-196074 | Addition of TP analysis of FR2 6.6 Beam Correspondence |
CR revised to R5-197592 |
Samsung R&D Institute UK | 38.905 16.0.0 CR#173 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-196365 | Test Point analysis update for FR2 TxSpurious test case |
CR revised to R5-197593 |
Qualcomm Finland RFFE Oy | 38.905 16.0.0 CR#174 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-196404 | Addtion of TP analysis for FR1 MPR for CA |
CR revised to R5-197315 |
Huawei, HiSilicon | 38.905 16.0.0 CR#175 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-196407 | Addtion of TP analysis for FR1 ConfigTP for CA |
CR revised to R5-197317 |
Huawei, HiSilicon | 38.905 16.0.0 CR#176 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-196409 | Addition of TP analysis of FR1 Maximum input level for CA |
CR revised to R5-197594 |
Huawei, HiSilicon | 38.905 16.0.0 CR#177 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-196414 | Addition of TP analysis of FR1 6.4D.1 Frequency error for UL MIMO |
CR revised to R5-197595 |
Huawei, HiSilicon | 38.905 16.0.0 CR#178 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-196416 | Addition of TP analysis of FR1 6.4D.2.1 EVM for UL MIMO |
CR revised to R5-197320 |
Huawei, HiSilicon | 38.905 16.0.0 CR#179 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-196418 | Addition of TP analysis of FR1 6.4D.2.2 Carrier leakage for UL MIMO |
CR revised to R5-197322 |
Huawei, HiSilicon | 38.905 16.0.0 CR#180 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-196420 | Addition of TP analysis of FR1 6.4D.2.3 Inband emission for UL MIMO |
CR revised to R5-197323 |
Huawei, HiSilicon | 38.905 16.0.0 CR#181 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-196422 | Addition of TP analysis of FR1 6.4D.2.4 EVM equalizer spectrum flatness for UL MIMO |
CR revised to R5-197325 |
Huawei, HiSilicon | 38.905 16.0.0 CR#182 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-196430 | Addition of TP analysis of FR2 6.2A.2 MPR for 2 UL CA |
CR revised to R5-197596 |
Huawei, HiSilicon | 38.905 16.0.0 CR#183 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-196435 | Update of TP analysis of FR2 minimum output power to add UL MIMO | CR | Huawei, HiSilicon | 38.905 16.0.0 CR#184 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
| R5-196465 | Test Point analysis for Occupied bandwidth for 2UL CA in FR1 |
CR revised to R5-197326 |
LG Electronics | 38.905 16.0.0 CR#186 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-196491 | TP_analysis_38.905_7.3A._CA_ref_sensitivity |
CR revised to R5-197524 |
Qualcomm Wireless GmbH | 38.905 16.0.0 CR#187 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-196722 | Update of test points analysis for SA FR1 6.2.2 | CR | CAICT | 38.905 16.0.0 CR#188 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
withdrawn | [WTS] [JSN] |
| R5-196724 | Update of test points analysis for SA FR1 6.2.2 | CR | CAICT | 38.905 16.0.0 CR#189 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
withdrawn | [WTS] [JSN] |
| R5-196782 | Clarification of test point selection guidelines for MPR vs ACLR and SEM test cases | CR | Ericsson | 38.905 16.0.0 CR#190 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
withdrawn | [WTS] [JSN] |
| R5-196783 | Addition of TP analysis for FR2 AMPR with NS_201 |
CR revised to R5-197597 |
Ericsson | 38.905 16.0.0 CR#191 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-196797 | Updates of TP analysis for EN-DC MPR test case 6.2.B.2.1 |
CR revised to R5-197598 |
Ericsson | 38.905 16.0.0 CR#192 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-196859 | Update to FR2 spurious emission test point analysis | CR | ROHDE & SCHWARZ | 38.905 16.0.0 CR#193 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
withdrawn | [WTS] [JSN] |
| R5-197315 | Addtion of TP analysis for FR1 MPR for CA |
CR revision of R5-196404 |
Huawei, HiSilicon | 38.905 16.0.0 CR#1751 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
| R5-197317 | Addtion of TP analysis for FR1 ConfigTP for CA |
CR revision of R5-196407 |
Huawei, HiSilicon | 38.905 16.0.0 CR#1761 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
| R5-197320 | Addition of TP analysis of FR1 6.4D.2.1 EVM for UL MIMO |
CR revision of R5-196416 |
Huawei, HiSilicon | 38.905 16.0.0 CR#1791 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
| R5-197322 | Addition of TP analysis of FR1 6.4D.2.2 Carrier leakage for UL MIMO |
CR revision of R5-196418 |
Huawei, HiSilicon | 38.905 16.0.0 CR#1801 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
| R5-197323 | Addition of TP analysis of FR1 6.4D.2.3 Inband emission for UL MIMO |
CR revision of R5-196420 |
Huawei, HiSilicon | 38.905 16.0.0 CR#1811 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
| R5-197325 | Addition of TP analysis of FR1 6.4D.2.4 EVM equalizer spectrum flatness for UL MIMO |
CR revision of R5-196422 |
Huawei, HiSilicon | 38.905 16.0.0 CR#1821 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
| R5-197326 | Test Point analysis for Occupied bandwidth for 2UL CA in FR1 |
CR revision of R5-196465 |
LG Electronics | 38.905 16.0.0 CR#1861 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
| R5-197524 | TP_analysis_38.905_7.3A._CA_ref_sensitivity |
CR revision of R5-196491 revised to R5-197632 |
Qualcomm Wireless GmbH | 38.905 16.0.0 CR#1871 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-197589 | New addition of TP analysis for MOP & MOP Spherical Coverage for UL CA in SA FR2 |
CR revision of R5-195923 |
Sporton International Inc., Huawei, HiSilicon, ECIT | 38.905 16.0.0 CR#1681 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
| R5-197590 | New addition of TP analysis for Carrier leakage for UL CA in SA FR2 |
CR revision of R5-195924 |
Sporton International Inc. | 38.905 16.0.0 CR#1691 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
| R5-197591 | Adding test case 6.5B.2.1.3 to 38.905 |
CR revision of R5-195990 |
Ericsson | 38.905 16.0.0 CR#1701 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
| R5-197592 | Addition of TP analysis of FR2 6.6 Beam Correspondence |
CR revision of R5-196074 |
Samsung R&D Institute UK | 38.905 16.0.0 CR#1731 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
| R5-197593 | Test Point analysis update for FR2 TxSpurious test case |
CR revision of R5-196365 |
Qualcomm Finland RFFE Oy | 38.905 16.0.0 CR#1741 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
| R5-197594 | Addition of TP analysis of FR1 Maximum input level for CA |
CR revision of R5-196409 |
Huawei, HiSilicon | 38.905 16.0.0 CR#1771 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
| R5-197595 | Addition of TP analysis of FR1 6.4D.1 Frequency error for UL MIMO |
CR revision of R5-196414 |
Huawei, HiSilicon | 38.905 16.0.0 CR#1781 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
| R5-197596 | Addition of TP analysis of FR2 6.2A.2 MPR for 2 UL CA |
CR revision of R5-196430 |
Huawei, HiSilicon | 38.905 16.0.0 CR#1831 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
| R5-197597 | Addition of TP analysis for FR2 AMPR with NS_201 |
CR revision of R5-196783 |
Ericsson | 38.905 16.0.0 CR#1911 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
| R5-197598 | Updates of TP analysis for EN-DC MPR test case 6.2.B.2.1 |
CR revision of R5-196797 revised to R5-197628 |
Ericsson | 38.905 16.0.0 CR#1921 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
revised | [WTS] [JSN] |
| R5-197628 | Updates of TP analysis for EN-DC MPR test case 6.2.B.2.1 |
CR revision of R5-197598 |
Ericsson | 38.905 16.0.0 CR#1922 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
| R5-197632 | TP_analysis_38.905_7.3A._CA_ref_sensitivity |
CR revision of R5-197524 |
Qualcomm Wireless GmbH | 38.905 16.0.0 CR#1872 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-84 AI: 5.3.5.16 |
agreed | [WTS] [JSN] |
45 documents (0.34791803359985 seconds)