Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-197742 | Editorial corrections to FR1 Test Tolerance files | CR | ANRITSU LTD | 38.903 16.1.0 CR#88 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
withdrawn | [WTS] [JSN] |
| R5-197777 | Addition of TT Analysis for 6.3.1.1+6.3.1.2 NR SA FR1 Intra-Freq Handover | CR | Qualcomm UK Ltd. | 38.903 15.3.0 CR#89 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-85 AI: 5.3.5.15 |
withdrawn | [WTS] [JSN] |
| R5-197778 | Addition of TT Analysis for 6.3.1.3 NR SA FR1 Inter-Freq Handover | CR | Qualcomm UK Ltd. | 38.903 15.3.0 CR#90 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-85 AI: 5.3.5.15 |
withdrawn | [WTS] [JSN] |
| R5-197807 | FR1 Test tolerance analysis for interruptions active and non-active |
CR revised to R5-199362 |
Huawei, HiSilicon, Bureau Veritas | 38.903 16.1.0 CR#91 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
revised | [WTS] [JSN] |
| R5-197808 | FR1 Test tolerance analysis for interruptions deactivated NR SCC | CR | Huawei, HiSilicon, Bureau Veritas | 38.903 16.1.0 CR#92 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
withdrawn | [WTS] [JSN] |
| R5-197809 | FR1 Test tolerance analysis for interruptions deactivated E-UTRAN SCC | CR | Huawei, HiSilicon, Bureau Veritas | 38.903 16.1.0 CR#93 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
withdrawn | [WTS] [JSN] |
| R5-197810 | FR1 Test tolerance analysis for CSI-RS based RLM |
CR revised to R5-199363 |
Huawei, HiSilicon, Bureau Veritas | 38.903 16.1.0 CR#94 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
revised | [WTS] [JSN] |
| R5-197811 | FR1 Test tolerance analysis for interRAT measurement | CR | Huawei, HiSilicon, Bureau Veritas | 38.903 16.1.0 CR#95 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
withdrawn | [WTS] [JSN] |
| R5-198025 | MU elements definition for FR2 RRM | CR | ROHDE & SCHWARZ | 38.903 16.1.0 CR#96 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
withdrawn | [WTS] [JSN] |
| R5-198027 | FR2 RRM Measurement Accuracy MU | CR | ROHDE & SCHWARZ | 38.903 16.1.0 CR#97 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
withdrawn | [WTS] [JSN] |
| R5-198054 | Editorial corrections to FR1 Test Tolerance files |
CR revised to R5-199070 |
ANRITSU LTD | 38.903 16.1.0 CR#98 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
revised | [WTS] [JSN] |
| R5-198260 | CR to 38.903 to define Reference Methodology for SE | CR | Keysight Technologies UK Ltd | 38.903 16.1.0 CR#99 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-198285 | FR1 Test tolerance analysis for interRAT measurement | CR | Huawei, HiSilicon, ANRITSU LTD | 38.903 16.1.0 CR#100 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-198427 | Correction to uncertainty budget calculation principles | CR | Samsung R&D Institute UK | 38.903 16.1.0 CR#101 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-198456 | Update on FR2 MUs in 38.903 |
CR revised to R5-199091 |
Anritsu | 38.903 16.1.0 CR#102 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
revised | [WTS] [JSN] |
| R5-198458 | Update on FR2 Spurious MUs in 38.903 |
CR revised to R5-199092 |
Anritsu | 38.903 16.1.0 CR#103 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
revised | [WTS] [JSN] |
| R5-198642 | FR1 Test Tolerance : Addition of TT Analysis for 6.3.1.1 NR SA FR1 Intra-Freq Handover |
CR revised to R5-199553 |
Qualcomm UK Ltd. | 38.903 16.1.0 CR#104 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
revised | [WTS] [JSN] |
| R5-198643 | FR1 Test Tolerance : Addition of TT Analysis for 6.3.1.2 NR SA FR1 Intra-Freq Handover |
CR revised to R5-199554 |
Qualcomm UK Ltd. | 38.903 16.1.0 CR#105 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
revised | [WTS] [JSN] |
| R5-198644 | FR1 Test Tolerance : Addition of TT Analysis for 6.3.1.3 NR SA FR1 Inter-Freq Handover |
CR revised to R5-199555 |
Qualcomm UK Ltd. | 38.903 16.1.0 CR#106 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
revised | [WTS] [JSN] |
| R5-199070 | Editorial corrections to FR1 Test Tolerance files |
CR revision of R5-198054 |
ANRITSU LTD | 38.903 16.1.0 CR#981 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-199082 | FR1 Test Tolerance : Addition of TT Analysis for 6.3.1.1 NR SA FR1 Intra-Freq Handover |
CR revision of R5-199553 |
Qualcomm UK Ltd. | 38.903 16.1.0 CR#1042 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-199083 | FR1 Test Tolerance : Addition of TT Analysis for 6.3.1.2 NR SA FR1 Intra-Freq Handover |
CR revision of R5-199554 |
Qualcomm UK Ltd. | 38.903 16.1.0 CR#1052 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-199084 | FR1 Test Tolerance : Addition of TT Analysis for 6.3.1.3 NR SA FR1 Inter-Freq Handover |
CR revision of R5-199555 |
Qualcomm UK Ltd. | 38.903 16.1.0 CR#1062 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-199091 | Update on FR2 MUs in 38.903 |
CR revision of R5-198456 |
Anritsu | 38.903 16.1.0 CR#1021 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-199092 | Update on FR2 Spurious MUs in 38.903 |
CR revision of R5-198458 |
Anritsu | 38.903 16.1.0 CR#1031 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-199362 | FR1 Test tolerance analysis for interruptions active and non-active |
CR revision of R5-197807 |
Huawei, HiSilicon, Bureau Veritas | 38.903 16.1.0 CR#911 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-199363 | FR1 Test tolerance analysis for CSI-RS based RLM |
CR revision of R5-197810 |
Huawei, HiSilicon, Bureau Veritas | 38.903 16.1.0 CR#941 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-199553 | FR1 Test Tolerance : Addition of TT Analysis for 6.3.1.1 NR SA FR1 Intra-Freq Handover |
CR revision of R5-198642 revised to R5-199082 |
Qualcomm UK Ltd. | 38.903 16.1.0 CR#1041 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
revised | [WTS] [JSN] |
| R5-199554 | FR1 Test Tolerance : Addition of TT Analysis for 6.3.1.2 NR SA FR1 Intra-Freq Handover |
CR revision of R5-198643 revised to R5-199083 |
Qualcomm UK Ltd. | 38.903 16.1.0 CR#1051 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
revised | [WTS] [JSN] |
| R5-199555 | FR1 Test Tolerance : Addition of TT Analysis for 6.3.1.3 NR SA FR1 Inter-Freq Handover |
CR revision of R5-198644 revised to R5-199084 |
Qualcomm UK Ltd. | 38.903 16.1.0 CR#1061 catF | 5GS_NR_LTE-UEConTest | Rel-16 |
R5-85 AI: 5.3.5.15 |
revised | [WTS] [JSN] |
30 documents (0.3418869972229 seconds)