Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
Download results in JSON format
| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-193799 | FR1 Test tolerance analysis for intra re-selection 6.1.1.1 | CR | Huawei, HiSilicon | 38.903 15.2.0 CR#48 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-193800 | FR1 Test tolerance analysis for inter re-selection 6.1.1.2 | CR | Huawei, HiSilicon | 38.903 15.2.0 CR#49 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-193801 | FR1 Test tolerance analysis for interRAT higher priority re-selection 6.1.2.1 | CR | Huawei, HiSilicon | 38.903 15.2.0 CR#50 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-193802 | FR1 Test tolerance analysis for interRAT lower priority re-selection 6.1.2.2 | CR | Huawei, HiSilicon | 38.903 15.2.0 CR#51 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-193803 | FR1 Test tolerance analysis for interRAT known handover 6.3.1.4 | CR | Huawei, HiSilicon | 38.903 15.2.0 CR#52 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-193804 | FR1 Test tolerance analysis for interRAT unknown handover 6.3.1.5 |
CR revised to R5-195178 |
Huawei, HiSilicon | 38.903 15.2.0 CR#53 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.15 |
revised | [WTS] [JSN] |
| R5-193805 | FR1 Test tolerance analysis for EN-DC SCell activation 4.5.3.1-4.5.3.3 |
CR revised to R5-195014 |
Huawei, HiSilicon | 38.903 15.2.0 CR#54 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.15 |
revised | [WTS] [JSN] |
| R5-193806 | FR1 Test tolerance analysis for EN-DC measurement reporting 4.6.1.1-4.6.1.4 |
CR revised to R5-195181 |
Huawei, HiSilicon | 38.903 15.2.0 CR#55 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.15 |
revised | [WTS] [JSN] |
| R5-193807 | FR1 Test tolerance analysis for interRAT measurement reporting 6.6.3.1 and 6.6.3.2 |
CR revised to R5-195183 |
Huawei, HiSilicon | 38.903 15.2.0 CR#56 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.15 |
revised | [WTS] [JSN] |
| R5-194027 | CR on spurious emission MU in FR2 | CR | Anritsu | 38.903 15.2.0 CR#57 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-194124 | CR to update TR 38.903 after RAN5#5-5GNR Adhoc |
CR revised to R5-195159 |
Keysight Technologies UK Ltd | 38.903 15.2.0 CR#59 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.15 |
revised | [WTS] [JSN] |
| R5-194575 | Test Tolerance analysis for Inter-Freq measurement Test Cases |
CR revised to R5-195015 |
Ericsson | 38.903 15.2.0 CR#60 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.15 |
revised | [WTS] [JSN] |
| R5-195014 | FR1 Test tolerance analysis for EN-DC SCell activation 4.5.3.1-4.5.3.3 |
CR revision of R5-193805 |
Huawei, HiSilicon | 38.903 15.2.0 CR#541 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-195015 | Test Tolerance analysis for Inter-Freq measurement Test Cases |
CR revision of R5-194575 |
Ericsson | 38.903 15.2.0 CR#601 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-195159 | CR to update TR 38.903 after RAN5#5-5GNR Adhoc |
CR revision of R5-194124 |
Keysight Technologies UK Ltd | 38.903 15.2.0 CR#591 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-195178 | FR1 Test tolerance analysis for interRAT unknown handover 6.3.1.5 |
CR revision of R5-193804 |
Huawei, HiSilicon | 38.903 15.2.0 CR#531 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.15 |
withdrawn | [WTS] [JSN] |
| R5-195181 | FR1 Test tolerance analysis for EN-DC measurement reporting 4.6.1.1-4.6.1.4 |
CR revision of R5-193806 |
Huawei, HiSilicon | 38.903 15.2.0 CR#551 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.15 |
agreed | [WTS] [JSN] |
| R5-195183 | FR1 Test tolerance analysis for interRAT measurement reporting 6.6.3.1 and 6.6.3.2 |
CR revision of R5-193807 |
Huawei, HiSilicon | 38.903 15.2.0 CR#561 catF | 5GS_NR_LTE-UEConTest | Rel-15 |
R5-83 AI: 5.3.5.15 |
withdrawn | [WTS] [JSN] |
18 documents (0.35641407966614 seconds)