Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-236079 | Introduction of reference sensitivity test point analysis for CA_n25A-n66A-n77(2A) and CA_n25A-n66A-n78(2A) |
CR revised to R5-237617 |
Nokia, Nokia Shanghai Bell | 38.905 18.0.0 CR#819 catF | NR_CADC_NR_LTE_DC_R17-UEConTest | Rel-18 |
R5-101 AI: 5.3.5. |
revised | [WTS] [JSN] |
| R5-236081 | Introduction of spurious emission TP analysis for CA_n25A-n66A, CA_n25A-n77A, CA_n25A-n78A, CA_n66A-n78A | CR | Nokia, Nokia Shanghai Bell | 38.905 18.0.0 CR#820 catF | NR_CADC_NR_LTE_DC_R17-UEConTest | Rel-18 |
R5-101 AI: 5.3.5. |
agreed | [WTS] [JSN] |
| R5-236105 | Addition of reference sensitivity TP analysis for new R17 NR CA comb within FR1 |
CR revised to R5-237619 |
KDDI Corporation | 38.905 17.10.0 CR#822 catF | NR_CADC_NR_LTE_DC_R17-UEConTest | Rel-17 |
R5-101 AI: 5.3.5. |
revised | [WTS] [JSN] |
| R5-236356 | Test point analysis for several EN-DC and NR CA combos for spurious emissions | CR | WE Certification Oy, AT&T | 38.905 18.0.0 CR#826 catF | NR_CADC_NR_LTE_DC_R17-UEConTest | Rel-18 |
R5-101 AI: 5.3.5. |
agreed | [WTS] [JSN] |
| R5-236371 | Update reference sensitivity test cases for additional three bands ENDC configurations | CR | Verizon, Qualcomm, Ericsson | 38.905 18.0.0 CR#827 catF | NR_CADC_NR_LTE_DC_R17-UEConTest | Rel-18 |
R5-101 AI: 5.3.5. |
agreed | [WTS] [JSN] |
| R5-236377 | Update test point analysis clause for additional NR CA band configurations | CR | Verizon Spain | 38.905 18.0.0 CR#828 catF | NR_CADC_NR_LTE_DC_R17-UEConTest | Rel-18 |
R5-101 AI: 5.3.5. |
agreed | [WTS] [JSN] |
| R5-236380 | Remove Editor’s Notes and made the necessary changes for Table 4.1.3.1-3 |
CR revised to R5-237622 |
Verizon | 38.905 18.0.0 CR#829 catF | NR_CADC_NR_LTE_DC_R17-UEConTest | Rel-18 |
R5-101 AI: 5.3.5. |
revised | [WTS] [JSN] |
| R5-237617 | Introduction of reference sensitivity test point analysis for CA_n25A-n66A-n77(2A) and CA_n25A-n66A-n78(2A) |
CR revision of R5-236079 |
Nokia, Nokia Shanghai Bell | 38.905 18.0.0 CR#8191 catF | NR_CADC_NR_LTE_DC_R17-UEConTest | Rel-18 |
R5-101 AI: 5.3.5. |
agreed | [WTS] [JSN] |
| R5-237619 | Addition of reference sensitivity TP analysis for new R17 NR CA comb within FR1 |
CR revision of R5-236105 |
KDDI Corporation | 38.905 18.0.0 CR#8221 catF | NR_CADC_NR_LTE_DC_R17-UEConTest | Rel-18 |
R5-101 AI: 5.3.5. |
agreed | [WTS] [JSN] |
| R5-237622 | Remove Editors Notes and made the necessary changes for Table 4.1.3.1-3 |
CR revision of R5-236380 |
Verizon | 38.905 18.0.0 CR#8291 catF | NR_CADC_NR_LTE_DC_R17-UEConTest | Rel-18 |
R5-101 AI: 5.3.5. |
agreed | [WTS] [JSN] |
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