Please enter the search related information in the fields below. Partial information works, e.g. "SP-21" in the "tdoc" field lists all TSG SA documents from 2021. Regular expressions mostly work in all fields (e.g. "2[34].501" in the "Spec" field lists all documents related to 23.501 and 24.501. Capitalization is disregarded, i.e. "3GPP" gives the same results as "3gpp".
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| tdoc | Title | Type / Revs | Source | Spec / CR | S/WID | Release | Meeting | Status | Links |
|---|---|---|---|---|---|---|---|---|---|
| R5-242608 | Addition of Test Tolerances analysis for NR-U redirection test cases |
CR revised to R5-243752 |
Nokia | 38.903 18.2.0 CR#732 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
revised | [WTS] [JSN] |
| R5-243320 | Test Tolerance analysis for NR-U inter-frequency measurement reporting test cases 10.4.2.3, 10.4.2.4, 10.4.2.5, 10.4.2.6 |
CR revised to R5-243893 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#746 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
revised | [WTS] [JSN] |
| R5-243321 | Test Tolerance analysis for NR-U inter-frequency measurement reporting test cases with DRX 10.4.2.7, 10.4.2.8, 10.4.2.9, 10.4.2.10 |
CR revised to R5-243894 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#747 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
revised | [WTS] [JSN] |
| R5-243322 | Test Tolerance analysis for NR-U RSRP intra-frequency accuracy test cases 10.5.1.1 and 11.6.1.1 |
CR revised to R5-243736 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#748 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
revised | [WTS] [JSN] |
| R5-243323 | Test Tolerance analysis for NR-U RSRP inter-frequency accuracy test case 10.5.1.2 |
CR revised to R5-243737 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#749 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
revised | [WTS] [JSN] |
| R5-243324 | Test Tolerance analysis for NR-U RSRQ intra-frequency accuracy test cases 10.5.2.1 and 11.6.2.1 |
CR revised to R5-243738 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#750 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
revised | [WTS] [JSN] |
| R5-243325 | Test Tolerance analysis for NR-U RSRQ inter-frequency accuracy test cases 10.5.2.2 and 11.6.2.2 |
CR revised to R5-243739 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#751 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
revised | [WTS] [JSN] |
| R5-243326 | Test Tolerance analysis for NR-U SINR intra-frequency accuracy test cases 10.5.3.1 and 10.5.3.3 |
CR revised to R5-243740 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#752 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
revised | [WTS] [JSN] |
| R5-243327 | Test Tolerance analysis for NR-U SINR inter-frequency accuracy test cases 10.5.3.2 and 11.6.3.2 |
CR revised to R5-243741 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#753 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
revised | [WTS] [JSN] |
| R5-243328 | Test Tolerance analysis for NR-U L1-RSRP accuracy test case 10.5.4.1 |
CR revised to R5-243742 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#754 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
revised | [WTS] [JSN] |
| R5-243399 | Addition of TTs for NR-U intra-frequency measurement reporting test |
CR revised to R5-243895 |
Qualcomm France | 38.903 18.2.0 CR#755 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
revised | [WTS] [JSN] |
| R5-243400 | Addition of TTs for NR-U Timing Accuracy Test | CR | Qualcomm France | 38.903 18.2.0 CR#756 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
agreed | [WTS] [JSN] |
| R5-243401 | Addition of TTs for NR-U Timing Advance Test | CR | Qualcomm France | 38.903 18.2.0 CR#757 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
agreed | [WTS] [JSN] |
| R5-243402 | Addition of TTs for NR-U L1-RSRP measurement reporting tests |
CR revised to R5-243743 |
Qualcomm France | 38.903 18.2.0 CR#758 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
revised | [WTS] [JSN] |
| R5-243403 | Addition of TTs for SCell activation and deactivation tests | CR | Qualcomm France | 38.903 18.2.0 CR#759 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
agreed | [WTS] [JSN] |
| R5-243404 | Addition of TTs for PSCell addition and release test |
CR revised to R5-243753 |
Qualcomm France | 38.903 18.2.0 CR#760 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
revised | [WTS] [JSN] |
| R5-243736 | Test Tolerance analysis for NR-U RSRP intra-frequency accuracy test cases 10.5.1.1 and 11.6.1.1 |
CR revision of R5-243322 revised to R5-243996 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#7481 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
revised | [WTS] [JSN] |
| R5-243737 | Test Tolerance analysis for NR-U RSRP inter-frequency accuracy test case 10.5.1.2 |
CR revision of R5-243323 revised to R5-243997 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#7491 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
revised | [WTS] [JSN] |
| R5-243738 | Test Tolerance analysis for NR-U RSRQ intra-frequency accuracy test cases 10.5.2.1 and 11.6.2.1 |
CR revision of R5-243324 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#7501 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
agreed | [WTS] [JSN] |
| R5-243739 | Test Tolerance analysis for NR-U RSRQ inter-frequency accuracy test cases 10.5.2.2 and 11.6.2.2 |
CR revision of R5-243325 revised to R5-243998 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#7511 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
revised | [WTS] [JSN] |
| R5-243740 | Test Tolerance analysis for NR-U SINR intra-frequency accuracy test cases 10.5.3.1 and 10.5.3.3 |
CR revision of R5-243326 revised to R5-243999 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#7521 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
revised | [WTS] [JSN] |
| R5-243741 | Test Tolerance analysis for NR-U SINR inter-frequency accuracy test cases 10.5.3.2 and 11.6.3.2 |
CR revision of R5-243327 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#7531 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
agreed | [WTS] [JSN] |
| R5-243742 | Test Tolerance analysis for NR-U L1-RSRP accuracy test case 10.5.4.1 |
CR revision of R5-243328 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#7541 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
agreed | [WTS] [JSN] |
| R5-243743 | Addition of TTs for NR-U L1-RSRP measurement reporting tests |
CR revision of R5-243402 revised to R5-244000 |
Qualcomm France | 38.903 18.2.0 CR#7581 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
revised | [WTS] [JSN] |
| R5-243752 | Addition of Test Tolerances analysis for NR-U redirection test cases |
CR revision of R5-242608 |
Nokia | 38.903 18.2.0 CR#7321 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
agreed | [WTS] [JSN] |
| R5-243753 | Addition of TTs for PSCell addition and release test |
CR revision of R5-243404 |
Qualcomm France | 38.903 18.2.0 CR#7601 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
agreed | [WTS] [JSN] |
| R5-243893 | Test Tolerance analysis for NR-U inter-frequency measurement reporting test cases 10.4.2.3, 10.4.2.4, 10.4.2.5, 10.4.2.6 |
CR revision of R5-243320 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#7461 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
agreed | [WTS] [JSN] |
| R5-243894 | Test Tolerance analysis for NR-U inter-frequency measurement reporting test cases with DRX 10.4.2.7, 10.4.2.8, 10.4.2.9, 10.4.2.10 |
CR revision of R5-243321 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#7471 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
agreed | [WTS] [JSN] |
| R5-243895 | Addition of TTs for NR-U intra-frequency measurement reporting test |
CR revision of R5-243399 |
Qualcomm France | 38.903 18.2.0 CR#7551 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
agreed | [WTS] [JSN] |
| R5-243996 | Test Tolerance analysis for NR-U RSRP intra-frequency accuracy test cases 10.5.1.1 and 11.6.1.1 |
CR revision of R5-243736 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#7482 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
agreed | [WTS] [JSN] |
| R5-243997 | Test Tolerance analysis for NR-U RSRP inter-frequency accuracy test case 10.5.1.2 |
CR revision of R5-243737 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#7492 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
agreed | [WTS] [JSN] |
| R5-243998 | Test Tolerance analysis for NR-U RSRQ inter-frequency accuracy test cases 10.5.2.2 and 11.6.2.2 |
CR revision of R5-243739 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#7512 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
agreed | [WTS] [JSN] |
| R5-243999 | Test Tolerance analysis for NR-U SINR intra-frequency accuracy test cases 10.5.3.1 and 10.5.3.3 |
CR revision of R5-243740 |
Qualcomm Technologies Int | 38.903 18.2.0 CR#7522 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
agreed | [WTS] [JSN] |
| R5-244000 | Addition of TTs for NR-U L1-RSRP measurement reporting tests |
CR revision of R5-243743 |
Qualcomm France | 38.903 18.2.0 CR#7582 catF | NR_unlic-UEConTest | Rel-18 |
R5-103 AI: 5.3.4.9 |
agreed | [WTS] [JSN] |
34 documents (0.35675191879272 seconds)